KR102995155B1 - 반도체 제조 장치를 위한 온도 조절 장치, 및 반도체 제조 시스템 - Google Patents
반도체 제조 장치를 위한 온도 조절 장치, 및 반도체 제조 시스템Info
- Publication number
- KR102995155B1 KR102995155B1 KR1020230039647A KR20230039647A KR102995155B1 KR 102995155 B1 KR102995155 B1 KR 102995155B1 KR 1020230039647 A KR1020230039647 A KR 1020230039647A KR 20230039647 A KR20230039647 A KR 20230039647A KR 102995155 B1 KR102995155 B1 KR 102995155B1
- Authority
- KR
- South Korea
- Prior art keywords
- cooling
- heating
- liquid
- temperature
- semiconductor manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0602—Temperature monitoring
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0434—Apparatus for thermal treatment mainly by convection
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25D—REFRIGERATORS; COLD ROOMS; ICE-BOXES; COOLING OR FREEZING APPARATUS NOT OTHERWISE PROVIDED FOR
- F25D17/00—Arrangements for circulating cooling fluids; Arrangements for circulating gas, e.g. air, within refrigerated spaces
- F25D17/02—Arrangements for circulating cooling fluids; Arrangements for circulating gas, e.g. air, within refrigerated spaces for circulating liquids, e.g. brine
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/01—Control of temperature without auxiliary power
- G05D23/13—Control of temperature without auxiliary power by varying the mixing ratio of two fluids having different temperatures
- G05D23/1306—Control of temperature without auxiliary power by varying the mixing ratio of two fluids having different temperatures for liquids
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/01—Control of temperature without auxiliary power
- G05D23/13—Control of temperature without auxiliary power by varying the mixing ratio of two fluids having different temperatures
- G05D23/1306—Control of temperature without auxiliary power by varying the mixing ratio of two fluids having different temperatures for liquids
- G05D23/1313—Control of temperature without auxiliary power by varying the mixing ratio of two fluids having different temperatures for liquids without temperature sensing element
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- General Engineering & Computer Science (AREA)
- Thermal Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Combustion & Propulsion (AREA)
- Control Of Temperature (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
- Cooling Or The Like Of Electrical Apparatus (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2022-058188 | 2022-03-31 | ||
| JP2022058188A JP7707119B2 (ja) | 2022-03-31 | 2022-03-31 | 半導体製造装置のための温度調節装置、および半導体製造システム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20230141544A KR20230141544A (ko) | 2023-10-10 |
| KR102995155B1 true KR102995155B1 (ko) | 2026-07-24 |
Family
ID=88193509
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020230039647A Active KR102995155B1 (ko) | 2022-03-31 | 2023-03-27 | 반도체 제조 장치를 위한 온도 조절 장치, 및 반도체 제조 시스템 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US12648393B2 (enExample) |
| JP (1) | JP7707119B2 (enExample) |
| KR (1) | KR102995155B1 (enExample) |
| CN (1) | CN116895557A (enExample) |
| TW (1) | TW202341322A (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7707119B2 (ja) * | 2022-03-31 | 2025-07-14 | 株式会社荏原製作所 | 半導体製造装置のための温度調節装置、および半導体製造システム |
| WO2025058041A1 (ja) | 2023-09-14 | 2025-03-20 | キヤノン株式会社 | 記録装置 |
| JP7864678B2 (ja) * | 2023-11-16 | 2026-05-25 | 株式会社荏原製作所 | 熱媒体供給装置 |
| WO2026155002A1 (ja) * | 2025-01-16 | 2026-07-23 | 東京エレクトロン株式会社 | コンピュータプログラム、情報処理方法及び情報処理装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2025081992A (ja) * | 2023-11-16 | 2025-05-28 | 株式会社荏原製作所 | 熱媒体供給装置 |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5435379A (en) * | 1992-08-14 | 1995-07-25 | Texas Instruments Incorporated | Method and apparatus for low-temperature semiconductor processing |
| US5802856A (en) * | 1996-07-31 | 1998-09-08 | Stanford University | Multizone bake/chill thermal cycling module |
| JP3917237B2 (ja) * | 1997-05-20 | 2007-05-23 | 東京エレクトロン株式会社 | レジスト膜形成方法 |
| US7374477B2 (en) * | 2002-02-06 | 2008-05-20 | Applied Materials, Inc. | Polishing pads useful for endpoint detection in chemical mechanical polishing |
| US6447369B1 (en) * | 2000-08-30 | 2002-09-10 | Micron Technology, Inc. | Planarizing machines and alignment systems for mechanical and/or chemical-mechanical planarization of microelectronic substrates |
| JP3485538B2 (ja) * | 2000-10-30 | 2004-01-13 | 株式会社日立製作所 | プラズマ処理装置 |
| JP2002168551A (ja) * | 2000-11-30 | 2002-06-14 | Tokyo Electron Ltd | 処理装置の電極用冷却装置 |
| US8110044B2 (en) * | 2003-03-07 | 2012-02-07 | Tokyo Electron Limited | Substrate processing apparatus and temperature control device |
| US6913514B2 (en) * | 2003-03-14 | 2005-07-05 | Ebara Technologies, Inc. | Chemical mechanical polishing endpoint detection system and method |
| JP2005197471A (ja) * | 2004-01-07 | 2005-07-21 | Tokyo Electron Ltd | 基板処理装置及び温度調節方法 |
| JP4978928B2 (ja) * | 2007-04-27 | 2012-07-18 | シーケーディ株式会社 | 温度制御装置 |
| JP5032269B2 (ja) * | 2007-11-02 | 2012-09-26 | 東京エレクトロン株式会社 | 被処理基板の温度調節装置及び温度調節方法、並びにこれを備えたプラズマ処理装置 |
| JP5172615B2 (ja) * | 2008-11-12 | 2013-03-27 | Ckd株式会社 | 温度制御装置 |
| US8430963B2 (en) * | 2010-01-07 | 2013-04-30 | Primestar Solar, Inc. | Cool-down system and method for a vapor deposition system |
| US9338871B2 (en) * | 2010-01-29 | 2016-05-10 | Applied Materials, Inc. | Feedforward temperature control for plasma processing apparatus |
| US8580693B2 (en) * | 2010-08-27 | 2013-11-12 | Applied Materials, Inc. | Temperature enhanced electrostatic chucking in plasma processing apparatus |
| JP5993111B2 (ja) * | 2010-09-24 | 2016-09-14 | 東京エレクトロン株式会社 | 温度制御システム |
| JP5912439B2 (ja) * | 2011-11-15 | 2016-04-27 | 東京エレクトロン株式会社 | 温度制御システム、半導体製造装置及び温度制御方法 |
| US20130240144A1 (en) * | 2012-03-13 | 2013-09-19 | Applied Materials, Inc. | Fast response fluid temperature control system |
| JP5951384B2 (ja) * | 2012-07-20 | 2016-07-13 | 東京エレクトロン株式会社 | 温度制御システムへの温調流体供給方法及び記憶媒体 |
| JP6051036B2 (ja) * | 2012-12-25 | 2016-12-21 | 株式会社Kelk | 循環冷却加熱装置 |
| US20150060013A1 (en) * | 2013-09-05 | 2015-03-05 | Applied Materials, Inc. | Tunable temperature controlled electrostatic chuck assembly |
| US9831111B2 (en) * | 2014-02-12 | 2017-11-28 | Applied Materials, Inc. | Apparatus and method for measurement of the thermal performance of an electrostatic wafer chuck |
| JP6570390B2 (ja) * | 2015-09-24 | 2019-09-04 | 東京エレクトロン株式会社 | 温度調整装置及び基板処理装置 |
| JP2019528187A (ja) * | 2016-08-31 | 2019-10-10 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 環状プラテン又は研磨パッドを有する研磨システム |
| US11164759B2 (en) * | 2018-05-10 | 2021-11-02 | Micron Technology, Inc. | Tools and systems for processing one or more semiconductor devices, and related methods |
| CN113811833B (zh) * | 2019-04-23 | 2022-10-04 | Ckd株式会社 | 热交换系统 |
| JP7372122B2 (ja) * | 2019-11-20 | 2023-10-31 | Ckd株式会社 | 冷却システム |
| JP7339135B2 (ja) * | 2019-11-20 | 2023-09-05 | Ckd株式会社 | 温度制御システム |
| JP7707119B2 (ja) * | 2022-03-31 | 2025-07-14 | 株式会社荏原製作所 | 半導体製造装置のための温度調節装置、および半導体製造システム |
-
2022
- 2022-03-31 JP JP2022058188A patent/JP7707119B2/ja active Active
-
2023
- 2023-03-24 US US18/189,639 patent/US12648393B2/en active Active
- 2023-03-24 CN CN202310296058.4A patent/CN116895557A/zh active Pending
- 2023-03-27 TW TW112111457A patent/TW202341322A/zh unknown
- 2023-03-27 KR KR1020230039647A patent/KR102995155B1/ko active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2025081992A (ja) * | 2023-11-16 | 2025-05-28 | 株式会社荏原製作所 | 熱媒体供給装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20230317482A1 (en) | 2023-10-05 |
| JP7707119B2 (ja) | 2025-07-14 |
| TW202341322A (zh) | 2023-10-16 |
| JP2023149554A (ja) | 2023-10-13 |
| KR20230141544A (ko) | 2023-10-10 |
| CN116895557A (zh) | 2023-10-17 |
| US12648393B2 (en) | 2026-06-02 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| D22 | Grant of ip right intended |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D22-EXM-PE0701 (AS PROVIDED BY THE NATIONAL OFFICE) |
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| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
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| F11 | Ip right granted following substantive examination |
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| PR0701 | Registration of establishment |
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| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
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| U11 | Full renewal or maintenance fee paid |
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| PG1601 | Publication of registration |
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| Q13 | Ip right document published |
Free format text: ST27 STATUS EVENT CODE: A-4-4-Q10-Q13-NAP-PG1601 (AS PROVIDED BY THE NATIONAL OFFICE) |