KR102659151B1 - 스타일러스 및 측정 방법 - Google Patents
스타일러스 및 측정 방법 Download PDFInfo
- Publication number
- KR102659151B1 KR102659151B1 KR1020170026115A KR20170026115A KR102659151B1 KR 102659151 B1 KR102659151 B1 KR 102659151B1 KR 1020170026115 A KR1020170026115 A KR 1020170026115A KR 20170026115 A KR20170026115 A KR 20170026115A KR 102659151 B1 KR102659151 B1 KR 102659151B1
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- Prior art keywords
- stylus
- protrusion
- spherical
- single crystal
- crystal diamond
- Prior art date
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- 238000000691 measurement method Methods 0.000 title description 9
- 239000013078 crystal Substances 0.000 claims abstract description 48
- 229910003460 diamond Inorganic materials 0.000 claims abstract description 39
- 239000010432 diamond Substances 0.000 claims abstract description 39
- 241001422033 Thestylus Species 0.000 claims description 62
- 238000000034 method Methods 0.000 claims description 7
- 238000012545 processing Methods 0.000 description 35
- 238000005259 measurement Methods 0.000 description 17
- 238000005266 casting Methods 0.000 description 15
- 238000010586 diagram Methods 0.000 description 7
- 238000003754 machining Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 238000005498 polishing Methods 0.000 description 5
- 229910001018 Cast iron Inorganic materials 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B1/00—Measuring instruments characterised by the selection of material therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
- G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
- G01B5/012—Contact-making feeler heads therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/30—Measuring arrangements characterised by the use of mechanical techniques for measuring the deformation in a solid, e.g. mechanical strain gauge
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
Abstract
Description
도 2는, 실시 형태에 있어서 이용한 단결정 다이아몬드의 결정면을 설명하기 위한 도면이다.
도 3은, 실시 형태에 있어서 이용한 가공 장치와 스타일러스의 배치를 설명하기 위한 사시도이다.
도 4는, 실시 형태에 있어서의 제1 가공 공정의 주물 정반과 스타일러스의 위치를 설명하기 위한 상면도이다.
도 5는, 실시 형태에 있어서의 제2 가공 공정의 주물 정반과 스타일러스의 위치를 설명하기 위한 상면도이다.
도 6은, 실시 형태에 있어서 제조되는 스타일러스의 구형상부 및 돌출부의 형상 측정 결과를 나타내는 도면이다.
Claims (5)
- 축부와,
상기 축부의 선단에 배치된 1개의 단결정 다이아몬드의 돌출부와,
상기 돌출부의 선단에 배치된 상기 단결정 다이아몬드의 구형상부를 구비하고,
상기 구형상부의 최선단부에 상기 단결정 다이아몬드의 {100}면이 배치되고,
상기 돌출부는, 상기 구형상부보다 상기 축부측의 환상 영역 내에, 상기 단결정 다이아몬드의 {111}면 및 상기 단결정 다이아몬드의 {110}면이 분포하고, 또한, 상기 환상 영역 내에 있어서, 상기 {110}면 및 상기 {111}면이 돌출되어 있는, 스타일러스. - 청구항 1에 있어서,
상기 구형상부와 상기 돌출부를 상기 구형상부의 상기 최선단부를 통과하는 구로서 정의했을 때에, 상기 환상 영역 내에 있어서의 상기 {111}면 및 상기 {110}면의 돌출량은, 상기 구의 표면으로부터 0.02㎛ 이상 또한 0.05㎛ 이내의 범위인, 스타일러스. - 청구항 1에 있어서,
상기 구형상부는, 반경이 5㎛ 이상 또한 20㎛ 이하인 구의 구결(球缺)로 구성되는, 스타일러스. - 청구항 2에 있어서,
상기 구형상부는, 반경이 5㎛ 이상 또한 20㎛ 이하인 구의 구결로 구성되는, 스타일러스. - 청구항 1 내지 청구항 4 중 어느 한 항에 기재된 상기 스타일러스의 상기 구형상부의 상기 {100}면을 이용하여 피측정물의 3차원 형상을 측정하는, 측정 방법.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016044843A JP6229959B2 (ja) | 2016-03-08 | 2016-03-08 | スタイラス及び測定方法 |
JPJP-P-2016-044843 | 2016-03-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20170104928A KR20170104928A (ko) | 2017-09-18 |
KR102659151B1 true KR102659151B1 (ko) | 2024-04-19 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020170026115A KR102659151B1 (ko) | 2016-03-08 | 2017-02-28 | 스타일러스 및 측정 방법 |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP3217143B1 (ko) |
JP (1) | JP6229959B2 (ko) |
KR (1) | KR102659151B1 (ko) |
CN (1) | CN107167104B (ko) |
TW (2) | TWI634313B (ko) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002357415A (ja) | 2001-06-04 | 2002-12-13 | Matsushita Electric Ind Co Ltd | 形状測定装置及び方法、被測定物の製造方法 |
JP2013200211A (ja) * | 2012-03-26 | 2013-10-03 | Ogura Jewel Ind Co Ltd | スタイラス |
JP2014009999A (ja) * | 2012-06-28 | 2014-01-20 | Ogura Jewel Ind Co Ltd | スタイラス |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3234470C2 (de) * | 1982-09-17 | 1985-11-21 | Dr. Johannes Heidenhain Gmbh, 8225 Traunreut | Mehrkoordinaten-Tastkopf |
GB9009675D0 (en) * | 1990-04-30 | 1990-06-20 | De Beers Ind Diamond | Probes |
JPH0460410A (ja) * | 1990-06-29 | 1992-02-26 | Hitachi Ltd | プローブおよびその製造方法 |
DE4217641C2 (de) * | 1992-05-28 | 1997-07-17 | Wolfgang Madlener | Tastkopf zum dreidimensionalen Antasten von Werkstücken |
TW310044U (en) * | 1995-09-11 | 1997-07-01 | Metal Ind Res & Dev Ct Co Ltd | Bolt elongation meter |
TWM245337U (en) * | 2003-10-21 | 2004-10-01 | Ming-Dan Lin | Inflating apparatus capable of changing joint |
CN100395512C (zh) * | 2004-07-02 | 2008-06-18 | 鸿富锦精密工业(深圳)有限公司 | 表面形貌测量用触针及其制备方法 |
JP4291849B2 (ja) * | 2006-12-20 | 2009-07-08 | パナソニック株式会社 | 三次元測定プローブ |
WO2009011262A1 (ja) * | 2007-07-13 | 2009-01-22 | Nisshin Sangyo Co., Ltd. | 接触検出器 |
JP5173292B2 (ja) * | 2007-07-13 | 2013-04-03 | 株式会社アルバック | 試料の表面形状の測定方法 |
WO2012066756A1 (ja) * | 2010-11-15 | 2012-05-24 | 株式会社アルバック | 触針式測定装置 |
CN202255159U (zh) * | 2011-09-05 | 2012-05-30 | 浙江台玖精密机械有限公司 | 外径千分尺改m值测头 |
DE102012003223A1 (de) * | 2012-02-20 | 2013-08-22 | Carl Zeiss 3D Automation Gmbh | Kugel-Schaft-Verbindung |
WO2014090291A1 (de) * | 2012-12-12 | 2014-06-19 | Eitzenberger Luftlagertechnik Gmbh | Positioniervorrichtung, kreuztisch und hubeinheit |
FR3001799B1 (fr) * | 2013-02-07 | 2017-01-13 | Commissariat Energie Atomique | Dispositif de mesure de l'etat de surface d'une surface |
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2016
- 2016-03-08 JP JP2016044843A patent/JP6229959B2/ja active Active
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2017
- 2017-01-30 EP EP17153737.6A patent/EP3217143B1/en active Active
- 2017-02-08 TW TW106104063A patent/TWI634313B/zh active
- 2017-02-08 TW TW107110317A patent/TWI659191B/zh active
- 2017-02-27 CN CN201710110957.5A patent/CN107167104B/zh active Active
- 2017-02-28 KR KR1020170026115A patent/KR102659151B1/ko active IP Right Grant
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002357415A (ja) | 2001-06-04 | 2002-12-13 | Matsushita Electric Ind Co Ltd | 形状測定装置及び方法、被測定物の製造方法 |
JP2013200211A (ja) * | 2012-03-26 | 2013-10-03 | Ogura Jewel Ind Co Ltd | スタイラス |
JP2014009999A (ja) * | 2012-06-28 | 2014-01-20 | Ogura Jewel Ind Co Ltd | スタイラス |
Also Published As
Publication number | Publication date |
---|---|
CN107167104B (zh) | 2020-01-10 |
JP2017161316A (ja) | 2017-09-14 |
TW201800715A (zh) | 2018-01-01 |
JP6229959B2 (ja) | 2017-11-15 |
KR20170104928A (ko) | 2017-09-18 |
TWI634313B (zh) | 2018-09-01 |
TWI659191B (zh) | 2019-05-11 |
TW201827782A (zh) | 2018-08-01 |
EP3217143A1 (en) | 2017-09-13 |
CN107167104A (zh) | 2017-09-15 |
EP3217143B1 (en) | 2018-08-15 |
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