KR102412247B1 - 기판 액처리 방법, 기판 액처리 장치, 및 기억 매체 - Google Patents

기판 액처리 방법, 기판 액처리 장치, 및 기억 매체 Download PDF

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Publication number
KR102412247B1
KR102412247B1 KR1020150130594A KR20150130594A KR102412247B1 KR 102412247 B1 KR102412247 B1 KR 102412247B1 KR 1020150130594 A KR1020150130594 A KR 1020150130594A KR 20150130594 A KR20150130594 A KR 20150130594A KR 102412247 B1 KR102412247 B1 KR 102412247B1
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South Korea
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substrate
liquid
processing liquid
flow rate
nozzle
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Korean (ko)
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KR20160036488A (ko
Inventor
히로유키 히가시
겐타로 고시
다카히사 오츠카
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도쿄엘렉트론가부시키가이샤
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    • H01L21/02052—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04—Apparatus for manufacture or treatment
    • H10P72/0402—Apparatus for fluid treatment
    • H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02—Cleaning by the force of jets or sprays
    • H01L21/02282—
    • H01L21/67051—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00—Cleaning of wafers, substrates or parts of devices
    • H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H10P70/15—Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only

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  • Cleaning Or Drying Semiconductors (AREA)
  • Weting (AREA)
KR1020150130594A 2014-09-25 2015-09-15 기판 액처리 방법, 기판 액처리 장치, 및 기억 매체 Active KR102412247B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014195493A JP6341035B2 (ja) 2014-09-25 2014-09-25 基板液処理方法、基板液処理装置、及び記憶媒体
JPJP-P-2014-195493 2014-09-25

Publications (2)

Publication Number Publication Date
KR20160036488A KR20160036488A (ko) 2016-04-04
KR102412247B1 true KR102412247B1 (ko) 2022-06-24

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KR1020150130594A Active KR102412247B1 (ko) 2014-09-25 2015-09-15 기판 액처리 방법, 기판 액처리 장치, 및 기억 매체

Country Status (4)

Country Link
US (1) US9865483B2 (https=)
JP (1) JP6341035B2 (https=)
KR (1) KR102412247B1 (https=)
TW (1) TWI626676B (https=)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6765878B2 (ja) * 2016-07-06 2020-10-07 東京エレクトロン株式会社 基板液処理方法及び基板液処理装置
JP6815799B2 (ja) * 2016-09-13 2021-01-20 東京エレクトロン株式会社 基板処理装置及び基板処理方法
TW201828356A (zh) * 2016-10-26 2018-08-01 日商東京威力科創股份有限公司 液體處理方法及液體處理裝置
CN110622290B (zh) * 2017-02-06 2023-11-07 平面半导体公司 亚纳米级基板清洁机构
TWI770115B (zh) * 2017-02-06 2022-07-11 新加坡商平面半導體公司 加工汙水之去除
EP3577682A4 (en) 2017-02-06 2020-11-25 Planar Semiconductor, Inc. SUB-NANOMETRIC LIGHT-BASED SUBSTRATE CLEANING MECHANISM
KR102134261B1 (ko) * 2018-10-25 2020-07-16 세메스 주식회사 기판 처리 장치 및 기판 처리 방법
JP7197376B2 (ja) * 2019-01-17 2022-12-27 東京エレクトロン株式会社 基板処理方法及び基板処理装置
JP7265874B2 (ja) * 2019-01-28 2023-04-27 株式会社Ｓｃｒｅｅｎホールディングス 基板処理方法および基板処理装置
JP7250566B2 (ja) * 2019-02-26 2023-04-03 東京エレクトロン株式会社 基板処理装置および基板処理方法
CN110335835B (zh) * 2019-06-06 2021-07-16 上海中欣晶圆半导体科技有限公司 利用二段式石英喷嘴清洗硅片的装置及方法
CN112542397B (zh) * 2019-09-20 2025-03-18 沈阳芯源微电子设备股份有限公司 一种防止反溅液体污染基板的装置及方法
JP7507009B2 (ja) * 2020-05-26 2024-06-27 株式会社プレテック 基板エッチング装置
KR102583342B1 (ko) 2020-10-22 2023-09-26 세메스 주식회사 기판 처리 장치

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009295910A (ja) * 2008-06-09 2009-12-17 Dainippon Screen Mfg Co Ltd 基板処理方法

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JP2708495B2 (ja) 1988-09-19 1998-02-04 株式会社日立製作所 半導体冷却装置
JP3395696B2 (ja) * 1999-03-15 2003-04-14 日本電気株式会社 ウェハ処理装置およびウェハ処理方法
JP4312997B2 (ja) * 2002-06-04 2009-08-12 東京エレクトロン株式会社 基板処理装置、基板処理方法及びノズル
US20060286804A1 (en) 2005-06-15 2006-12-21 Chuan-Yi Wu Method for forming patterned material layer
JP2007088381A (ja) 2005-09-26 2007-04-05 Dainippon Screen Mfg Co Ltd 基板処理装置および基板処理方法
JP4762098B2 (ja) * 2006-09-28 2011-08-31 大日本スクリーン製造株式会社 基板処理装置および基板処理方法
JP4901650B2 (ja) 2007-08-31 2012-03-21 東京エレクトロン株式会社 液処理装置、液処理方法および記憶媒体
JP4949338B2 (ja) 2008-08-06 2012-06-06 東京エレクトロン株式会社 液処理装置
JP4788785B2 (ja) 2009-02-06 2011-10-05 東京エレクトロン株式会社 現像装置、現像処理方法及び記憶媒体
JP5003774B2 (ja) 2010-02-15 2012-08-15 東京エレクトロン株式会社 現像装置、現像方法及び記憶媒体
JP5797532B2 (ja) 2011-02-24 2015-10-21 東京エレクトロン株式会社 有機溶剤を含有する現像液を用いた現像処理方法及び現像処理装置
WO2013133401A1 (ja) * 2012-03-09 2013-09-12 株式会社 荏原製作所 基板処理方法及び基板処理装置
JP6223839B2 (ja) * 2013-03-15 2017-11-01 東京エレクトロン株式会社 基板液処理方法、基板液処理装置および記憶媒体

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009295910A (ja) * 2008-06-09 2009-12-17 Dainippon Screen Mfg Co Ltd 基板処理方法

Also Published As

Publication number Publication date
JP2016066740A (ja) 2016-04-28
TW201624532A (zh) 2016-07-01
US9865483B2 (en) 2018-01-09
TWI626676B (zh) 2018-06-11
JP6341035B2 (ja) 2018-06-13
KR20160036488A (ko) 2016-04-04
US20160093517A1 (en) 2016-03-31

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