KR102219822B1 - 전압 드룹의 제약에 의한 파워-게이트 섹션들의 크기조정 - Google Patents

전압 드룹의 제약에 의한 파워-게이트 섹션들의 크기조정 Download PDF

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Publication number
KR102219822B1
KR102219822B1 KR1020167021743A KR20167021743A KR102219822B1 KR 102219822 B1 KR102219822 B1 KR 102219822B1 KR 1020167021743 A KR1020167021743 A KR 1020167021743A KR 20167021743 A KR20167021743 A KR 20167021743A KR 102219822 B1 KR102219822 B1 KR 102219822B1
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South Korea
Prior art keywords
sections
capacitance
circuit
power
section
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English (en)
Korean (ko)
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KR20160108433A (ko
Inventor
리안 마이클 코우츠
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퀄컴 인코포레이티드
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B13/00—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion
    • G05B13/02—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
    • G05B13/0205—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric not using a model or a simulator of the controlled system
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0008—Arrangements for reducing power consumption
    • H03K19/0016—Arrangements for reducing power consumption by using a control or a clock signal, e.g. in order to apply power supply
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G01R21/006—Measuring power factor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00315—Modifications for increasing the reliability for protection in field-effect transistor circuits

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computing Systems (AREA)
  • Computer Hardware Design (AREA)
  • Automation & Control Theory (AREA)
  • Power Engineering (AREA)
  • Software Systems (AREA)
  • Evolutionary Computation (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Artificial Intelligence (AREA)
  • Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Logic Circuits (AREA)
  • Direct Current Feeding And Distribution (AREA)
  • Pulse Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Dc-Dc Converters (AREA)
KR1020167021743A 2014-01-16 2015-01-16 전압 드룹의 제약에 의한 파워-게이트 섹션들의 크기조정 Expired - Fee Related KR102219822B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/157,503 US9367054B2 (en) 2014-01-16 2014-01-16 Sizing power-gated sections by constraining voltage droop
US14/157,503 2014-01-16
PCT/US2015/011762 WO2015109188A1 (en) 2014-01-16 2015-01-16 Sizing power-gated sections by constraining voltage droop

Publications (2)

Publication Number Publication Date
KR20160108433A KR20160108433A (ko) 2016-09-19
KR102219822B1 true KR102219822B1 (ko) 2021-02-23

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Family Applications (1)

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KR1020167021743A Expired - Fee Related KR102219822B1 (ko) 2014-01-16 2015-01-16 전압 드룹의 제약에 의한 파워-게이트 섹션들의 크기조정

Country Status (7)

Country Link
US (1) US9367054B2 (enExample)
EP (1) EP3095193A1 (enExample)
JP (1) JP6556736B2 (enExample)
KR (1) KR102219822B1 (enExample)
CN (1) CN105917583B (enExample)
BR (1) BR112016016431A2 (enExample)
WO (1) WO2015109188A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102184740B1 (ko) * 2014-06-16 2020-11-30 에스케이하이닉스 주식회사 전자 장치 및 그를 포함하는 전자 시스템
US9438244B2 (en) * 2014-10-28 2016-09-06 Xilinx, Inc. Circuits for and methods of controlling power within an integrated circuit
US10152112B2 (en) * 2015-06-10 2018-12-11 Sonics, Inc. Power manager with a power switch arbitrator
US10928886B2 (en) 2019-02-25 2021-02-23 Intel Corporation Frequency overshoot and voltage droop mitigation apparatus and method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006202482A (ja) 1997-05-30 2006-08-03 Micron Technology Inc ２５６Ｍｅｇダイナミックランダムアクセスメモリ

Family Cites Families (14)

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Publication number Priority date Publication date Assignee Title
JP2797761B2 (ja) * 1991-07-11 1998-09-17 日本電気株式会社 パワーオン回路
KR100780750B1 (ko) 2006-05-11 2007-11-30 한국과학기술원 표준 셀과 파워 게이팅 셀을 이용한 파워 네트워크 및 이를가지는 반도체 장치
JP2008065732A (ja) 2006-09-11 2008-03-21 Nec Electronics Corp 半導体集積回路の設計方法及び設計システム
US20080120514A1 (en) * 2006-11-10 2008-05-22 Yehea Ismail Thermal management of on-chip caches through power density minimization
US7868479B2 (en) * 2007-06-27 2011-01-11 Qualcomm Incorporated Power gating for multimedia processing power management
US8958575B2 (en) * 2007-06-29 2015-02-17 Qualcomm Incorporated Amplifier with configurable DC-coupled or AC-coupled output
JP5326628B2 (ja) * 2008-03-03 2013-10-30 富士通株式会社 電子回路装置
US8302059B2 (en) 2008-05-27 2012-10-30 Nxp B.V. Power switch design method and program
EP2369509A1 (en) 2010-03-01 2011-09-28 Nxp B.V. Method of generating an integrated circuit layout and integrated circuit
US8266569B2 (en) 2010-03-05 2012-09-11 Advanced Micro Devices, Inc. Identification of critical enables using MEA and WAA metrics
JP2011199094A (ja) * 2010-03-23 2011-10-06 Renesas Electronics Corp 半導体集積回路及び半導体集積回路の電源スイッチ制御方法
WO2011137339A2 (en) 2010-04-30 2011-11-03 Cornell University Systems and methods for zero-delay wakeup for power gated asynchronous pipelines
US8588289B2 (en) * 2010-07-19 2013-11-19 National Semiconductor Corporation Adaptive signal equalizer with segmented coarse and fine controls
JP6100076B2 (ja) * 2012-05-02 2017-03-22 株式会社半導体エネルギー研究所 プロセッサ

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006202482A (ja) 1997-05-30 2006-08-03 Micron Technology Inc ２５６Ｍｅｇダイナミックランダムアクセスメモリ

Also Published As

Publication number Publication date
EP3095193A1 (en) 2016-11-23
US9367054B2 (en) 2016-06-14
CN105917583A (zh) 2016-08-31
BR112016016431A2 (pt) 2017-08-08
KR20160108433A (ko) 2016-09-19
WO2015109188A1 (en) 2015-07-23
US20150198933A1 (en) 2015-07-16
CN105917583B (zh) 2021-05-07
JP6556736B2 (ja) 2019-08-07
JP2017509202A (ja) 2017-03-30

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