KR101899948B1 - 연마 조성물 및 실리콘 산화물막 상의 실리콘 질화물의 선택적 연마 방법 - Google Patents
연마 조성물 및 실리콘 산화물막 상의 실리콘 질화물의 선택적 연마 방법 Download PDFInfo
- Publication number
- KR101899948B1 KR101899948B1 KR1020150044959A KR20150044959A KR101899948B1 KR 101899948 B1 KR101899948 B1 KR 101899948B1 KR 1020150044959 A KR1020150044959 A KR 1020150044959A KR 20150044959 A KR20150044959 A KR 20150044959A KR 101899948 B1 KR101899948 B1 KR 101899948B1
- Authority
- KR
- South Korea
- Prior art keywords
- anionic
- polishing
- composition
- acid
- abrasive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/06—Planarisation of inorganic insulating materials
- H10P95/062—Planarisation of inorganic insulating materials involving a dielectric removal step
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- H01L21/30625—
-
- H01L21/31053—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/06—Planarisation of inorganic insulating materials
- H10P95/062—Planarisation of inorganic insulating materials involving a dielectric removal step
- H10P95/064—Planarisation of inorganic insulating materials involving a dielectric removal step the removal being chemical etching
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/245,286 US9583359B2 (en) | 2014-04-04 | 2014-04-04 | Polishing compositions and methods for selectively polishing silicon nitride over silicon oxide films |
| US14/245,286 | 2014-04-04 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20150115645A KR20150115645A (ko) | 2015-10-14 |
| KR101899948B1 true KR101899948B1 (ko) | 2018-09-19 |
Family
ID=53039177
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020150044959A Active KR101899948B1 (ko) | 2014-04-04 | 2015-03-31 | 연마 조성물 및 실리콘 산화물막 상의 실리콘 질화물의 선택적 연마 방법 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US9583359B2 (enExample) |
| EP (1) | EP2927294B1 (enExample) |
| JP (1) | JP6437870B2 (enExample) |
| KR (1) | KR101899948B1 (enExample) |
| TW (1) | TWI611009B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12477715B2 (en) | 2022-04-07 | 2025-11-18 | Samsung Electronics Co., Ltd. | Semiconductor device |
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| US10287457B2 (en) * | 2012-11-02 | 2019-05-14 | Lawrence Livermore National Security, Llc | Polishing slurry preventing agglomeration of charged colloids without loss of surface activity |
| US9583359B2 (en) * | 2014-04-04 | 2017-02-28 | Fujifilm Planar Solutions, LLC | Polishing compositions and methods for selectively polishing silicon nitride over silicon oxide films |
| JP2016207973A (ja) * | 2015-04-28 | 2016-12-08 | 株式会社東芝 | 半導体装置の製造方法 |
| TWI650392B (zh) * | 2016-02-16 | 2019-02-11 | Cabot Microelectronics Corporation | Iii至v族材料拋光之方法 |
| US10703936B2 (en) | 2016-03-30 | 2020-07-07 | Fujimi Incorporated | Polishing composition |
| EP3475375B1 (en) * | 2016-06-22 | 2023-11-15 | CMC Materials, Inc. | Polishing composition comprising an amine-containing surfactant |
| EP3526298B1 (en) | 2016-10-17 | 2024-07-10 | CMC Materials LLC | Cmp compositions selective for oxide and nitride with improved dishing and pattern selectivity |
| CN106672892A (zh) * | 2016-12-21 | 2017-05-17 | 中国电子科技集团公司第五十五研究所 | 减小三维堆叠中牺牲层在化学机械抛光中凹陷变形的方法 |
| US10294399B2 (en) * | 2017-01-05 | 2019-05-21 | Cabot Microelectronics Corporation | Composition and method for polishing silicon carbide |
| EP3631045B1 (en) * | 2017-05-25 | 2026-02-18 | Fujifilm Electronic Materials U.S.A., Inc. | Chemical mechanical polishing slurry for cobalt applications |
| US10377921B2 (en) * | 2017-09-21 | 2019-08-13 | Rohm and Haas Electronics Materials CMP Holdings, Inc. | Chemical mechanical polishing method for cobalt |
| US10170335B1 (en) * | 2017-09-21 | 2019-01-01 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing method for cobalt |
| US11186748B2 (en) * | 2017-09-28 | 2021-11-30 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Aqueous anionic functional silica slurry and amine carboxylic acid compositions for selective nitride removal in polishing and methods of using them |
| US10584265B2 (en) * | 2017-09-28 | 2020-03-10 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Aqueous silica slurry and amine carboxylic acid compositions selective for nitride removal in polishing and methods of using them |
| US10428241B2 (en) | 2017-10-05 | 2019-10-01 | Fujifilm Electronic Materials U.S.A., Inc. | Polishing compositions containing charged abrasive |
| WO2020021680A1 (ja) * | 2018-07-26 | 2020-01-30 | 日立化成株式会社 | スラリ及び研磨方法 |
| KR102499989B1 (ko) * | 2018-03-23 | 2023-02-15 | 후지필름 가부시키가이샤 | 연마액 및 화학적 기계적 연마 방법 |
| KR20200100809A (ko) | 2018-03-23 | 2020-08-26 | 후지필름 가부시키가이샤 | 연마액 및 화학적 기계적 연마 방법 |
| KR102759372B1 (ko) | 2019-01-08 | 2025-01-24 | 삼성전자주식회사 | 실리콘 질화물용 식각제 조성물 및 반도체 소자의 제조 방법 |
| WO2020214662A1 (en) | 2019-04-17 | 2020-10-22 | Cabot Microelectronics Corporation | Surface coated abrasive particles for tungsten buff applications |
| TWI853105B (zh) * | 2019-12-03 | 2024-08-21 | 日商Jsr股份有限公司 | 化學機械研磨用組成物及化學機械研磨方法 |
| JP7409918B2 (ja) * | 2020-03-13 | 2024-01-09 | 株式会社フジミインコーポレーテッド | 研磨用組成物、研磨用組成物の製造方法、研磨方法および半導体基板の製造方法 |
| KR102710233B1 (ko) | 2020-08-13 | 2024-09-27 | 창신 메모리 테크놀로지즈 아이엔씨 | 비트 라인 구조 제조 방법, 반도체 구조 제조 방법 및 반도체 구조 |
| TWI877406B (zh) | 2020-09-25 | 2025-03-21 | 日商福吉米股份有限公司 | 化學機械研磨漿料、化學機械研磨組合物、用於研磨表面的方法、及緩衝金屬氧化物鹽的方法 |
| JP2024508243A (ja) * | 2021-02-04 | 2024-02-26 | シーエムシー マテリアルズ リミティド ライアビリティ カンパニー | 炭窒化ケイ素研磨組成物及び方法 |
| KR20230112263A (ko) * | 2022-01-20 | 2023-07-27 | 에스케이엔펄스 주식회사 | 반도체 공정용 조성물, 이의 제조 방법 및 이를 이용한 반도체 소자 제조방법 |
| TWI873734B (zh) * | 2022-07-29 | 2025-02-21 | 美商聖高拜陶器塑膠公司 | 用於進行材料移除操作之組成物及方法 |
| CN115926629B (zh) * | 2022-12-30 | 2023-12-05 | 昂士特科技(深圳)有限公司 | 具有改进再循环性能的化学机械抛光组合物 |
| US20250376604A1 (en) * | 2024-06-05 | 2025-12-11 | Entegris, Inc. | Silica-based slurry for selective polishing of silicon nitride and silicon carbide |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2012033647A (ja) * | 2010-07-29 | 2012-02-16 | Fujifilm Corp | 研磨液及び研磨方法 |
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| JPH11176773A (ja) | 1997-12-12 | 1999-07-02 | Toshiba Corp | 研磨方法 |
| KR100583842B1 (ko) | 1998-02-24 | 2006-05-26 | 쇼와 덴코 가부시키가이샤 | 반도체 장치 연마용 연마재 조성물 및 이를 이용한 반도체장치의 제조방법 |
| JP3957924B2 (ja) * | 1999-06-28 | 2007-08-15 | 株式会社東芝 | Cmp研磨方法 |
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| KR100832993B1 (ko) * | 2006-04-14 | 2008-05-27 | 주식회사 엘지화학 | Cmp 슬러리용 보조제 |
| US20070254485A1 (en) * | 2006-04-28 | 2007-11-01 | Daxin Mao | Abrasive composition for electrochemical mechanical polishing |
| US8759216B2 (en) | 2006-06-07 | 2014-06-24 | Cabot Microelectronics Corporation | Compositions and methods for polishing silicon nitride materials |
| KR101396853B1 (ko) | 2007-07-06 | 2014-05-20 | 삼성전자주식회사 | 실리콘 질화물 연마용 슬러리 조성물, 이를 이용한 실리콘질화막의 연마 방법 및 반도체 장치의 제조 방법 |
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| JP5554121B2 (ja) * | 2010-03-31 | 2014-07-23 | 富士フイルム株式会社 | 研磨液及び研磨方法 |
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| US9583359B2 (en) * | 2014-04-04 | 2017-02-28 | Fujifilm Planar Solutions, LLC | Polishing compositions and methods for selectively polishing silicon nitride over silicon oxide films |
-
2014
- 2014-04-04 US US14/245,286 patent/US9583359B2/en active Active
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2015
- 2015-03-11 EP EP15158633.6A patent/EP2927294B1/en active Active
- 2015-03-13 TW TW104108090A patent/TWI611009B/zh active
- 2015-03-31 KR KR1020150044959A patent/KR101899948B1/ko active Active
- 2015-04-03 JP JP2015076924A patent/JP6437870B2/ja active Active
- 2015-09-17 US US14/857,310 patent/US9558959B2/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012033647A (ja) * | 2010-07-29 | 2012-02-16 | Fujifilm Corp | 研磨液及び研磨方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12477715B2 (en) | 2022-04-07 | 2025-11-18 | Samsung Electronics Co., Ltd. | Semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| US20160079080A1 (en) | 2016-03-17 |
| TWI611009B (zh) | 2018-01-11 |
| EP2927294A1 (en) | 2015-10-07 |
| US9558959B2 (en) | 2017-01-31 |
| US20150284593A1 (en) | 2015-10-08 |
| US9583359B2 (en) | 2017-02-28 |
| JP2015201644A (ja) | 2015-11-12 |
| JP6437870B2 (ja) | 2018-12-12 |
| EP2927294B1 (en) | 2017-08-02 |
| TW201542785A (zh) | 2015-11-16 |
| KR20150115645A (ko) | 2015-10-14 |
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