KR101315102B1 - 필름의 수율 예측 시스템 및 방법 - Google Patents

필름의 수율 예측 시스템 및 방법 Download PDF

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Publication number
KR101315102B1
KR101315102B1 KR1020110073536A KR20110073536A KR101315102B1 KR 101315102 B1 KR101315102 B1 KR 101315102B1 KR 1020110073536 A KR1020110073536 A KR 1020110073536A KR 20110073536 A KR20110073536 A KR 20110073536A KR 101315102 B1 KR101315102 B1 KR 101315102B1
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KR
South Korea
Prior art keywords
defect
defect data
optical film
data
defects
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KR1020110073536A
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English (en)
Korean (ko)
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KR20130012379A (ko
Inventor
홍승균
박재현
윤영근
Original Assignee
동우 화인켐 주식회사
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Application filed by 동우 화인켐 주식회사 filed Critical 동우 화인켐 주식회사
Priority to KR1020110073536A priority Critical patent/KR101315102B1/ko
Priority to JP2012154814A priority patent/JP6012311B2/ja
Priority to CN201210260972.5A priority patent/CN102901734B/zh
Publication of KR20130012379A publication Critical patent/KR20130012379A/ko
Application granted granted Critical
Publication of KR101315102B1 publication Critical patent/KR101315102B1/ko

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H7/00—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles
    • B65H7/02—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors
    • B65H7/06—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors responsive to presence of faulty articles or incorrect separation or feed
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921—Streaks
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2553/00—Sensing or detecting means
    • B65H2553/40—Sensing or detecting means using optical, e.g. photographic, elements
    • B65H2553/42—Cameras
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2701/00—Handled material; Storage means
    • B65H2701/10—Handled articles or webs
    • B65H2701/17—Nature of material
    • B65H2701/175—Plastic
    • B65H2701/1752—Polymer film

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Polarising Elements (AREA)
KR1020110073536A 2011-07-25 2011-07-25 필름의 수율 예측 시스템 및 방법 KR101315102B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020110073536A KR101315102B1 (ko) 2011-07-25 2011-07-25 필름의 수율 예측 시스템 및 방법
JP2012154814A JP6012311B2 (ja) 2011-07-25 2012-07-10 フィルムの歩留まり予測システム及び方法
CN201210260972.5A CN102901734B (zh) 2011-07-25 2012-07-25 光学薄膜成品率预测系统以及方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020110073536A KR101315102B1 (ko) 2011-07-25 2011-07-25 필름의 수율 예측 시스템 및 방법

Publications (2)

Publication Number Publication Date
KR20130012379A KR20130012379A (ko) 2013-02-04
KR101315102B1 true KR101315102B1 (ko) 2013-10-07

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ID=47574087

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020110073536A KR101315102B1 (ko) 2011-07-25 2011-07-25 필름의 수율 예측 시스템 및 방법

Country Status (3)

Country Link
JP (1) JP6012311B2 (ja)
KR (1) KR101315102B1 (ja)
CN (1) CN102901734B (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016013833A1 (ko) * 2014-07-22 2016-01-28 주식회사 엘지화학 재단 제품의 생산방법 및 재단 시스템
KR20160046301A (ko) 2014-10-20 2016-04-28 주식회사 엘지화학 재단 제품의 생산방법 및 생산 시스템
KR20160084601A (ko) 2015-01-06 2016-07-14 주식회사 엘지화학 재단 제품의 생산방법 및 재단 시스템
KR101746294B1 (ko) 2014-11-05 2017-06-12 주식회사 엘지화학 재단 제품의 생산방법 및 생산 시스템

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101717846B1 (ko) * 2014-07-22 2017-03-17 주식회사 엘지화학 재단 제품의 생산방법 및 재단 시스템
KR20160107532A (ko) 2015-03-04 2016-09-19 동우 화인켐 주식회사 광학 필름 검사 시스템 및 방법, 광학 필름 품질 관리 장치 및 방법
KR101898835B1 (ko) * 2015-04-09 2018-09-13 스미또모 가가꾸 가부시키가이샤 적층 광학 필름의 결함 검사 방법, 광학 필름의 결함 검사 방법 및 적층 광학 필름의 제조 방법
KR20170103416A (ko) * 2016-03-04 2017-09-13 동우 화인켐 주식회사 광학필름의 결함 정보 통합 관리 장치 및 그 방법
JP2019215371A (ja) * 2019-08-26 2019-12-19 住友化学株式会社 光学フィルム及び積層光学フィルムの欠陥検査方法
CN113155862B (zh) * 2021-04-15 2023-04-18 恒美光电股份有限公司 一种偏光膜卷材良率的模拟方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007057278A (ja) 2005-08-22 2007-03-08 Sumitomo Chemical Co Ltd 枚葉片断裁評価装置及び枚葉片断裁配置決定方法
KR20080033863A (ko) * 2006-10-11 2008-04-17 닛토덴코 가부시키가이샤 광학 필름을 갖는 시트상 제품의 결점 검사 장치, 그 검사데이터 처리 장치, 그 절단 장치 및 그 제조 시스템
KR20110007103A (ko) * 2008-04-14 2011-01-21 닛토덴코 가부시키가이샤 광학 표시 장치 제조 시스템 및 광학 표시 장치 제조 방법

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004117062A (ja) * 2002-09-24 2004-04-15 Seiko Epson Corp 電気光学パネル用基板の検査方法、電気光学パネル用基板の製造方法、電気光学パネル用基板、電気光学装置および電子機器
KR20060128979A (ko) * 2003-12-31 2006-12-14 쓰리엠 이노베이티브 프로퍼티즈 컴파니 웹 기반 제품의 수율을 최대화하는 방법 및 시스템
TWI431263B (zh) * 2005-03-28 2014-03-21 Shibaura Mechatronics Corp 應變矽晶圓表面檢查方法及檢查裝置
US7605914B2 (en) * 2005-09-29 2009-10-20 Carl Zeiss Smt Ag Optical system and method for improving imaging properties thereof
JP2009281836A (ja) * 2008-05-21 2009-12-03 Olympus Corp 基板観察装置、基板観察方法、制御装置、およびプログラム
JP5305002B2 (ja) * 2008-12-05 2013-10-02 オムロン株式会社 外観検査装置
CN101545868B (zh) * 2009-04-30 2011-06-08 上海交通大学 有色金属加工质量控制中的产品表面缺陷检测方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007057278A (ja) 2005-08-22 2007-03-08 Sumitomo Chemical Co Ltd 枚葉片断裁評価装置及び枚葉片断裁配置決定方法
KR20080033863A (ko) * 2006-10-11 2008-04-17 닛토덴코 가부시키가이샤 광학 필름을 갖는 시트상 제품의 결점 검사 장치, 그 검사데이터 처리 장치, 그 절단 장치 및 그 제조 시스템
KR20110007103A (ko) * 2008-04-14 2011-01-21 닛토덴코 가부시키가이샤 광학 표시 장치 제조 시스템 및 광학 표시 장치 제조 방법

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016013833A1 (ko) * 2014-07-22 2016-01-28 주식회사 엘지화학 재단 제품의 생산방법 및 재단 시스템
KR20160046301A (ko) 2014-10-20 2016-04-28 주식회사 엘지화학 재단 제품의 생산방법 및 생산 시스템
KR101746294B1 (ko) 2014-11-05 2017-06-12 주식회사 엘지화학 재단 제품의 생산방법 및 생산 시스템
KR20160084601A (ko) 2015-01-06 2016-07-14 주식회사 엘지화학 재단 제품의 생산방법 및 재단 시스템

Also Published As

Publication number Publication date
CN102901734B (zh) 2017-04-12
KR20130012379A (ko) 2013-02-04
JP2013024868A (ja) 2013-02-04
CN102901734A (zh) 2013-01-30
JP6012311B2 (ja) 2016-10-25

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