KR101296082B1 - 실리콘 수지 조성물, 이것을 이용하는, 실리콘 수지 함유 구조체, 광반도체 소자 봉지체, 실리콘 수지 조성물의 사용 방법 - Google Patents

실리콘 수지 조성물, 이것을 이용하는, 실리콘 수지 함유 구조체, 광반도체 소자 봉지체, 실리콘 수지 조성물의 사용 방법 Download PDF

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KR101296082B1
KR101296082B1 KR1020137012819A KR20137012819A KR101296082B1 KR 101296082 B1 KR101296082 B1 KR 101296082B1 KR 1020137012819 A KR1020137012819 A KR 1020137012819A KR 20137012819 A KR20137012819 A KR 20137012819A KR 101296082 B1 KR101296082 B1 KR 101296082B1
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group
silicone resin
resin composition
zinc
compound
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KR1020137012819A
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Korean (ko)
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KR20130070653A (ko
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요시히토 타케이
카즈노리 이시카와
타케아키 사이키
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요코하마 고무 가부시키가이샤
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • H01L23/296Organo-silicon compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/18Oxygen-containing compounds, e.g. metal carbonyls
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/04Oxygen-containing compounds
    • C08K5/09Carboxylic acids; Metal salts thereof; Anhydrides thereof
    • C08K5/098Metal salts of carboxylic acids
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L83/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers
    • C08L83/04Polysiloxanes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/52Encapsulations
    • H01L33/56Materials, e.g. epoxy or silicone resin
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G77/00Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
    • C08G77/04Polysiloxanes
    • C08G77/14Polysiloxanes containing silicon bound to oxygen-containing groups
    • C08G77/16Polysiloxanes containing silicon bound to oxygen-containing groups to hydroxyl groups
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/32257Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic the layer connector connecting to a bonding area disposed in a recess of the surface of the item
    • HELECTRICITY
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    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12044OLED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Laminated Bodies (AREA)
  • Macromonomer-Based Addition Polymer (AREA)
KR1020137012819A 2010-11-17 2011-11-16 실리콘 수지 조성물, 이것을 이용하는, 실리콘 수지 함유 구조체, 광반도체 소자 봉지체, 실리콘 수지 조성물의 사용 방법 KR101296082B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010257188 2010-11-17
JPJP-P-2010-257188 2010-11-17
PCT/JP2011/076423 WO2012067153A1 (ja) 2010-11-17 2011-11-16 シリコーン樹脂組成物、これを用いる、シリコーン樹脂含有構造体、光半導体素子封止体、シリコーン樹脂組成物の使用方法

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KR20130070653A KR20130070653A (ko) 2013-06-27
KR101296082B1 true KR101296082B1 (ko) 2013-08-19

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JP (1) JP5056998B2 (ja)
KR (1) KR101296082B1 (ja)
CN (1) CN103221485B (ja)
WO (1) WO2012067153A1 (ja)

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JP6010358B2 (ja) * 2012-06-20 2016-10-19 京セラ株式会社 光半導体部品の硫化防止又は硫化遅延方法
CN104837930B (zh) 2012-12-07 2020-10-16 杜邦东丽特殊材料株式会社 可固化有机硅组合物和光学半导体器件
EP3059768A4 (en) * 2013-10-17 2017-05-03 Dow Corning Toray Co., Ltd. Curable silicone composition, and optical semiconductor device
KR102177502B1 (ko) * 2013-11-20 2020-11-11 삼성에스디아이 주식회사 전자 소자 보호용 통합 실리콘, 이를 이용한 회로 모듈 및 이의 제조 방법
KR20150086158A (ko) 2014-01-17 2015-07-27 주식회사 엘지화학 배리어 필름 및 그 제조 방법
US10516082B2 (en) * 2015-07-07 2019-12-24 Lumileds Holding B.V. Device for emitting light
KR20180100561A (ko) * 2016-01-08 2018-09-11 주식회사 다이셀 경화성 실리콘 수지 조성물 및 그의 경화물, 및 광 반도체 장치
US20180148600A1 (en) * 2016-11-30 2018-05-31 Momentive Performance Materials Inc. Abrasion resistant coating composition with inorganic metal oxides
JP6458902B1 (ja) * 2017-03-15 2019-01-30 東レ株式会社 感光性シロキサン樹脂組成物、硬化膜およびタッチパネル用部材
WO2018173996A1 (ja) * 2017-03-23 2018-09-27 横浜ゴム株式会社 硬化性樹脂組成物、積層体、及び、光半導体パッケージ
WO2019102655A1 (ja) * 2017-11-21 2019-05-31 東レ株式会社 シロキサン樹脂組成物、硬化膜および表示装置
JP7087630B2 (ja) * 2018-04-25 2022-06-21 三菱電機株式会社 映像表示ユニット及び映像表示装置
JP7140188B2 (ja) * 2018-06-28 2022-09-21 信越化学工業株式会社 繊維処理剤
EP3633262A1 (de) * 2018-10-04 2020-04-08 ZKW Group GmbH Projektionseinrichtung für ein kraftfahrzeugscheinwerferlichtmodul und verfahren zum herstellen einer projektionseinrichtung

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JPH04229902A (ja) * 1990-07-19 1992-08-19 Rhone Poulenc Chim 特に電線の被覆に用いられ得る熱硬化性オルガノポリシロキサン組成物
JP2003188503A (ja) 2001-12-14 2003-07-04 Shin Etsu Chem Co Ltd 実装回路板保護用コーティング剤、実装回路板における硫化防止方法、及び実装回路板
JP2007231030A (ja) 2006-02-27 2007-09-13 Shin Etsu Chem Co Ltd 皮膜形成シリコーンエマルジョン組成物
JP2008063542A (ja) 2006-09-11 2008-03-21 Dow Corning Toray Co Ltd 硬化性シリコーン組成物および電子部品

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JP4684551B2 (ja) * 2003-12-25 2011-05-18 東レ・ダウコーニング株式会社 変色防止又は変色低減方法及び変色防止又は変色低減剤並びに当該変色防止又は変色低減剤を含むジオルガノポリシロキサン組成物
EP2155821A1 (en) * 2007-06-08 2010-02-24 Dow Corning Corporation Silicone elastomers for high temperature performance

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JPH04229902A (ja) * 1990-07-19 1992-08-19 Rhone Poulenc Chim 特に電線の被覆に用いられ得る熱硬化性オルガノポリシロキサン組成物
JP2003188503A (ja) 2001-12-14 2003-07-04 Shin Etsu Chem Co Ltd 実装回路板保護用コーティング剤、実装回路板における硫化防止方法、及び実装回路板
JP2007231030A (ja) 2006-02-27 2007-09-13 Shin Etsu Chem Co Ltd 皮膜形成シリコーンエマルジョン組成物
JP2008063542A (ja) 2006-09-11 2008-03-21 Dow Corning Toray Co Ltd 硬化性シリコーン組成物および電子部品

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JP5056998B2 (ja) 2012-10-24
WO2012067153A1 (ja) 2012-05-24
KR20130070653A (ko) 2013-06-27
CN103221485A (zh) 2013-07-24
CN103221485B (zh) 2014-10-29
JPWO2012067153A1 (ja) 2014-05-12

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