KR101292845B1 - 테스트 소켓 - Google Patents

테스트 소켓 Download PDF

Info

Publication number
KR101292845B1
KR101292845B1 KR1020060064647A KR20060064647A KR101292845B1 KR 101292845 B1 KR101292845 B1 KR 101292845B1 KR 1020060064647 A KR1020060064647 A KR 1020060064647A KR 20060064647 A KR20060064647 A KR 20060064647A KR 101292845 B1 KR101292845 B1 KR 101292845B1
Authority
KR
South Korea
Prior art keywords
contact
housing
loading board
contacts
slot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020060064647A
Other languages
English (en)
Korean (ko)
Other versions
KR20070006627A (ko
Inventor
이. 로페즈 조세
비. 쉘 데니스
엘 질크 매튜
Original Assignee
죤스테크 인터내셔날 코오포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=37309472&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=KR101292845(B1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by 죤스테크 인터내셔날 코오포레이션 filed Critical 죤스테크 인터내셔날 코오포레이션
Publication of KR20070006627A publication Critical patent/KR20070006627A/ko
Application granted granted Critical
Publication of KR101292845B1 publication Critical patent/KR101292845B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Connecting Device With Holders (AREA)
KR1020060064647A 2005-07-08 2006-07-10 테스트 소켓 Active KR101292845B1 (ko)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US69769305P 2005-07-08 2005-07-08
US69772105P 2005-07-08 2005-07-08
US60/697,721 2005-07-08
US60/697,693 2005-07-08
US77665406P 2006-02-24 2006-02-24
US60/776,654 2006-02-24
US11/482,644 2006-07-07
US11/482,644 US7445465B2 (en) 2005-07-08 2006-07-07 Test socket

Publications (2)

Publication Number Publication Date
KR20070006627A KR20070006627A (ko) 2007-01-11
KR101292845B1 true KR101292845B1 (ko) 2013-08-02

Family

ID=37309472

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020060064647A Active KR101292845B1 (ko) 2005-07-08 2006-07-10 테스트 소켓

Country Status (6)

Country Link
US (2) US7445465B2 (enExample)
EP (1) EP1742072B1 (enExample)
JP (1) JP5180445B2 (enExample)
KR (1) KR101292845B1 (enExample)
CN (1) CN103076467B (enExample)
TW (1) TWI397688B (enExample)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7639026B2 (en) * 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
JP5134803B2 (ja) * 2006-10-05 2013-01-30 株式会社日本マイクロニクス 電気的接続装置
JP5134805B2 (ja) * 2006-10-12 2013-01-30 株式会社日本マイクロニクス 電気的接続装置
JP2009043591A (ja) 2007-08-09 2009-02-26 Yamaichi Electronics Co Ltd Ｉｃソケット
US7686621B2 (en) * 2008-03-12 2010-03-30 Sigmatel, Inc. Integrated circuit test socket having elastic contact support and methods for use therewith
US8278955B2 (en) 2008-03-24 2012-10-02 Interconnect Devices, Inc. Test interconnect
US20090267629A1 (en) * 2008-04-23 2009-10-29 J. Foong Technologies Sdn. Bhd. Contact for interconnect system in a test socket
US20090289647A1 (en) 2008-05-01 2009-11-26 Interconnect Devices, Inc. Interconnect system
JP5029969B2 (ja) * 2008-11-12 2012-09-19 山一電機株式会社 電気接続装置
TW201027849A (en) 2009-01-13 2010-07-16 Yi-Zhi Yang Connector
USD668625S1 (en) * 2010-07-22 2012-10-09 Titan Semiconductor Tool, LLC Integrated circuit socket connector
KR200455379Y1 (ko) * 2011-06-13 2011-09-01 나경화 반도체 칩 테스트용 핀 및 그를 포함한 반도체 칩 테스트용 소켓
MY175570A (en) * 2012-03-20 2020-07-01 Jf Microtechnology Sdn Bhd Multiple rigid contact solution for ic testing
US9274141B1 (en) 2013-01-22 2016-03-01 Johnstech International Corporation Low resistance low wear test pin for test contactor
TWI500222B (zh) * 2013-07-12 2015-09-11 Ccp Contact Probes Co Ltd 連接器組合
US9425529B2 (en) * 2014-06-20 2016-08-23 Xcerra Corporation Integrated circuit chip tester with an anti-rotation link
KR101594993B1 (ko) * 2014-10-10 2016-02-17 정요채 반도체 패키지용 테스트 소켓
US9343830B1 (en) * 2015-06-08 2016-05-17 Xcerra Corporation Integrated circuit chip tester with embedded micro link
US9958499B1 (en) 2015-07-07 2018-05-01 Johnstech International Corporation Constant stress pin tip for testing integrated circuit chips
US10436819B1 (en) 2015-07-07 2019-10-08 Johnstech International Corporation Constant pressure pin tip for testing integrated circuit chips
TWI567846B (zh) * 2015-08-19 2017-01-21 創意電子股份有限公司 測試單元與使用其的測試裝置
US10101360B2 (en) 2016-11-02 2018-10-16 Xcerra Corporation Link socket sliding mount with preload
PH12018050194A1 (en) * 2017-05-18 2019-02-04 Jf Microtechnology Sdn Bhd Manufacturing process for kelvin contact assembly housing
JP7046527B2 (ja) * 2017-08-15 2022-04-04 株式会社日本マイクロニクス 電気的接続装置
MX2020007325A (es) * 2017-09-25 2021-01-29 Johnstech Int Corp Contactor de alto grado de aislamiento con clavija de prueba y carcasa para probar circuitos integrados.
US10985480B2 (en) 2018-04-30 2021-04-20 GITech Inc. Transformation connector
US11047878B2 (en) 2018-04-30 2021-06-29 GITech Inc. Electrical connector
US11067603B2 (en) 2018-04-30 2021-07-20 GITech Inc. Connector having contact members
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
CN110320390B (zh) * 2019-08-08 2021-12-10 深圳市研测科技有限公司 一种引脚保护型二极管测试用夹持工装
US11289836B2 (en) * 2020-07-23 2022-03-29 International Business Machines Corporation Land grid array electrical contact coating
EP4222509A4 (en) * 2020-10-02 2024-09-11 JohnsTech International Corporation HOUSING WITH ANTI-SMUDGE CAPABILITY
US11906576B1 (en) 2021-05-04 2024-02-20 Johnstech International Corporation Contact assembly array and testing system having contact assembly array
US11867752B1 (en) 2021-05-13 2024-01-09 Johnstech International Corporation Contact assembly and kelvin testing system having contact assembly
KR20240104127A (ko) * 2021-11-03 2024-07-04 존스테크 인터내셔널 코포레이션 수직 백스톱을 갖는 하우징
USD1042345S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Test pin
USD1075695S1 (en) 2022-04-05 2025-05-20 Johnstech International Corporation Contact pin for integrated circuit testing
USD1042346S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Contact pin for integrated circuit testing
KR102784779B1 (ko) * 2024-10-02 2025-03-19 서기복 반도체 소자 검사 장치

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11162605A (ja) * 1997-11-25 1999-06-18 Micronics Japan Co Ltd 電気的接続装置
US20040217771A1 (en) * 2003-04-29 2004-11-04 Leong Tan Yin Probe for integrated circuit test socket

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4980245A (en) * 1989-09-08 1990-12-25 Precision Concepts, Inc. Multi-element metallic composite article
US5189363A (en) * 1990-09-14 1993-02-23 Ibm Corporation Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester
US5069629A (en) * 1991-01-09 1991-12-03 Johnson David A Electrical interconnect contact system
US5207584A (en) * 1991-01-09 1993-05-04 Johnson David A Electrical interconnect contact system
US5634801A (en) * 1991-01-09 1997-06-03 Johnstech International Corporation Electrical interconnect contact system
FR2703839B1 (fr) * 1993-04-09 1995-07-07 Framatome Connectors France Connecteur intermédiaire entre carte de circuit imprimé et substrat à circuits électroniques.
US5594355A (en) * 1994-07-19 1997-01-14 Delta Design, Inc. Electrical contactor apparatus for testing integrated circuit devices
US5609489A (en) * 1994-12-21 1997-03-11 Hewlett-Packard Company Socket for contacting an electronic circuit during testing
US5938451A (en) * 1997-05-06 1999-08-17 Gryphics, Inc. Electrical connector with multiple modes of compliance
MY128129A (en) * 1997-09-16 2007-01-31 Tan Yin Leong Electrical contactor for testing integrated circuit devices
JP2000156268A (ja) * 1998-11-18 2000-06-06 Kasasaku Electronics:Kk Ｉｃソケット及びｉｃソケット用コンタクトピン
US6794890B1 (en) 1999-07-27 2004-09-21 Mitsubishi Denki Kabushiki Kaisha Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested
JP2002093541A (ja) 2000-09-19 2002-03-29 Miyazaki Oki Electric Co Ltd Ｉｃソケット
KR100351676B1 (ko) * 2000-10-12 2002-09-05 주식회사 우영 콘택핀 및 이것을 구비한 집적회로 패키지 테스트용 소켓
US20040067665A1 (en) * 2001-05-31 2004-04-08 Tomohiro Nakano Socket connector and contact for use in a socket connector
US20030068908A1 (en) * 2001-08-31 2003-04-10 Brandt Jeffrey J. Electrical contact for improved wiping action
US6854981B2 (en) * 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
US7059866B2 (en) * 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
WO2006114895A1 (ja) * 2005-04-21 2006-11-02 Kabushiki Kaisha Nihon Micronics 電気的接続装置
JP2009043591A (ja) * 2007-08-09 2009-02-26 Yamaichi Electronics Co Ltd Ｉｃソケット

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11162605A (ja) * 1997-11-25 1999-06-18 Micronics Japan Co Ltd 電気的接続装置
US20040217771A1 (en) * 2003-04-29 2004-11-04 Leong Tan Yin Probe for integrated circuit test socket

Also Published As

Publication number Publication date
US20070032128A1 (en) 2007-02-08
TWI397688B (zh) 2013-06-01
US20090053912A1 (en) 2009-02-26
US7722361B2 (en) 2010-05-25
US7445465B2 (en) 2008-11-04
CN103076467A (zh) 2013-05-01
KR20070006627A (ko) 2007-01-11
EP1742072A3 (en) 2009-05-20
EP1742072A2 (en) 2007-01-10
EP1742072B1 (en) 2012-05-30
JP2007017444A (ja) 2007-01-25
JP5180445B2 (ja) 2013-04-10
TW200710396A (en) 2007-03-16
CN103076467B (zh) 2016-01-20

Similar Documents

Publication Publication Date Title
KR101292845B1 (ko) 테스트 소켓
JP2007017444A5 (enExample)
US6776624B2 (en) Socket for electrical parts
KR101522027B1 (ko) 전자 장치 테스트 세트 및 그 내에 사용되는 컨택트
KR100734296B1 (ko) 자체 클리닝 기능이 있는 검사장치용 소켓핀 및 이를포함하는 검사장치
KR20100053663A (ko) 반도체 전기기계적 접점
CA2122508C (en) Apparatus for interconnecting electrical contacts
US20060073710A1 (en) Contact for electronic devices
US9804194B2 (en) Low resistance low wear test pin for test contactor
US8888502B2 (en) Electrical connector with dual contact halves
JP2001015236A (ja) Ｉｃソケット及び該ｉｃソケットのバネ手段
JP2014516158A (ja) 電気相互接続アッセンブリー
CN111579833A (zh) 一种适用于大电流高速信号测试的探针及连接器
KR102728126B1 (ko) 스트로크 조절수단을 구비한 테스트 소켓
KR20120005959A (ko) 전기 콘택트
US20050181638A1 (en) Interconnect device with opposingly oriented contacts
US7004762B2 (en) Socket for electrical parts
US12313650B2 (en) Multi-beam cantilever style contact pin for IC testing
US7445463B2 (en) Land grid array electrical connector
KR20220154956A (ko) 고속의 ssd 번인 소켓 및 ssd 컨트롤러 칩 동시 테스트를 위한 번인 보드
HK1185948B (zh) 測試座
HK1185948A (en) Test socket
KR100744997B1 (ko) Ｂｇａ 테스트 소켓의 소켓단자
US12487279B2 (en) Housing with vertical backstop
KR200226153Y1 (ko) 반도체칩 테스트용 컨넥터

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P18-X000 Priority claim added or amended

St.27 status event code: A-2-2-P10-P18-nap-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

A201 Request for examination
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

FPAY Annual fee payment

Payment date: 20160729

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

FPAY Annual fee payment

Payment date: 20170721

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

FPAY Annual fee payment

Payment date: 20180719

Year of fee payment: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

FPAY Annual fee payment

Payment date: 20190718

Year of fee payment: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 12

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 13