JP5180445B2 - テストソケット - Google Patents

テストソケット Download PDF

Info

Publication number
JP5180445B2
JP5180445B2 JP2006189459A JP2006189459A JP5180445B2 JP 5180445 B2 JP5180445 B2 JP 5180445B2 JP 2006189459 A JP2006189459 A JP 2006189459A JP 2006189459 A JP2006189459 A JP 2006189459A JP 5180445 B2 JP5180445 B2 JP 5180445B2
Authority
JP
Japan
Prior art keywords
contact
housing
slot
test socket
rear end
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2006189459A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007017444A (ja
JP2007017444A5 (enExample
Inventor
イー．ロペス ホセ
ビー．シェル デニス
エル．ギルク マシュー
Original Assignee
ジョンズテック インターナショナル コーポレイション
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=37309472&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP5180445(B2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by ジョンズテック インターナショナル コーポレイション filed Critical ジョンズテック インターナショナル コーポレイション
Publication of JP2007017444A publication Critical patent/JP2007017444A/ja
Publication of JP2007017444A5 publication Critical patent/JP2007017444A5/ja
Application granted granted Critical
Publication of JP5180445B2 publication Critical patent/JP5180445B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Connecting Device With Holders (AREA)
JP2006189459A 2005-07-08 2006-07-10 テストソケット Active JP5180445B2 (ja)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US69769305P 2005-07-08 2005-07-08
US69772105P 2005-07-08 2005-07-08
US60/697,721 2005-07-08
US60/697,693 2005-07-08
US77665406P 2006-02-24 2006-02-24
US60/776,654 2006-02-24
US11/482,644 2006-07-07
US11/482,644 US7445465B2 (en) 2005-07-08 2006-07-07 Test socket

Publications (3)

Publication Number Publication Date
JP2007017444A JP2007017444A (ja) 2007-01-25
JP2007017444A5 JP2007017444A5 (enExample) 2012-03-01
JP5180445B2 true JP5180445B2 (ja) 2013-04-10

Family

ID=37309472

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006189459A Active JP5180445B2 (ja) 2005-07-08 2006-07-10 テストソケット

Country Status (6)

Country Link
US (2) US7445465B2 (enExample)
EP (1) EP1742072B1 (enExample)
JP (1) JP5180445B2 (enExample)
KR (1) KR101292845B1 (enExample)
CN (1) CN103076467B (enExample)
TW (1) TWI397688B (enExample)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7639026B2 (en) * 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
JP5134803B2 (ja) * 2006-10-05 2013-01-30 株式会社日本マイクロニクス 電気的接続装置
JP5134805B2 (ja) * 2006-10-12 2013-01-30 株式会社日本マイクロニクス 電気的接続装置
JP2009043591A (ja) 2007-08-09 2009-02-26 Yamaichi Electronics Co Ltd Ｉｃソケット
US7686621B2 (en) * 2008-03-12 2010-03-30 Sigmatel, Inc. Integrated circuit test socket having elastic contact support and methods for use therewith
US8278955B2 (en) 2008-03-24 2012-10-02 Interconnect Devices, Inc. Test interconnect
US20090267629A1 (en) * 2008-04-23 2009-10-29 J. Foong Technologies Sdn. Bhd. Contact for interconnect system in a test socket
US20090289647A1 (en) 2008-05-01 2009-11-26 Interconnect Devices, Inc. Interconnect system
JP5029969B2 (ja) * 2008-11-12 2012-09-19 山一電機株式会社 電気接続装置
TW201027849A (en) 2009-01-13 2010-07-16 Yi-Zhi Yang Connector
USD668625S1 (en) * 2010-07-22 2012-10-09 Titan Semiconductor Tool, LLC Integrated circuit socket connector
KR200455379Y1 (ko) * 2011-06-13 2011-09-01 나경화 반도체 칩 테스트용 핀 및 그를 포함한 반도체 칩 테스트용 소켓
MY175570A (en) * 2012-03-20 2020-07-01 Jf Microtechnology Sdn Bhd Multiple rigid contact solution for ic testing
US9274141B1 (en) 2013-01-22 2016-03-01 Johnstech International Corporation Low resistance low wear test pin for test contactor
TWI500222B (zh) * 2013-07-12 2015-09-11 Ccp Contact Probes Co Ltd 連接器組合
US9425529B2 (en) * 2014-06-20 2016-08-23 Xcerra Corporation Integrated circuit chip tester with an anti-rotation link
KR101594993B1 (ko) * 2014-10-10 2016-02-17 정요채 반도체 패키지용 테스트 소켓
US9343830B1 (en) * 2015-06-08 2016-05-17 Xcerra Corporation Integrated circuit chip tester with embedded micro link
US9958499B1 (en) 2015-07-07 2018-05-01 Johnstech International Corporation Constant stress pin tip for testing integrated circuit chips
US10436819B1 (en) 2015-07-07 2019-10-08 Johnstech International Corporation Constant pressure pin tip for testing integrated circuit chips
TWI567846B (zh) * 2015-08-19 2017-01-21 創意電子股份有限公司 測試單元與使用其的測試裝置
US10101360B2 (en) 2016-11-02 2018-10-16 Xcerra Corporation Link socket sliding mount with preload
PH12018050194A1 (en) * 2017-05-18 2019-02-04 Jf Microtechnology Sdn Bhd Manufacturing process for kelvin contact assembly housing
JP7046527B2 (ja) * 2017-08-15 2022-04-04 株式会社日本マイクロニクス 電気的接続装置
MX2020007325A (es) * 2017-09-25 2021-01-29 Johnstech Int Corp Contactor de alto grado de aislamiento con clavija de prueba y carcasa para probar circuitos integrados.
US10985480B2 (en) 2018-04-30 2021-04-20 GITech Inc. Transformation connector
US11047878B2 (en) 2018-04-30 2021-06-29 GITech Inc. Electrical connector
US11067603B2 (en) 2018-04-30 2021-07-20 GITech Inc. Connector having contact members
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin
CN110320390B (zh) * 2019-08-08 2021-12-10 深圳市研测科技有限公司 一种引脚保护型二极管测试用夹持工装
US11289836B2 (en) * 2020-07-23 2022-03-29 International Business Machines Corporation Land grid array electrical contact coating
EP4222509A4 (en) * 2020-10-02 2024-09-11 JohnsTech International Corporation HOUSING WITH ANTI-SMUDGE CAPABILITY
US11906576B1 (en) 2021-05-04 2024-02-20 Johnstech International Corporation Contact assembly array and testing system having contact assembly array
US11867752B1 (en) 2021-05-13 2024-01-09 Johnstech International Corporation Contact assembly and kelvin testing system having contact assembly
KR20240104127A (ko) * 2021-11-03 2024-07-04 존스테크 인터내셔널 코포레이션 수직 백스톱을 갖는 하우징
USD1042345S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Test pin
USD1075695S1 (en) 2022-04-05 2025-05-20 Johnstech International Corporation Contact pin for integrated circuit testing
USD1042346S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Contact pin for integrated circuit testing
KR102784779B1 (ko) * 2024-10-02 2025-03-19 서기복 반도체 소자 검사 장치

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4980245A (en) * 1989-09-08 1990-12-25 Precision Concepts, Inc. Multi-element metallic composite article
US5189363A (en) * 1990-09-14 1993-02-23 Ibm Corporation Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester
US5069629A (en) * 1991-01-09 1991-12-03 Johnson David A Electrical interconnect contact system
US5207584A (en) * 1991-01-09 1993-05-04 Johnson David A Electrical interconnect contact system
US5634801A (en) * 1991-01-09 1997-06-03 Johnstech International Corporation Electrical interconnect contact system
FR2703839B1 (fr) * 1993-04-09 1995-07-07 Framatome Connectors France Connecteur intermédiaire entre carte de circuit imprimé et substrat à circuits électroniques.
US5594355A (en) * 1994-07-19 1997-01-14 Delta Design, Inc. Electrical contactor apparatus for testing integrated circuit devices
US5609489A (en) * 1994-12-21 1997-03-11 Hewlett-Packard Company Socket for contacting an electronic circuit during testing
US5938451A (en) * 1997-05-06 1999-08-17 Gryphics, Inc. Electrical connector with multiple modes of compliance
MY128129A (en) * 1997-09-16 2007-01-31 Tan Yin Leong Electrical contactor for testing integrated circuit devices
JP3577416B2 (ja) * 1997-11-25 2004-10-13 株式会社日本マイクロニクス 電気的接続装置
JP2000156268A (ja) * 1998-11-18 2000-06-06 Kasasaku Electronics:Kk Ｉｃソケット及びｉｃソケット用コンタクトピン
US6794890B1 (en) 1999-07-27 2004-09-21 Mitsubishi Denki Kabushiki Kaisha Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested
JP2002093541A (ja) 2000-09-19 2002-03-29 Miyazaki Oki Electric Co Ltd Ｉｃソケット
KR100351676B1 (ko) * 2000-10-12 2002-09-05 주식회사 우영 콘택핀 및 이것을 구비한 집적회로 패키지 테스트용 소켓
US20040067665A1 (en) * 2001-05-31 2004-04-08 Tomohiro Nakano Socket connector and contact for use in a socket connector
US20030068908A1 (en) * 2001-08-31 2003-04-10 Brandt Jeffrey J. Electrical contact for improved wiping action
US6854981B2 (en) * 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
US7059866B2 (en) * 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
SG129245A1 (en) * 2003-04-29 2007-02-26 Tan Yin Leong Improved probe for integrated circuit test socket
WO2006114895A1 (ja) * 2005-04-21 2006-11-02 Kabushiki Kaisha Nihon Micronics 電気的接続装置
JP2009043591A (ja) * 2007-08-09 2009-02-26 Yamaichi Electronics Co Ltd Ｉｃソケット

Also Published As

Publication number Publication date
US20070032128A1 (en) 2007-02-08
TWI397688B (zh) 2013-06-01
US20090053912A1 (en) 2009-02-26
US7722361B2 (en) 2010-05-25
US7445465B2 (en) 2008-11-04
CN103076467A (zh) 2013-05-01
KR20070006627A (ko) 2007-01-11
EP1742072A3 (en) 2009-05-20
EP1742072A2 (en) 2007-01-10
EP1742072B1 (en) 2012-05-30
JP2007017444A (ja) 2007-01-25
KR101292845B1 (ko) 2013-08-02
TW200710396A (en) 2007-03-16
CN103076467B (zh) 2016-01-20

Similar Documents

Publication Publication Date Title
JP5180445B2 (ja) テストソケット
JP2007017444A5 (enExample)
US7639026B2 (en) Electronic device test set and contact used therein
US7059866B2 (en) integrated circuit contact to test apparatus
CN101803116B (zh) 半导体电机械接触器
US9804194B2 (en) Low resistance low wear test pin for test contactor
JP4109673B2 (ja) 背面に刳り貫かれた中心位置から外れた開口を有する接触プローブ
JP2010015894A (ja) 検査用コネクター
CN106684599B (zh) 电连接器
JP5113481B2 (ja) 接触子及びこれを用いる電気的接続装置
JP5134805B2 (ja) 電気的接続装置
KR20110097994A (ko) 동축 커넥터
WO2006127059A3 (en) Electrical connector for piercing a conductive member
HK1185948B (zh) 測試座
HK1185948A (en) Test socket
HK1105226A (zh) 測試座
KR101706205B1 (ko) 반도체 디바이스 테스트용 콘택터 및 이를 포함하는 테스트 소켓
JP2006107854A (ja) Ｉｃソケット
JP2005190791A (ja) 導電接触子、およびこの導電接触子を備えた検査装置
HK1144622A (en) Semiconductor electromechanical contact
JP2006236928A (ja) Ｉｃソケット

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060905

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090313

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20090313

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110920

A524 Written submission of copy of amendment under article 19 pct

Free format text: JAPANESE INTERMEDIATE CODE: A524

Effective date: 20111220

A524 Written submission of copy of amendment under article 19 pct

Free format text: JAPANESE INTERMEDIATE CODE: A524

Effective date: 20111220

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120207

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20120502

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20120509

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120807

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120828

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121121

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20121225

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130111

R150 Certificate of patent or registration of utility model

Ref document number: 5180445

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250