KR101250722B1 - 기판세정방법 및 기판세정장치 - Google Patents
기판세정방법 및 기판세정장치 Download PDFInfo
- Publication number
- KR101250722B1 KR101250722B1 KR1020110053954A KR20110053954A KR101250722B1 KR 101250722 B1 KR101250722 B1 KR 101250722B1 KR 1020110053954 A KR1020110053954 A KR 1020110053954A KR 20110053954 A KR20110053954 A KR 20110053954A KR 101250722 B1 KR101250722 B1 KR 101250722B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- nozzle
- rinse liquid
- gas
- liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H10P70/15—Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Cleaning Or Drying Semiconductors (AREA)
- Liquid Crystal (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Weting (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010154509A JP5538102B2 (ja) | 2010-07-07 | 2010-07-07 | 基板洗浄方法および基板洗浄装置 |
| JPJP-P-2010-154509 | 2010-07-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20120004922A KR20120004922A (ko) | 2012-01-13 |
| KR101250722B1 true KR101250722B1 (ko) | 2013-04-03 |
Family
ID=45437688
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020110053954A Active KR101250722B1 (ko) | 2010-07-07 | 2011-06-03 | 기판세정방법 및 기판세정장치 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US9028621B2 (enExample) |
| JP (1) | JP5538102B2 (enExample) |
| KR (1) | KR101250722B1 (enExample) |
Families Citing this family (48)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8900307B2 (en) | 2007-06-26 | 2014-12-02 | DePuy Synthes Products, LLC | Highly lordosed fusion cage |
| EP2471493A1 (en) | 2008-01-17 | 2012-07-04 | Synthes GmbH | An expandable intervertebral implant and associated method of manufacturing the same |
| JP5441997B2 (ja) | 2008-04-05 | 2014-03-12 | ジンテス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 拡張可能な椎骨間インプラント |
| US9282979B2 (en) | 2010-06-24 | 2016-03-15 | DePuy Synthes Products, Inc. | Instruments and methods for non-parallel disc space preparation |
| US8979860B2 (en) | 2010-06-24 | 2015-03-17 | DePuy Synthes Products. LLC | Enhanced cage insertion device |
| EP2588034B1 (en) | 2010-06-29 | 2018-01-03 | Synthes GmbH | Distractible intervertebral implant |
| US9402732B2 (en) | 2010-10-11 | 2016-08-02 | DePuy Synthes Products, Inc. | Expandable interspinous process spacer implant |
| JP5528486B2 (ja) * | 2012-02-07 | 2014-06-25 | 東京エレクトロン株式会社 | 基板処理装置、これを備える塗布現像装置、及び基板処理方法 |
| US20140067069A1 (en) | 2012-08-30 | 2014-03-06 | Interventional Spine, Inc. | Artificial disc |
| KR101486331B1 (ko) * | 2012-11-07 | 2015-01-26 | 주식회사 케이씨텍 | 기판 건조장치 |
| US9717601B2 (en) | 2013-02-28 | 2017-08-01 | DePuy Synthes Products, Inc. | Expandable intervertebral implant, system, kit and method |
| US9522070B2 (en) | 2013-03-07 | 2016-12-20 | Interventional Spine, Inc. | Intervertebral implant |
| JP2014194965A (ja) * | 2013-03-28 | 2014-10-09 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
| JP6007925B2 (ja) * | 2013-05-28 | 2016-10-19 | 東京エレクトロン株式会社 | 基板洗浄装置、基板洗浄方法及び記憶媒体 |
| US9704730B2 (en) * | 2013-05-28 | 2017-07-11 | Tokyo Electron Limited | Substrate cleaning apparatus, substrate cleaning method and non-transitory storage medium |
| JP5995881B2 (ja) * | 2014-01-09 | 2016-09-21 | 東京エレクトロン株式会社 | 基板洗浄方法、基板洗浄装置、及びコンピュータ読み取り可能な記録媒体 |
| JP2015173369A (ja) * | 2014-03-12 | 2015-10-01 | ソニー株式会社 | 信号処理装置、信号処理方法、およびプログラム |
| JP6386769B2 (ja) | 2014-04-16 | 2018-09-05 | 株式会社荏原製作所 | 基板乾燥装置、制御プログラム、及び基板乾燥方法 |
| JP6148210B2 (ja) * | 2014-06-17 | 2017-06-14 | 東京エレクトロン株式会社 | 現像方法及びコンピュータ読み取り可能な記録媒体 |
| JP6454245B2 (ja) * | 2014-10-21 | 2019-01-16 | 東京エレクトロン株式会社 | 基板液処理方法及び基板液処理装置並びに基板液処理プログラムを記憶したコンピュータ読み取り可能な記憶媒体 |
| US11426290B2 (en) | 2015-03-06 | 2022-08-30 | DePuy Synthes Products, Inc. | Expandable intervertebral implant, system, kit and method |
| KR20170134925A (ko) * | 2016-05-27 | 2017-12-07 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| US11510788B2 (en) | 2016-06-28 | 2022-11-29 | Eit Emerging Implant Technologies Gmbh | Expandable, angularly adjustable intervertebral cages |
| JP7023877B2 (ja) | 2016-06-28 | 2022-02-22 | イーアイティー・エマージング・インプラント・テクノロジーズ・ゲーエムベーハー | 拡張可能かつ角度調節可能な関節運動式の椎間ケージ |
| US10395930B2 (en) * | 2016-12-30 | 2019-08-27 | Semes Co., Ltd. | Substrate treating apparatus and substrate treating method |
| US10398563B2 (en) | 2017-05-08 | 2019-09-03 | Medos International Sarl | Expandable cage |
| US11344424B2 (en) | 2017-06-14 | 2022-05-31 | Medos International Sarl | Expandable intervertebral implant and related methods |
| JP7073658B2 (ja) | 2017-09-25 | 2022-05-24 | 東京エレクトロン株式会社 | 基板処理方法、基板処理装置、及び記憶媒体 |
| EP3479912A1 (en) * | 2017-11-07 | 2019-05-08 | Satisloh AG | Cleaning station for optical elements |
| JP7218098B2 (ja) * | 2018-05-31 | 2023-02-06 | 株式会社デンソーテン | 塗布装置および塗布方法 |
| US11355366B2 (en) | 2018-08-30 | 2022-06-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Systems and methods for shuttered wafer cleaning |
| JP7138539B2 (ja) * | 2018-10-18 | 2022-09-16 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
| US11446156B2 (en) | 2018-10-25 | 2022-09-20 | Medos International Sarl | Expandable intervertebral implant, inserter instrument, and related methods |
| JP7308048B2 (ja) * | 2019-02-15 | 2023-07-13 | 株式会社Screenホールディングス | 液処理装置および液処理方法 |
| JP7308105B2 (ja) * | 2019-09-02 | 2023-07-13 | 東京エレクトロン株式会社 | 現像処理方法及び現像処理装置 |
| JP7265467B2 (ja) * | 2019-12-17 | 2023-04-26 | 株式会社荏原製作所 | レジスト除去システムおよびレジスト除去方法 |
| US10998218B1 (en) * | 2019-12-29 | 2021-05-04 | Nanya Technology Corporation | Wet cleaning apparatus and manufacturing method using the same |
| KR20250069975A (ko) * | 2020-03-05 | 2025-05-20 | 도쿄엘렉트론가부시키가이샤 | 기판 처리 방법 및 기판 처리 장치 |
| US11426286B2 (en) | 2020-03-06 | 2022-08-30 | Eit Emerging Implant Technologies Gmbh | Expandable intervertebral implant |
| CN113391528A (zh) * | 2020-03-11 | 2021-09-14 | 长鑫存储技术有限公司 | 改善光阻显影均匀性的方法 |
| TWI819992B (zh) * | 2020-09-18 | 2023-10-21 | 日商斯庫林集團股份有限公司 | 基板洗淨裝置及基板處理裝置 |
| KR102504087B1 (ko) * | 2020-12-29 | 2023-02-24 | 세메스 주식회사 | 기판 처리 장치 및 방법 |
| US11850160B2 (en) | 2021-03-26 | 2023-12-26 | Medos International Sarl | Expandable lordotic intervertebral fusion cage |
| US11752009B2 (en) | 2021-04-06 | 2023-09-12 | Medos International Sarl | Expandable intervertebral fusion cage |
| JP7781577B2 (ja) * | 2021-09-22 | 2025-12-08 | キオクシア株式会社 | 基板処理装置及び基板処理方法 |
| US12090064B2 (en) | 2022-03-01 | 2024-09-17 | Medos International Sarl | Stabilization members for expandable intervertebral implants, and related systems and methods |
| US12138745B2 (en) | 2023-03-22 | 2024-11-12 | Yield Engineering Systems, Inc. | Apparatus and method for coating removal |
| CN117116741B (zh) * | 2023-08-09 | 2024-07-09 | 中环领先半导体科技股份有限公司 | 一种晶圆键合前的清洗方法及清洗装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20050035318A (ko) * | 2003-10-10 | 2005-04-18 | 세메스 주식회사 | 기판 세정 건조 장치 및 방법 |
| KR20060034640A (ko) * | 2003-11-18 | 2006-04-24 | 동경 엘렉트론 주식회사 | 기판 세정 방법, 기판 세정 장치 및 컴퓨터 판독 가능한기록 매체 |
| KR20060037276A (ko) * | 2004-04-23 | 2006-05-03 | 동경 엘렉트론 주식회사 | 기판 세정 방법, 기판 세정 장치 및 컴퓨터 판독 가능한 기억 매체 |
| JP2007081311A (ja) | 2005-09-16 | 2007-03-29 | Renesas Technology Corp | 枚葉型ウェハ洗浄装置及び半導体装置の製造方法 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW386235B (en) | 1995-05-23 | 2000-04-01 | Tokyo Electron Ltd | Method for spin rinsing |
| JP3402932B2 (ja) * | 1995-05-23 | 2003-05-06 | 東京エレクトロン株式会社 | 洗浄方法及びその装置 |
| EP0905748B1 (en) | 1997-09-24 | 2006-03-15 | Interuniversitair Micro-Elektronica Centrum Vzw | Method of removing particles and a liquid from a surface of substrate |
| US6398975B1 (en) | 1997-09-24 | 2002-06-04 | Interuniversitair Microelektronica Centrum (Imec) | Method and apparatus for localized liquid treatment of the surface of a substrate |
| US6491764B2 (en) | 1997-09-24 | 2002-12-10 | Interuniversitair Microelektronics Centrum (Imec) | Method and apparatus for removing a liquid from a surface of a rotating substrate |
| JP4017680B2 (ja) | 1997-09-24 | 2007-12-05 | アンテルユニヴェルシテール・ミクロ―エレクトロニカ・サントリュム・ヴェー・ゼッド・ドゥブルヴェ | 表面から液体を除去する方法及び装置 |
| US6334902B1 (en) | 1997-09-24 | 2002-01-01 | Interuniversitair Microelektronica Centrum (Imec) | Method and apparatus for removing a liquid from a surface |
| JP4616948B2 (ja) | 1997-09-24 | 2011-01-19 | アイメック | 回転基材の表面から液体を除去する方法および装置 |
| US7527698B2 (en) | 1998-09-23 | 2009-05-05 | Interuniversitair Microelektronica Centrum (Imec, Vzw) | Method and apparatus for removing a liquid from a surface of a substrate |
| JP3322853B2 (ja) * | 1999-08-10 | 2002-09-09 | 株式会社プレテック | 基板の乾燥装置および洗浄装置並びに乾燥方法および洗浄方法 |
| JP3694641B2 (ja) | 2000-08-09 | 2005-09-14 | 東京エレクトロン株式会社 | 基板処理装置、現像処理装置及び現像処理方法 |
| JP4369325B2 (ja) | 2003-12-26 | 2009-11-18 | 東京エレクトロン株式会社 | 現像装置及び現像処理方法 |
| JP4324527B2 (ja) | 2004-09-09 | 2009-09-02 | 東京エレクトロン株式会社 | 基板洗浄方法及び現像装置 |
| JP2006114884A (ja) | 2004-09-17 | 2006-04-27 | Ebara Corp | 基板洗浄処理装置及び基板処理ユニット |
| JP5154007B2 (ja) | 2004-12-06 | 2013-02-27 | 株式会社Sokudo | 基板処理装置 |
| WO2006082780A1 (ja) * | 2005-02-07 | 2006-08-10 | Ebara Corporation | 基板処理方法、基板処理装置及び制御プログラム |
| US8211242B2 (en) | 2005-02-07 | 2012-07-03 | Ebara Corporation | Substrate processing method, substrate processing apparatus, and control program |
| JP2006245381A (ja) * | 2005-03-04 | 2006-09-14 | Semes Co Ltd | 基板洗浄乾燥装置および方法 |
| US7767026B2 (en) * | 2005-03-29 | 2010-08-03 | Dainippon Screen Mfg. Co., Ltd. | Substrate processing apparatus and substrate processing method |
| TWI364524B (en) * | 2005-05-13 | 2012-05-21 | Lam Res Ag | Method for drying a surface |
| JP4937678B2 (ja) * | 2006-08-29 | 2012-05-23 | 大日本スクリーン製造株式会社 | 基板処理方法および基板処理装置 |
| KR100940136B1 (ko) | 2006-08-29 | 2010-02-03 | 다이닛뽕스크린 세이조오 가부시키가이샤 | 기판처리방법 및 기판처리장치 |
| EP2067162B1 (en) | 2006-10-02 | 2017-12-13 | Lam Research AG | Device and method for removing liquid from a surface of a disc-like article |
| JP5166802B2 (ja) | 2007-09-13 | 2013-03-21 | 株式会社Sokudo | 基板処理装置および基板処理方法 |
| JP5192206B2 (ja) | 2007-09-13 | 2013-05-08 | 株式会社Sokudo | 基板処理装置および基板処理方法 |
| JP5323374B2 (ja) | 2008-03-24 | 2013-10-23 | 株式会社Sokudo | 現像装置および現像方法 |
| JP5151629B2 (ja) * | 2008-04-03 | 2013-02-27 | 東京エレクトロン株式会社 | 基板洗浄方法、基板洗浄装置、現像方法、現像装置及び記憶媒体 |
| JP5522903B2 (ja) * | 2008-04-16 | 2014-06-18 | 株式会社Sokudo | 基板乾燥装置およびそれを備えた基板処理装置 |
-
2010
- 2010-07-07 JP JP2010154509A patent/JP5538102B2/ja active Active
-
2011
- 2011-05-26 US US13/116,793 patent/US9028621B2/en active Active
- 2011-06-03 KR KR1020110053954A patent/KR101250722B1/ko active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20050035318A (ko) * | 2003-10-10 | 2005-04-18 | 세메스 주식회사 | 기판 세정 건조 장치 및 방법 |
| KR20060034640A (ko) * | 2003-11-18 | 2006-04-24 | 동경 엘렉트론 주식회사 | 기판 세정 방법, 기판 세정 장치 및 컴퓨터 판독 가능한기록 매체 |
| KR20060037276A (ko) * | 2004-04-23 | 2006-05-03 | 동경 엘렉트론 주식회사 | 기판 세정 방법, 기판 세정 장치 및 컴퓨터 판독 가능한 기억 매체 |
| JP2007081311A (ja) | 2005-09-16 | 2007-03-29 | Renesas Technology Corp | 枚葉型ウェハ洗浄装置及び半導体装置の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2012019002A (ja) | 2012-01-26 |
| KR20120004922A (ko) | 2012-01-13 |
| US20120006361A1 (en) | 2012-01-12 |
| US9028621B2 (en) | 2015-05-12 |
| JP5538102B2 (ja) | 2014-07-02 |
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