KR101211490B1 - 대역폭 스펙트럼 제어를 위한 레이저 출력빔의 파면스플리터 - Google Patents
대역폭 스펙트럼 제어를 위한 레이저 출력빔의 파면스플리터 Download PDFInfo
- Publication number
- KR101211490B1 KR101211490B1 KR1020067027071A KR20067027071A KR101211490B1 KR 101211490 B1 KR101211490 B1 KR 101211490B1 KR 1020067027071 A KR1020067027071 A KR 1020067027071A KR 20067027071 A KR20067027071 A KR 20067027071A KR 101211490 B1 KR101211490 B1 KR 101211490B1
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- South Korea
- Prior art keywords
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- Expired - Lifetime
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
- H01S3/081—Construction or shape of optical resonators or components thereof comprising three or more reflectors
- H01S3/0811—Construction or shape of optical resonators or components thereof comprising three or more reflectors incorporating a dispersive element, e.g. a prism for wavelength selection
- H01S3/0812—Construction or shape of optical resonators or components thereof comprising three or more reflectors incorporating a dispersive element, e.g. a prism for wavelength selection using a diffraction grating
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70025—Production of exposure light, i.e. light sources by lasers
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70575—Wavelength control, e.g. control of bandwidth, multiple wavelength, selection of wavelength or matching of optical components to wavelength
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
- H01S3/097—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/105—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
- H01S3/1055—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length one of the reflectors being constituted by a diffraction grating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
- H01S3/08059—Constructional details of the reflector, e.g. shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
- H01S3/1305—Feedback control systems
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Lasers (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/875,662 | 2004-06-23 | ||
| US10/875,662 US7154928B2 (en) | 2004-06-23 | 2004-06-23 | Laser output beam wavefront splitter for bandwidth spectrum control |
| PCT/US2005/021585 WO2006009905A1 (en) | 2004-06-23 | 2005-06-17 | Laser output beam wavefront splitter for bandwidth spectrum control |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20070028447A KR20070028447A (ko) | 2007-03-12 |
| KR101211490B1 true KR101211490B1 (ko) | 2012-12-12 |
Family
ID=35505683
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020067027071A Expired - Lifetime KR101211490B1 (ko) | 2004-06-23 | 2006-12-22 | 대역폭 스펙트럼 제어를 위한 레이저 출력빔의 파면스플리터 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7154928B2 (enExample) |
| EP (1) | EP1766737B1 (enExample) |
| JP (3) | JP5745736B2 (enExample) |
| KR (1) | KR101211490B1 (enExample) |
| DE (1) | DE602005025124D1 (enExample) |
| TW (1) | TWI294228B (enExample) |
| WO (1) | WO2006009905A1 (enExample) |
Families Citing this family (55)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100702845B1 (ko) * | 2006-01-20 | 2007-04-03 | 삼성전자주식회사 | 엑시머 레이저 및 그의 협대역 모듈 |
| CN100540725C (zh) * | 2006-11-07 | 2009-09-16 | 中国科学院物理研究所 | 一种用于脉冲激光沉积系统中的调节基片角度的装置 |
| JP2008140956A (ja) * | 2006-12-01 | 2008-06-19 | Canon Inc | 露光装置 |
| US20080180696A1 (en) * | 2007-01-30 | 2008-07-31 | Sony Corporation | Process window for EUV lithography |
| US9018561B2 (en) | 2007-05-23 | 2015-04-28 | Cymer, Llc | High power seed/amplifier laser system with beam shaping intermediate the seed and amplifier |
| DE102008050869A1 (de) * | 2008-09-30 | 2009-11-26 | Carl Zeiss Laser Optics Gmbh | Optische Vorrichtung zur Vergrößerung des Einstellbereichs der spektralen Bandbreite eines Laserstrahls |
| US8144739B2 (en) * | 2008-10-24 | 2012-03-27 | Cymer, Inc. | System method and apparatus for selecting and controlling light source bandwidth |
| USRE45957E1 (en) | 2009-03-27 | 2016-03-29 | Cymer, Llc | Regenerative ring resonator |
| US8014432B2 (en) * | 2009-03-27 | 2011-09-06 | Cymer, Inc. | Regenerative ring resonator |
| US8520186B2 (en) * | 2009-08-25 | 2013-08-27 | Cymer, Llc | Active spectral control of optical source |
| JP5410396B2 (ja) | 2010-03-23 | 2014-02-05 | ギガフォトン株式会社 | レーザ装置 |
| US8837536B2 (en) | 2010-04-07 | 2014-09-16 | Cymer, Llc | Method and apparatus for controlling light bandwidth |
| JP2013062484A (ja) | 2011-08-24 | 2013-04-04 | Gigaphoton Inc | レーザ装置 |
| JP6113426B2 (ja) | 2011-09-08 | 2017-04-12 | ギガフォトン株式会社 | マスタオシレータシステムおよびレーザ装置 |
| JP2013070029A (ja) | 2011-09-08 | 2013-04-18 | Gigaphoton Inc | マスタオシレータシステムおよびレーザ装置 |
| JP2013145863A (ja) | 2011-11-29 | 2013-07-25 | Gigaphoton Inc | 2光束干渉装置および2光束干渉露光システム |
| JP6063133B2 (ja) | 2012-02-15 | 2017-01-18 | ギガフォトン株式会社 | エキシマレーザおよびレーザ装置 |
| US9207119B2 (en) | 2012-04-27 | 2015-12-08 | Cymer, Llc | Active spectral control during spectrum synthesis |
| JP2013247240A (ja) | 2012-05-25 | 2013-12-09 | Gigaphoton Inc | レーザ装置 |
| TWI469462B (zh) | 2012-11-30 | 2015-01-11 | Ind Tech Res Inst | 時間差調制旁波段增益短脈衝雷射輸出裝置 |
| GB2513884B (en) | 2013-05-08 | 2015-06-17 | Univ Bristol | Method and apparatus for producing an acoustic field |
| US9715180B2 (en) | 2013-06-11 | 2017-07-25 | Cymer, Llc | Wafer-based light source parameter control |
| WO2016084263A1 (ja) * | 2014-11-28 | 2016-06-02 | ギガフォトン株式会社 | 狭帯域化レーザ装置 |
| US9785050B2 (en) | 2015-06-26 | 2017-10-10 | Cymer, Llc | Pulsed light beam spectral feature control |
| US10120196B2 (en) | 2016-09-30 | 2018-11-06 | National Taiwan University Of Science And Technology | Optical device |
| US9835959B1 (en) | 2016-10-17 | 2017-12-05 | Cymer, Llc | Controlling for wafer stage vibration |
| US9989866B2 (en) | 2016-10-17 | 2018-06-05 | Cymer, Llc | Wafer-based light source parameter control |
| US10416471B2 (en) | 2016-10-17 | 2019-09-17 | Cymer, Llc | Spectral feature control apparatus |
| US9997888B2 (en) | 2016-10-17 | 2018-06-12 | Cymer, Llc | Control of a spectral feature of a pulsed light beam |
| JP6846985B2 (ja) * | 2017-05-19 | 2021-03-24 | アイシン高丘株式会社 | 排気装置 |
| JP6616368B2 (ja) * | 2017-09-14 | 2019-12-04 | ファナック株式会社 | レーザ加工前に光学系の汚染レベルに応じて加工条件を補正するレーザ加工装置 |
| CN118011728A (zh) | 2017-10-19 | 2024-05-10 | 西默有限公司 | 在单次光刻曝光通过过程中形成多个空间图像 |
| WO2019122916A1 (en) | 2017-12-22 | 2019-06-27 | Ultrahaptics Limited | Minimizing unwanted responses in haptic systems |
| NL2022609A (en) | 2018-03-12 | 2019-09-18 | Asml Netherlands Bv | Control System and Method |
| JP7044894B2 (ja) | 2018-03-30 | 2022-03-30 | サイマー リミテッド ライアビリティ カンパニー | パルス光ビームのスペクトル特性選択及びパルスタイミング制御 |
| KR102120551B1 (ko) * | 2018-09-14 | 2020-06-09 | (주)오로스 테크놀로지 | 오버레이 측정장치 |
| US12373033B2 (en) | 2019-01-04 | 2025-07-29 | Ultrahaptics Ip Ltd | Mid-air haptic textures |
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| CN116670591A (zh) * | 2021-02-24 | 2023-08-29 | 极光先进雷射株式会社 | 激光装置和电子器件的制造方法 |
| TW202307578A (zh) | 2021-04-19 | 2023-02-16 | 美商希瑪有限責任公司 | 在單一微影曝光遍次中形成多個空間影像 |
| US20230008557A1 (en) * | 2021-07-07 | 2023-01-12 | Owl Autonomous Imaging, Inc. | Split-field optics for imaging and ranging |
| EP4441564A1 (en) * | 2021-11-29 | 2024-10-09 | Cymer, LLC | Control voltage threshold selection to facilitate multifocal imaging |
| CN116526269B (zh) * | 2023-05-22 | 2024-01-30 | 北京国光领航科技有限公司 | 实现波长可自动调谐的锁模钛宝石飞秒激光振荡器及方法 |
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- 2005-06-17 EP EP05766736A patent/EP1766737B1/en not_active Expired - Lifetime
- 2005-06-17 WO PCT/US2005/021585 patent/WO2006009905A1/en not_active Ceased
- 2005-06-17 JP JP2007518142A patent/JP5745736B2/ja not_active Expired - Lifetime
- 2005-06-17 DE DE602005025124T patent/DE602005025124D1/de not_active Expired - Lifetime
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2006
- 2006-12-22 KR KR1020067027071A patent/KR101211490B1/ko not_active Expired - Lifetime
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Also Published As
| Publication number | Publication date |
|---|---|
| TWI294228B (en) | 2008-03-01 |
| EP1766737A1 (en) | 2007-03-28 |
| US20050286598A1 (en) | 2005-12-29 |
| EP1766737A4 (en) | 2008-05-07 |
| JP2015222824A (ja) | 2015-12-10 |
| JP6013566B2 (ja) | 2016-10-25 |
| US7154928B2 (en) | 2006-12-26 |
| KR20070028447A (ko) | 2007-03-12 |
| JP2013214772A (ja) | 2013-10-17 |
| JP2008504684A (ja) | 2008-02-14 |
| TW200601732A (en) | 2006-01-01 |
| DE602005025124D1 (de) | 2011-01-13 |
| EP1766737B1 (en) | 2010-12-01 |
| WO2006009905A1 (en) | 2006-01-26 |
| JP5745736B2 (ja) | 2015-07-08 |
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