KR101142744B1 - 회로 기판 검사 방법 및 회로 기판 검사 장치 - Google Patents

회로 기판 검사 방법 및 회로 기판 검사 장치 Download PDF

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Publication number
KR101142744B1
KR101142744B1 KR1020100071835A KR20100071835A KR101142744B1 KR 101142744 B1 KR101142744 B1 KR 101142744B1 KR 1020100071835 A KR1020100071835 A KR 1020100071835A KR 20100071835 A KR20100071835 A KR 20100071835A KR 101142744 B1 KR101142744 B1 KR 101142744B1
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KR
South Korea
Prior art keywords
terminal
integrated circuit
power supply
circuit board
voltage
Prior art date
Application number
KR1020100071835A
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English (en)
Korean (ko)
Other versions
KR20110011567A (ko
Inventor
가즈히로 반
Original Assignee
히오끼 덴끼 가부시끼가이샤
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Application filed by 히오끼 덴끼 가부시끼가이샤 filed Critical 히오끼 덴끼 가부시끼가이샤
Publication of KR20110011567A publication Critical patent/KR20110011567A/ko
Application granted granted Critical
Publication of KR101142744B1 publication Critical patent/KR101142744B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G01R31/306—Contactless testing using electron beams of printed or hybrid circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020100071835A 2009-07-27 2010-07-26 회로 기판 검사 방법 및 회로 기판 검사 장치 KR101142744B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009174230A JP2011027578A (ja) 2009-07-27 2009-07-27 回路基板検査方法および回路基板検査装置
JPJP-P-2009-174230 2009-07-27

Publications (2)

Publication Number Publication Date
KR20110011567A KR20110011567A (ko) 2011-02-08
KR101142744B1 true KR101142744B1 (ko) 2012-05-04

Family

ID=43636494

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020100071835A KR101142744B1 (ko) 2009-07-27 2010-07-26 회로 기판 검사 방법 및 회로 기판 검사 장치

Country Status (2)

Country Link
JP (1) JP2011027578A (ja)
KR (1) KR101142744B1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021134384A1 (zh) * 2019-12-31 2021-07-08 视航机器人（佛山）有限公司 应用于无人叉车的主板测试装置、系统及方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004279270A (ja) 2003-03-17 2004-10-07 Nidec-Read Corp 抵抗測定装置、基板検査装置および基板検査方法
KR20050078205A (ko) * 2004-01-30 2005-08-04 니혼덴산리드가부시키가이샤 기판검사 장치 및 기판검사 방법
JP2009002893A (ja) * 2007-06-25 2009-01-08 Hioki Ee Corp 回路基板検査方法および回路基板検査装置
KR20090027610A (ko) * 2006-06-20 2009-03-17 니혼덴산리드가부시키가이샤 기판 검사 장치 및 기판 검사 방법

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05341006A (ja) * 1992-06-09 1993-12-24 Mitsubishi Electric Corp プリント回路板診断装置
JPH08334541A (ja) * 1995-06-05 1996-12-17 Mitsubishi Electric Corp 電流検出器及びそれを利用したプリント板配線の接触部検出方法
JPH11242064A (ja) * 1998-02-25 1999-09-07 Fuji Photo Film Co Ltd 実装基板検査装置
JP2002323546A (ja) * 2001-04-25 2002-11-08 Hitachi Ltd リーク電流試験方法及び半導体集積回路
JP2007285902A (ja) * 2006-04-18 2007-11-01 Univ Of Tokushima 論理回路の断線故障の検査装置
JP2008122338A (ja) * 2006-11-15 2008-05-29 Univ Of Tokushima 電子回路の配線故障検査法とその検査容易化回路

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004279270A (ja) 2003-03-17 2004-10-07 Nidec-Read Corp 抵抗測定装置、基板検査装置および基板検査方法
KR20050078205A (ko) * 2004-01-30 2005-08-04 니혼덴산리드가부시키가이샤 기판검사 장치 및 기판검사 방법
KR20090027610A (ko) * 2006-06-20 2009-03-17 니혼덴산리드가부시키가이샤 기판 검사 장치 및 기판 검사 방법
JP2009002893A (ja) * 2007-06-25 2009-01-08 Hioki Ee Corp 回路基板検査方法および回路基板検査装置

Also Published As

Publication number Publication date
JP2011027578A (ja) 2011-02-10
KR20110011567A (ko) 2011-02-08

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