KR101071368B1 - 클리닝장치 및 클리닝방법 - Google Patents

클리닝장치 및 클리닝방법 Download PDF

Info

Publication number
KR101071368B1
KR101071368B1 KR1020080095364A KR20080095364A KR101071368B1 KR 101071368 B1 KR101071368 B1 KR 101071368B1 KR 1020080095364 A KR1020080095364 A KR 1020080095364A KR 20080095364 A KR20080095364 A KR 20080095364A KR 101071368 B1 KR101071368 B1 KR 101071368B1
Authority
KR
South Korea
Prior art keywords
pressure
adhesive sheet
cleaning
sheet
sensitive adhesive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020080095364A
Other languages
English (en)
Korean (ko)
Other versions
KR20100024872A (ko
Inventor
가즈유키 이케나가
츠토무 데츠카
무네오 후루세
Original Assignee
가부시키가이샤 히다치 하이테크놀로지즈
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 히다치 하이테크놀로지즈 filed Critical 가부시키가이샤 히다치 하이테크놀로지즈
Publication of KR20100024872A publication Critical patent/KR20100024872A/ko
Application granted granted Critical
Publication of KR101071368B1 publication Critical patent/KR101071368B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4407Cleaning of reactor or reactor parts by using wet or mechanical methods
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0428Apparatus for mechanical treatment or grinding or cutting

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Cleaning In General (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Drying Of Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
KR1020080095364A 2008-08-26 2008-09-29 클리닝장치 및 클리닝방법 Active KR101071368B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2008-00216343 2008-08-26
JP2008216343A JP5038259B2 (ja) 2008-08-26 2008-08-26 クリーニング装置およびクリーニング方法

Publications (2)

Publication Number Publication Date
KR20100024872A KR20100024872A (ko) 2010-03-08
KR101071368B1 true KR101071368B1 (ko) 2011-10-07

Family

ID=41723171

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020080095364A Active KR101071368B1 (ko) 2008-08-26 2008-09-29 클리닝장치 및 클리닝방법

Country Status (4)

Country Link
US (2) US8006340B2 (https=)
JP (1) JP5038259B2 (https=)
KR (1) KR101071368B1 (https=)
TW (1) TWI409110B (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9289520B2 (en) 2014-02-27 2016-03-22 Kimberly-Clark Worldwide, Inc. Method and system to clean microorganisms without chemicals
DE102014109349A1 (de) * 2014-07-04 2016-01-21 Aixtron Se Vorrichtung zum Reinigen einer Gasaustrittsfläche eines Gaseinlassorgans eines CVD-Reaktors
JP6812264B2 (ja) * 2017-02-16 2021-01-13 東京エレクトロン株式会社 真空処理装置、及びメンテナンス装置
WO2019219163A1 (en) * 2018-05-14 2019-11-21 Applied Materials, Inc. Cleaning device for attracting particles in a substrate processing system, processing system for processing a substrate, and method of operation of a cleaning device
CN108937745B (zh) * 2018-07-25 2021-01-01 来斯奥集成家居股份有限公司 一种用于瓷砖地板的贴纸用水清除机构
WO2021086691A1 (en) * 2019-11-01 2021-05-06 Lam Research Corporation Systems and methods for cleaning a showerhead
CN111822420B (zh) * 2020-07-15 2022-06-24 郑州龙华机电工程有限公司 一种基于物联网的电力设备检修系统
CN114308907B (zh) * 2022-02-23 2023-11-28 深圳市震华等离子体智造有限公司 一种用于精密分析仪器的等离子清洗装置
JP1783959S (ja) 2023-11-01 2024-11-07 ウェブ搬送用ガイド部材

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10147037A (ja) 1996-11-15 1998-06-02 Ricoh Co Ltd クリーニングシート
JP2002192084A (ja) 2000-12-27 2002-07-10 Nitto Denko Corp クリーニングシ―ト、及びこれを用いた基板処理装置のクリーニング方法
KR100786437B1 (ko) 2000-06-06 2007-12-17 닛토덴코 가부시키가이샤 클리닝 시트, 이를 사용하는 반송 부재, 및 이들을 사용한 기판 처리 장치의 클리닝 방법

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3201904A (en) * 1961-11-09 1965-08-24 Corning Glass Works Apparatus for finishing glass surfaces
US3654654A (en) * 1969-11-14 1972-04-11 Xerox Corp Cleaning apparatus
US4313284A (en) * 1980-03-27 1982-02-02 Monsanto Company Apparatus for improving flatness of polished wafers
JP3313505B2 (ja) * 1994-04-14 2002-08-12 株式会社日立製作所 研磨加工法
US5671476A (en) * 1995-02-02 1997-09-23 Mita Industrial Co., Ltd. Image forming machine with cleaning drum brush driven by rotating drum
US5908530A (en) * 1995-05-18 1999-06-01 Obsidian, Inc. Apparatus for chemical mechanical polishing
JP3561070B2 (ja) * 1996-02-01 2004-09-02 彰 水野 除塵方法及び除塵シ−ト
JP4427826B2 (ja) * 1997-01-24 2010-03-10 日東電工株式会社 除塵方法
US6769969B1 (en) * 1997-03-06 2004-08-03 Keltech Engineering, Inc. Raised island abrasive, method of use and lapping apparatus
US6149506A (en) * 1998-10-07 2000-11-21 Keltech Engineering Lapping apparatus and method for high speed lapping with a rotatable abrasive platen
JPH10321604A (ja) * 1997-05-22 1998-12-04 Nec Kyushu Ltd プラズマ処理装置
US5931719A (en) * 1997-08-25 1999-08-03 Lsi Logic Corporation Method and apparatus for using pressure differentials through a polishing pad to improve performance in chemical mechanical polishing
JP2000021832A (ja) 1998-07-03 2000-01-21 Asahi Sunac Corp ワーク洗浄方法及び装置
US6439967B2 (en) * 1998-09-01 2002-08-27 Micron Technology, Inc. Microelectronic substrate assembly planarizing machines and methods of mechanical and chemical-mechanical planarization of microelectronic substrate assemblies
US6227955B1 (en) * 1999-04-20 2001-05-08 Micron Technology, Inc. Carrier heads, planarizing machines and methods for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies
JP4718667B2 (ja) * 1999-11-09 2011-07-06 日東電工株式会社 クリーニングシ―ト
US6848970B2 (en) * 2002-09-16 2005-02-01 Applied Materials, Inc. Process control in electrochemically assisted planarization
US7066800B2 (en) * 2000-02-17 2006-06-27 Applied Materials Inc. Conductive polishing article for electrochemical mechanical polishing
US6962524B2 (en) * 2000-02-17 2005-11-08 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US6991526B2 (en) * 2002-09-16 2006-01-31 Applied Materials, Inc. Control of removal profile in electrochemically assisted CMP
US6979248B2 (en) * 2002-05-07 2005-12-27 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US6991528B2 (en) * 2000-02-17 2006-01-31 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US20040020789A1 (en) * 2000-02-17 2004-02-05 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7141146B2 (en) * 2000-02-23 2006-11-28 Asm Nutool, Inc. Means to improve center to edge uniformity of electrochemical mechanical processing of workpiece surface
US6581276B2 (en) * 2000-04-04 2003-06-24 Amerasia International Technology, Inc. Fine-pitch flexible connector, and method for making same
US7520800B2 (en) * 2003-04-16 2009-04-21 Duescher Wayne O Raised island abrasive, lapping apparatus and method of use
JP2004520705A (ja) * 2000-11-21 2004-07-08 エムイーエムシー・エレクトロニック・マテリアルズ・ソシエタ・ペル・アチオニ 半導体ウエハ、研磨装置及び方法
US20040192172A1 (en) * 2001-06-14 2004-09-30 Dan Towery Oxidizing polishing slurries for low dielectric constant materials
US6776693B2 (en) * 2001-12-19 2004-08-17 Applied Materials Inc. Method and apparatus for face-up substrate polishing
JP2004082038A (ja) 2002-08-28 2004-03-18 Seiko Epson Corp 超音波洗浄方法、超音波洗浄装置および、超音波洗浄ノズルのノズル部の製造方法
US7289759B2 (en) * 2004-08-27 2007-10-30 Canon Kabushiki Kaisha Cleaning apparatus
WO2006082903A1 (ja) * 2005-02-04 2006-08-10 Denki Kagaku Kogyo Kabushiki Kaisha 樹脂組成物及びそれを用いた硬化物ならびにシート
JP2007019443A (ja) * 2005-07-06 2007-01-25 Creative Technology:Kk 導電性ウエハ
TWI420579B (zh) * 2005-07-12 2013-12-21 創意科技股份有限公司 And a foreign matter removing method for a substrate
JP4817293B2 (ja) 2005-10-26 2011-11-16 旭サナック株式会社 ワーク洗浄方法及びワーク洗浄システム
JP2007277631A (ja) * 2006-04-06 2007-10-25 Konica Minolta Holdings Inc ガスバリア性薄膜積層体の製造方法、ガスバリア性薄膜積層体、ガスバリア性樹脂基材及び有機エレクトロルミネッセンスデバイス
US7880371B2 (en) * 2006-11-03 2011-02-01 Danfoss A/S Dielectric composite and a method of manufacturing a dielectric composite
JP2008141049A (ja) 2006-12-04 2008-06-19 Sharp Corp 洗浄装置および洗浄方法
JP2008172038A (ja) * 2007-01-12 2008-07-24 Hitachi High-Technologies Corp プラズマ処理装置およびプラズマ処理方法
US20080176018A1 (en) * 2007-01-20 2008-07-24 Enniss James P Film having an electrically conductive coating

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10147037A (ja) 1996-11-15 1998-06-02 Ricoh Co Ltd クリーニングシート
KR100786437B1 (ko) 2000-06-06 2007-12-17 닛토덴코 가부시키가이샤 클리닝 시트, 이를 사용하는 반송 부재, 및 이들을 사용한 기판 처리 장치의 클리닝 방법
JP2002192084A (ja) 2000-12-27 2002-07-10 Nitto Denko Corp クリーニングシ―ト、及びこれを用いた基板処理装置のクリーニング方法

Also Published As

Publication number Publication date
US8006340B2 (en) 2011-08-30
KR20100024872A (ko) 2010-03-08
US20100050349A1 (en) 2010-03-04
US20100294315A1 (en) 2010-11-25
JP5038259B2 (ja) 2012-10-03
TWI409110B (zh) 2013-09-21
TW201008670A (en) 2010-03-01
JP2010056113A (ja) 2010-03-11
US8024831B2 (en) 2011-09-27

Similar Documents

Publication Publication Date Title
KR101071368B1 (ko) 클리닝장치 및 클리닝방법
JP5059450B2 (ja) 基板載置台及び基板処理装置
CN100543960C (zh) 载置装置、等离子体处理装置和等离子体处理方法
KR101467599B1 (ko) 본딩된 실리콘 전극의 세정
CN102376617B (zh) 基板载置台、在基板载置面形成树脂突起物层的方法以及树脂突起物层复制部件
JP2009117440A (ja) クリーニングウエハ
JP5390657B2 (ja) 基板載置台及び基板処理装置
US11864464B2 (en) Method for polarizing piezoelectric film
KR20170013942A (ko) 물체를 세정하기 위한 시스템 및 방법
JP2004266089A (ja) 清掃装置および清掃方法
KR101446721B1 (ko) 연마용 블록에 웨이퍼를 마운팅하는 방법
JP7569932B2 (ja) 電界放出カソード装置をクリーニングするための方法およびシステム
KR200397550Y1 (ko) 기판 지지대 세정기
JP4117338B1 (ja) 真空貼り合わせ装置及び真空貼り合わせ方法
JP3022290B2 (ja) 液晶表示パネルの製法およびそれに用いる装置
KR20070000003A (ko) 정전척 제조방법
JP2004041977A (ja) 半導体製造装置用粘着シート及び異物除去方法
JP2003129239A (ja) プラズマ処理方法及び装置
CN101346796B (zh) 金属带材的磁控溅射真空抛光的方法和设备
JP2004358338A (ja) 複合導電精密洗浄方法
TW202135985A (zh) 用於拋光系統的維護方法及其相關物件
JP2007160207A (ja) 塗布装置
JP2004097966A (ja) 洗浄処理方法
JP2007287754A (ja) 導電性金属酸化物薄膜の除去方法及び装置
JP2006352033A (ja) 成膜装置および装置

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

FPAY Annual fee payment

Payment date: 20140902

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

FPAY Annual fee payment

Payment date: 20150827

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

FPAY Annual fee payment

Payment date: 20160831

Year of fee payment: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

FPAY Annual fee payment

Payment date: 20170830

Year of fee payment: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

FPAY Annual fee payment

Payment date: 20180920

Year of fee payment: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 12

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 13

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 14

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000