KR101016357B1 - 발광 물질을 함유한 발광 소자 - Google Patents
발광 물질을 함유한 발광 소자 Download PDFInfo
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- KR101016357B1 KR101016357B1 KR1020057014972A KR20057014972A KR101016357B1 KR 101016357 B1 KR101016357 B1 KR 101016357B1 KR 1020057014972 A KR1020057014972 A KR 1020057014972A KR 20057014972 A KR20057014972 A KR 20057014972A KR 101016357 B1 KR101016357 B1 KR 101016357B1
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Luminescent Compositions (AREA)
- Led Device Packages (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
Description
Claims (41)
- 여기 방사선(exciting radiation)을 방출하는 발광 다이오드;상기 발광 다이오드의 적어도 일부분을 커버하는(covering) 다공성 매트릭스; 및상기 다공성 매트릭스에 로딩(loading), 상기 다이오드에서 방출된 여기 방사선과 상호 작용하여 반응 방사선(responsive radiation)을 방출하는 물질을 포함하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항에 있어서,상기 반응 방사선을 방출하는 물질이 형광체(phosphor)인 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제2항에 있어서,상기 형광체는, 상기 다이오드로부터의 여기 방사선에 반응하여 스펙트럼의 가시 영역의 빛을 방출하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항에 있어서,상기 발광 다이오드는, 실리콘 카바이드 기재 및 하나 이상의 제3족 니트라이드(nitride)를 함유하는 활성층을 포함하며;상기 반응 방사선을 방출하는 물질은, 상기 다공성 매트릭스에 로딩되어, 상기 다이오드에서 방출된 여기 방사선과 상호 작용하여 가시 광선을 방출하는 광발광(photoluminescent) 물질을 포함하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항 또는 제4항에 있어서,상기 다이오드는, 자외선, 가시 광선 및 적외선 전자기 스펙트럼으로 이루어지는 군에서 선택되는 주파수의 전자기 방사선을 방출하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항 또는 제4항에 있어서,상기 다공성 매트릭스는, 상기 여기 방사선, 반응 방사선 및 가시 광선을 실질적으로 투과하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항 또는 제4항에 있어서,상기 다공성 매트릭스는, 졸 겔(sol gel) 물질인 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제4항에 있어서,상기 광발광 물질은 형광체인 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항에 있어서,여기 방사선을 방출하며, 실리콘 카바이드 기재 및 하나 이상의 제3족 니트라이드(nitride)를 함유하는 활성층을 포함하는 레이저 다이오드;상기 레이저 다이오드의 적어도 일부분을 커버하는 다공성 매트릭스; 및상기 다공성 매트릭스에 로딩되어, 상기 레이저 다이오드에서 방출된 여기 방사선과 상호 작용하여 반응 방사선을 방출하는 광발광 물질을 포함하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 청구항 10은(는) 설정등록료 납부시 포기되었습니다.제9항에 있어서,상기 레이저 다이오드는 갈륨 니트라이드, 인듐 갈륨 니트라이드, 및 인듐 알루미늄 갈륨 니트라이드로 이루어진 군에서 선택되는 활성층을 가지는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 청구항 11은(는) 설정등록료 납부시 포기되었습니다.제9항에 있어서,상기 다공성 매트릭스는 상기 여기 방사선 및 가시 광선을 실질적으로 투과하는 졸 겔인 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제7항에 있어서,상기 졸 겔이 에어로젤(aerogel) 및 크세로겔(xerogel)로 이루어진 군에서 선택되는 것임을 특징으로 하는 반도체 기재의 발광 소자.
- 청구항 13은(는) 설정등록료 납부시 포기되었습니다.제1항에 있어서,상기 발광 다이오드는 단결정 실리콘 카바이드 기재를 포함하며;상기 다이오드 상의 상기 다공성 매트릭스는 에어로젤 및 크세로겔로 이루어진 군에서 선택되며;상기 반응 방사선을 방출하는 물질은 상기 매트릭스에 로딩된 형광체이며, 상기 다이오드의 발광에 대하여 상이한 파장의 제2 발광으로 반응하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항, 제4항, 제9항 또는 제13항 중 어느 한 항에 있어서,상기 다공성 매트릭스는 상기 다이오드 상에 직접 위치하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항 또는 제13항에 있어서,상기 매트릭스는 50부피% 이상의 다공성을 가지는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항 또는 제13항에 있어서,상기 매트릭스는 90부피% 이상의 다공성을 가지는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 청구항 17은(는) 설정등록료 납부시 포기되었습니다.제13항에 있어서,상기 형광체는, 상기 매트릭스 1cm3당 1mg∼1g 존재하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 청구항 18은(는) 설정등록료 납부시 포기되었습니다.제13항에 있어서,상기 다공성 매트릭스는, 상기 여기 방사선 및 상기 반응 방사선을 실질적으로 투과하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항 또는 제13항에 있어서,상기 다공성 매트릭스는, 실리카 화합물을 포함하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제7항에 있어서,상기 졸 겔 물질은, 밀도가 0.01g/cm3∼1.6g/cm3이며, 세공의 크기 분포가 1nm∼500nm이며, 표면적이 100m2/g 이상인 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제19항에 있어서,상기 실리카 화합물은 메타아크릴옥시프로필트리메톡시실란을 포함하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제2항 또는 제13항에 있어서,상기 형광체는, 상기 매트릭스 내에 0.001미크론 내지 20미크론의 입자의 형태로 존재하는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제8항에 있어서,상기 형광체는, 실리콘, 알루미늄, 붕소, 티타늄, 지르코늄, 바나듐, 이트륨, 마그네슘, 몰리브덴 및 철의 산화물; SiO2, Si(OCH3)4, Si(OC2H5)4, AlOOH, Al(OC4H9)3, B(OC4H9)3, Ti(OC3H7)4, Zr(OC3H7)4, TiO2, 및 ZrO2, YAG, 가넷계(garnet-based) 형광체 및 이들의 혼합물로 이루어진 군에서 선택되는 것임을 특징으로 하는 반도체 기재의 발광 소자.
- 청구항 24은(는) 설정등록료 납부시 포기되었습니다.제1항 또는 제13항에 있어서,상기 다이오드는, 동종 접합체, 단일 이종 접합체 및 이중 이종 접합체로 이루어진 군에서 선택되는 것임을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항 또는 제13항에 있어서,상기 다이오드는, 양자 우물(quantum well), 다중 양자 우물 및 규칙 격자(superlattice) 구조로 이루어진 군에서 선택되는 특성을 가진 것을 특징으로 하는 반도체 기재의 발광 소자.
- 제1항, 제4항 또는 제13항 중 어느 한 항에 있어서,상기 발광 다이오는, 갈륨 니트라이드, 인듐 갈륨 니트라이드, 및 인듐 알루미늄 갈륨 니트라이드로 이루어진 군에서 선택되는 활성층을 가지는 것을 특징으로 하는 반도체 기재의 발광 소자.
- 여기 방사선과 상호 작용하여 반응 방사선을 방출하는 물질을 졸(sol)에 로딩하는 단계;상기 로딩된 졸로 다공성 매트릭스를 형성하는 단계; 및상기 다공성 매트릭스를 여기 방사선의 소스인 발광 다이오드에 인접하게 위치시키는 단계를 포함하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 제27항에 있어서,상기 다공성 매트릭스는 상기 다이오드 상에 직접 위치하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 제27항에 있어서,상기 졸은 실리카 입자를 포함하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 청구항 30은(는) 설정등록료 납부시 포기되었습니다.제27항에 있어서,메타아크릴옥시프로필트리옥시실란을 졸에 로딩하는 단계를 포함하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 청구항 31은(는) 설정등록료 납부시 포기되었습니다.제27항에 있어서,상기 다공성 매트릭스를 형성하는 단계는, 크세로겔 또는 에어로젤을 형성하는 단계를 포함하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 제27항에 있어서,상기 졸을 로딩하는 단계는, 용매로서 알코올을 포함하는 졸을 로딩하는 것을 포함하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 제27항에 있어서,상기 다공성 매트릭스를 발광 소자에 인접하게 위치시키는 단계는, 상기 발광 다이오드 상에, 상기 졸을 몰딩하거나 또는 캐스팅하는 방법으로 행해지는 것을 특징으로 하는 발광 소자의 제조 방법.
- 제27항에 있어서,상기 다공성 매트릭스를 상기 다이오드에 인접하게 위치시키는 단계는, 상기 졸을 상기 발광 다이오드 상에 스핀 코팅하는 방법, 상기 졸을 상기 발광 다이오드 상에 스프레이 코팅하는 방법 및 상기 졸을 상기 발광 다이오드 상에 딥 코팅하는 방법으로 이루어진 군에서 선택되는 방법으로 행해지는 것을 특징으로 하는 발광 소자의 제조 방법.
- 제27항에 있어서,상기 다공성 매트릭스를 형성하는 단계는 초임계 조건(supercritical condition)에서 상기 졸을 건조시키는 단계를 포함하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 제27항에 있어서,형광체를 상기 졸로 로딩하는 단계를 포함하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 청구항 37은(는) 설정등록료 납부시 포기되었습니다.제36항에 있어서,0.001미크론 내지 20미크론의 입자의 형태인 형광체를 상기 졸로 로딩하는 단계를 포함하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 청구항 38은(는) 설정등록료 납부시 포기되었습니다.제36항에 있어서,실리콘, 알루미늄, 붕소, 티타늄, 지르코늄, 바나듐, 이트륨, 마그네슘, 몰리브덴 및 철의 산화물; SiO2, Si(OCH3)4, Si(OC2H5)4, AlOOH, Al(OC4H9)3, B(OC4H9)3, Ti(OC3H7)4, Zr(OC3H7)4, TiO2, 및 ZrO2, YAG, 가넷계 형광체 및 이들의 혼합물로 이루어진 군에서 선택되는 형광체를 상기 졸에 로딩하는 단계를 포함하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 제27항에 있어서,상기 다공성 매트릭스를 발광 다이오드에 인접하게 위치시키는 단계는, 상기 다이오드로부터 이격시켜 상기 다공성 매트릭스를 형성한 후, 상기 다공성 매트릭스를 상기 발광 다이오드에 인접하게 기계적으로 위치시키는 단계를 포함하는 것을 특징으로 하는 발광 소자의 제조 방법.
- 청구항 40은(는) 설정등록료 납부시 포기되었습니다.제13항에 있어서,상기 형광체는, 실리콘, 알루미늄, 붕소, 티타늄, 지르코늄, 바나듐, 이트륨, 마그네슘, 몰리브덴 및 철의 산화물; SiO2, Si(OCH3)4, Si(OC2H5)4, AlOOH, Al(OC4H9)3, B(OC4H9)3, Ti(OC3H7)4, Zr(OC3H7)4, TiO2, 및 ZrO2, YAG, 가넷계(garnet-based) 형광체 및 이들의 혼합물로 이루어진 군에서 선택되는 것임을 특징으로 하는 반도체 기재의 발광 소자.
- 청구항 41은(는) 설정등록료 납부시 포기되었습니다.제11항에 있어서,상기 졸 겔이 에어로젤(aerogel) 및 크세로겔(xerogel)로 이루어진 군에서 선택되는 것임을 특징으로 하는 반도체 기재의 발광 소자.
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KR20050105214A (ko) | 2005-11-03 |
WO2004075308A2 (en) | 2004-09-02 |
US20040214358A1 (en) | 2004-10-28 |
DE602004027001D1 (de) | 2010-06-17 |
CN1748326B (zh) | 2010-09-29 |
ATE467235T1 (de) | 2010-05-15 |
JP2006518111A (ja) | 2006-08-03 |
WO2004075308A3 (en) | 2005-03-10 |
US20040159849A1 (en) | 2004-08-19 |
CA2515647A1 (en) | 2004-09-02 |
JP4791351B2 (ja) | 2011-10-12 |
EP1593165B1 (en) | 2010-05-05 |
CN1748326A (zh) | 2006-03-15 |
EP1593165A2 (en) | 2005-11-09 |
US7042020B2 (en) | 2006-05-09 |
US6967116B2 (en) | 2005-11-22 |
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