KR101011407B1 - 직사각형 서셉터의 비대칭 접지 - Google Patents
직사각형 서셉터의 비대칭 접지 Download PDFInfo
- Publication number
- KR101011407B1 KR101011407B1 KR1020080041957A KR20080041957A KR101011407B1 KR 101011407 B1 KR101011407 B1 KR 101011407B1 KR 1020080041957 A KR1020080041957 A KR 1020080041957A KR 20080041957 A KR20080041957 A KR 20080041957A KR 101011407 B1 KR101011407 B1 KR 101011407B1
- Authority
- KR
- South Korea
- Prior art keywords
- electrode
- chamber
- susceptor
- straps
- ground
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
- C23C16/5096—Flat-bed apparatus
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32568—Relative arrangement or disposition of electrodes; moving means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32577—Electrical connecting means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32697—Electrostatic control
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Plasma Technology (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US91583307P | 2007-05-03 | 2007-05-03 | |
| US60/915,833 | 2007-05-03 | ||
| US11/775,359 | 2007-07-10 | ||
| US11/775,359 US7972470B2 (en) | 2007-05-03 | 2007-07-10 | Asymmetric grounding of rectangular susceptor |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100072406A Division KR101274659B1 (ko) | 2007-05-03 | 2010-07-27 | 직사각형 서셉터의 비대칭 접지 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20080097957A KR20080097957A (ko) | 2008-11-06 |
| KR101011407B1 true KR101011407B1 (ko) | 2011-01-28 |
Family
ID=39939727
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020080041957A Active KR101011407B1 (ko) | 2007-05-03 | 2008-05-06 | 직사각형 서셉터의 비대칭 접지 |
| KR1020100072406A Active KR101274659B1 (ko) | 2007-05-03 | 2010-07-27 | 직사각형 서셉터의 비대칭 접지 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100072406A Active KR101274659B1 (ko) | 2007-05-03 | 2010-07-27 | 직사각형 서셉터의 비대칭 접지 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US7972470B2 (https=) |
| JP (1) | JP5427367B2 (https=) |
| KR (2) | KR101011407B1 (https=) |
| CN (2) | CN101298670B (https=) |
| TW (2) | TWI377638B (https=) |
Families Citing this family (71)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101374583B1 (ko) * | 2007-03-01 | 2014-03-17 | 어플라이드 머티어리얼스, 인코포레이티드 | Rf 셔터 |
| US7972470B2 (en) * | 2007-05-03 | 2011-07-05 | Applied Materials, Inc. | Asymmetric grounding of rectangular susceptor |
| US7988815B2 (en) * | 2007-07-26 | 2011-08-02 | Applied Materials, Inc. | Plasma reactor with reduced electrical skew using electrical bypass elements |
| US8349196B2 (en) * | 2007-12-06 | 2013-01-08 | Intevac, Inc. | System and method for commercial fabrication of patterned media |
| JP5524076B2 (ja) * | 2007-12-25 | 2014-06-18 | アプライド マテリアルズ インコーポレイテッド | プラズマチャンバへrf電力を結合する装置 |
| WO2010044895A2 (en) * | 2008-01-31 | 2010-04-22 | Applied Materials, Inc | Multiple phase rf power for electrode of plasma chamber |
| US20100136261A1 (en) * | 2008-12-03 | 2010-06-03 | Applied Materials, Inc. | Modulation of rf returning straps for uniformity control |
| JP2012510727A (ja) * | 2008-12-03 | 2012-05-10 | アプライド マテリアルズ インコーポレイテッド | 均一性制御のためのrf帰還用ストラップの調整 |
| KR101534024B1 (ko) * | 2008-12-10 | 2015-07-08 | 주성엔지니어링(주) | 기판처리장치 |
| WO2010094002A2 (en) * | 2009-02-13 | 2010-08-19 | Applied Materials, Inc. | Rf bus and rf return bus for plasma chamber electrode |
| US8466697B2 (en) * | 2009-04-28 | 2013-06-18 | Lam Research Corporation | Arrangements for detecting discontinuity of flexible connections for current flow and methods thereof |
| KR101634714B1 (ko) * | 2009-05-13 | 2016-06-30 | 어플라이드 머티어리얼스, 인코포레이티드 | 양극산화처리된 샤워헤드 |
| JP2010287639A (ja) * | 2009-06-10 | 2010-12-24 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| US8360003B2 (en) | 2009-07-13 | 2013-01-29 | Applied Materials, Inc. | Plasma reactor with uniform process rate distribution by improved RF ground return path |
| US9039864B2 (en) * | 2009-09-29 | 2015-05-26 | Applied Materials, Inc. | Off-center ground return for RF-powered showerhead |
| KR101127757B1 (ko) * | 2009-12-02 | 2012-03-23 | 주식회사 테스 | 서셉터 접지유닛, 이를 이용하여 서셉터 접지의 가변방법 및 이를 갖는 공정챔버 |
| JP5782226B2 (ja) | 2010-03-24 | 2015-09-24 | 東京エレクトロン株式会社 | 基板処理装置 |
| WO2011143062A2 (en) * | 2010-05-12 | 2011-11-17 | Applied Materials, Inc. | Confined process volume pecvd chamber |
| JP5375763B2 (ja) * | 2010-07-27 | 2013-12-25 | 三菱電機株式会社 | プラズマ装置およびこれを用いた半導体薄膜の製造方法 |
| CN102810770B (zh) * | 2011-05-31 | 2015-03-04 | 中微半导体设备(上海)有限公司 | 实现等离子体刻蚀腔体与阴极之间电连接的接地器件 |
| JP5824330B2 (ja) * | 2011-11-07 | 2015-11-25 | ルネサスエレクトロニクス株式会社 | 半導体装置及び半導体装置の製造方法 |
| US9083182B2 (en) | 2011-11-21 | 2015-07-14 | Lam Research Corporation | Bypass capacitors for high voltage bias power in the mid frequency RF range |
| US9263240B2 (en) | 2011-11-22 | 2016-02-16 | Lam Research Corporation | Dual zone temperature control of upper electrodes |
| US9396908B2 (en) | 2011-11-22 | 2016-07-19 | Lam Research Corporation | Systems and methods for controlling a plasma edge region |
| US8898889B2 (en) | 2011-11-22 | 2014-12-02 | Lam Research Corporation | Chuck assembly for plasma processing |
| US10586686B2 (en) | 2011-11-22 | 2020-03-10 | Law Research Corporation | Peripheral RF feed and symmetric RF return for symmetric RF delivery |
| KR101971312B1 (ko) * | 2011-11-23 | 2019-04-22 | 램 리써치 코포레이션 | 다중 존 가스 주입 상부 전극 시스템 |
| KR102011535B1 (ko) * | 2011-11-24 | 2019-08-16 | 램 리써치 코포레이션 | 가요성 있는 대칭적 rf 복귀 스트랩을 갖는 플라즈마 프로세싱 챔버 |
| CN102543641B (zh) * | 2012-01-20 | 2015-07-08 | 中微半导体设备(上海)有限公司 | 实现等离子体刻蚀腔体弹性接触的连接器件 |
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| CN104508180A (zh) * | 2012-07-27 | 2015-04-08 | 应用材料公司 | 粗糙化的基板支撑件 |
| KR102017744B1 (ko) | 2012-12-12 | 2019-10-15 | 삼성디스플레이 주식회사 | 증착 장치, 이를 이용한 박막 형성 방법 및 유기 발광 표시 장치 제조 방법 |
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| TW201629264A (zh) | 2015-01-22 | 2016-08-16 | 應用材料股份有限公司 | 用於間隙偵測的智能止動器及控制機制 |
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| JP6802191B2 (ja) | 2015-06-05 | 2020-12-16 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | サセプタの位置付け及び回転装置、並びに使用の方法 |
| TWI723024B (zh) | 2015-06-26 | 2021-04-01 | 美商應用材料股份有限公司 | 用於改良的氣體分配的遞迴注入設備 |
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| CN112447475B (zh) * | 2019-09-05 | 2023-09-29 | 中微半导体设备(上海)股份有限公司 | 一种具有柔性电介质薄片的等离子体处理装置 |
| JP7401279B2 (ja) | 2019-12-06 | 2023-12-19 | 株式会社アドバンテック | 対象物を加熱及び冷却するためのステージ |
| JP7413099B2 (ja) * | 2020-03-16 | 2024-01-15 | 東京エレクトロン株式会社 | 成膜方法および成膜装置 |
| US11443921B2 (en) * | 2020-06-11 | 2022-09-13 | Applied Materials, Inc. | Radio frequency ground system and method |
| KR20220031849A (ko) * | 2020-09-04 | 2022-03-14 | 삼성디스플레이 주식회사 | 증착 장치 |
| CN114203506B (zh) * | 2020-09-18 | 2024-03-12 | 中微半导体设备(上海)股份有限公司 | 一种等离子体处理装置及其方法 |
| CN114678247B (zh) * | 2020-12-24 | 2025-09-09 | 中微半导体设备(上海)股份有限公司 | 一种接地环及其调节方法及等离子体处理装置 |
| JP7458337B2 (ja) | 2021-02-09 | 2024-03-29 | 株式会社アドバンテック | 対象物を加熱及び冷却するためのステージ |
| JP7560214B2 (ja) * | 2021-03-11 | 2024-10-02 | 東京エレクトロン株式会社 | 着火方法及びプラズマ処理装置 |
| KR102846682B1 (ko) * | 2021-04-01 | 2025-08-13 | 어플라이드 머티어리얼스, 인코포레이티드 | 플라즈마를 이용한 박막 형성을 위한 접지 리턴 |
| US12378669B2 (en) | 2022-01-28 | 2025-08-05 | Applied Materials, Inc. | Ground return for thin film formation using plasma |
| TWI817606B (zh) * | 2022-07-13 | 2023-10-01 | 友威科技股份有限公司 | 雙電極連續式電漿製程系統 |
| USD1080812S1 (en) | 2022-08-29 | 2025-06-24 | Applied Materials, Inc. | Gas mixer |
| JP2024100302A (ja) * | 2023-01-16 | 2024-07-26 | キオクシア株式会社 | プラズマcvd(化学気相成長)装置及び成膜方法 |
| CN120824211A (zh) * | 2024-04-09 | 2025-10-21 | 中微半导体设备(广州)有限公司 | 半导体处理设备及其工作方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20010102930A (ko) * | 2000-05-03 | 2001-11-17 | 조셉 제이. 스위니 | 캐쏘드에서 접지형 축전기를 가지는 다중 주파수 플라즈마챔버 |
| JP2002129318A (ja) | 2000-07-10 | 2002-05-09 | Applied Materials Inc | マグネトロンスパッタ反応器のバイアスをかけたシールド |
| KR20060051437A (ko) * | 2004-09-21 | 2006-05-19 | 어플라이드 머티어리얼스, 인코포레이티드 | 프로세스 챔버 내에서 캐소드의 rf 접지 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US602404A (en) * | 1898-04-12 | John mueller | ||
| JPH08306670A (ja) | 1995-05-09 | 1996-11-22 | Sony Corp | プラズマアッシング装置 |
| JPH1079350A (ja) * | 1996-09-04 | 1998-03-24 | Kokusai Electric Co Ltd | プラズマ処理装置 |
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2007
- 2007-07-10 US US11/775,359 patent/US7972470B2/en active Active
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- 2008-04-30 CN CN2008100944949A patent/CN101298670B/zh active Active
- 2008-04-30 CN CN2010102514389A patent/CN101906621B/zh active Active
- 2008-05-01 TW TW097116076A patent/TWI377638B/zh not_active IP Right Cessation
- 2008-05-01 TW TW099112068A patent/TWI376763B/zh not_active IP Right Cessation
- 2008-05-02 JP JP2008120346A patent/JP5427367B2/ja active Active
- 2008-05-06 KR KR1020080041957A patent/KR101011407B1/ko active Active
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- 2010-07-27 KR KR1020100072406A patent/KR101274659B1/ko active Active
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| KR20010102930A (ko) * | 2000-05-03 | 2001-11-17 | 조셉 제이. 스위니 | 캐쏘드에서 접지형 축전기를 가지는 다중 주파수 플라즈마챔버 |
| JP2002129318A (ja) | 2000-07-10 | 2002-05-09 | Applied Materials Inc | マグネトロンスパッタ反応器のバイアスをかけたシールド |
| KR20060051437A (ko) * | 2004-09-21 | 2006-05-19 | 어플라이드 머티어리얼스, 인코포레이티드 | 프로세스 챔버 내에서 캐소드의 rf 접지 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI376763B (en) | 2012-11-11 |
| TW200910497A (en) | 2009-03-01 |
| TWI377638B (en) | 2012-11-21 |
| KR20080097957A (ko) | 2008-11-06 |
| CN101906621A (zh) | 2010-12-08 |
| JP5427367B2 (ja) | 2014-02-26 |
| CN101298670B (zh) | 2012-02-01 |
| KR20100090675A (ko) | 2010-08-16 |
| KR101274659B1 (ko) | 2013-06-17 |
| US8877301B2 (en) | 2014-11-04 |
| CN101906621B (zh) | 2012-10-31 |
| US20080274297A1 (en) | 2008-11-06 |
| US7972470B2 (en) | 2011-07-05 |
| JP2008274437A (ja) | 2008-11-13 |
| TW201042724A (en) | 2010-12-01 |
| US20110236599A1 (en) | 2011-09-29 |
| CN101298670A (zh) | 2008-11-05 |
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