KR100876729B1 - 촬상 장치 - Google Patents

촬상 장치 Download PDF

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Publication number
KR100876729B1
KR100876729B1 KR1020047009520A KR20047009520A KR100876729B1 KR 100876729 B1 KR100876729 B1 KR 100876729B1 KR 1020047009520 A KR1020047009520 A KR 1020047009520A KR 20047009520 A KR20047009520 A KR 20047009520A KR 100876729 B1 KR100876729 B1 KR 100876729B1
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KR
South Korea
Prior art keywords
output
light sensitive
light
photosensitive
luminance profile
Prior art date
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Expired - Fee Related
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KR1020047009520A
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English (en)
Korean (ko)
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KR20040065291A (ko
Inventor
수지야마유키노부
토요다하루요시
무코자카나오히사
Original Assignee
하마마츠 포토닉스 가부시키가이샤
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Publication of KR20040065291A publication Critical patent/KR20040065291A/ko
Application granted granted Critical
Publication of KR100876729B1 publication Critical patent/KR100876729B1/ko
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70Circuitry for compensating brightness variation in the scene
    • H04N23/71Circuitry for evaluating the brightness variation
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/47Image sensors with pixel address output; Event-driven image sensors; Selection of pixels to be read out based on image data
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/702SSIS architectures characterised by non-identical, non-equidistant or non-planar pixel layout
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Studio Devices (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
KR1020047009520A 2001-12-21 2002-12-10 촬상 장치 Expired - Fee Related KR100876729B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2001389567A JP3965049B2 (ja) 2001-12-21 2001-12-21 撮像装置
JPJP-P-2001-00389567 2001-12-21
PCT/JP2002/012887 WO2003055201A1 (en) 2001-12-21 2002-12-10 Imaging device

Publications (2)

Publication Number Publication Date
KR20040065291A KR20040065291A (ko) 2004-07-21
KR100876729B1 true KR100876729B1 (ko) 2008-12-31

Family

ID=19188273

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020047009520A Expired - Fee Related KR100876729B1 (ko) 2001-12-21 2002-12-10 촬상 장치

Country Status (8)

Country Link
US (1) US7245317B2 (enExample)
EP (1) EP1460839A4 (enExample)
JP (1) JP3965049B2 (enExample)
KR (1) KR100876729B1 (enExample)
CN (1) CN100512392C (enExample)
AU (1) AU2002354122A1 (enExample)
TW (1) TWI248215B (enExample)
WO (1) WO2003055201A1 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004065899A1 (ja) * 2003-01-22 2004-08-05 Hamamatsu Photonics K.K. 光検出装置
JP2004264332A (ja) * 2003-01-24 2004-09-24 Hamamatsu Photonics Kk 多重画像形成位置ずれ検出装置、画像濃度検出装置及び多重画像形成装置
JP2004264034A (ja) * 2003-01-24 2004-09-24 Hamamatsu Photonics Kk 光検出装置
JP4099413B2 (ja) 2003-03-20 2008-06-11 浜松ホトニクス株式会社 光検出装置
JP2004289709A (ja) * 2003-03-25 2004-10-14 Toshiba Corp 撮像装置、撮像方法
JP2005218052A (ja) * 2004-02-02 2005-08-11 Hamamatsu Photonics Kk 光検出装置
JP4391315B2 (ja) 2004-05-10 2009-12-24 浜松ホトニクス株式会社 撮像システムおよび撮像方法
JP4920178B2 (ja) 2004-06-24 2012-04-18 浜松ホトニクス株式会社 歪み検出システムおよび歪み検出方法
JP4536540B2 (ja) 2005-02-03 2010-09-01 浜松ホトニクス株式会社 固体撮像装置
JP4503481B2 (ja) * 2005-04-05 2010-07-14 浜松ホトニクス株式会社 固体撮像装置
EP1713258B1 (en) * 2005-04-11 2012-11-07 Canon Kabushiki Kaisha Focus detection
US7282685B2 (en) * 2005-04-14 2007-10-16 Micron Technology, Inc. Multi-point correlated sampling for image sensors
JP2006311307A (ja) * 2005-04-28 2006-11-09 Hamamatsu Photonics Kk 固体撮像装置
JP4696877B2 (ja) * 2005-11-29 2011-06-08 ヤマハ株式会社 固体撮像装置
AT504582B1 (de) * 2006-11-23 2008-12-15 Arc Austrian Res Centers Gmbh Verfahren zur generierung eines bildes in elektronischer form, bildelement für einen bildsensor zur generierung eines bildes sowie bildsensor
JP4922776B2 (ja) * 2007-01-30 2012-04-25 富士フイルム株式会社 撮像装置、撮像方法
CN104243843B (zh) 2014-09-30 2017-11-03 北京智谷睿拓技术服务有限公司 拍摄光照补偿方法、补偿装置及用户设备
JP7060413B2 (ja) 2018-03-08 2022-04-26 浜松ホトニクス株式会社 光検出装置及び光検出方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5886343A (en) 1993-05-28 1999-03-23 Canon Kabushiki Kaisha Image sensor comprising a two-dimensional array of storing elements with both row and column parallel output circuitry
US6091449A (en) 1995-08-11 2000-07-18 Kabushiki Kaisha Toshiba MOS-type solid-state imaging apparatus

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04151129A (ja) 1990-04-20 1992-05-25 Olympus Optical Co Ltd 追尾装置を有するカメラの測光装置
JP2974809B2 (ja) 1991-03-05 1999-11-10 オリンパス光学工業株式会社 固体撮像装置
JPH065832A (ja) 1992-06-19 1994-01-14 Fujitsu Ltd 位置検出装置および位置検出方法
US5406070A (en) 1993-12-16 1995-04-11 International Business Machines Corporation Method and apparatus for scanning an object and correcting image data using concurrently generated illumination data
JP2731115B2 (ja) 1994-07-14 1998-03-25 シャープ株式会社 分割型受光素子
KR960028217A (ko) * 1994-12-22 1996-07-22 엘리 웨이스 움직임 검출 카메라 시스템 및 방법
JPH08292998A (ja) 1995-04-20 1996-11-05 Mitsubishi Electric Corp 画像検出装置及び画像検出方法
KR100279295B1 (ko) * 1998-06-02 2001-02-01 윤종용 액티브 픽셀 센서
US6956605B1 (en) 1998-08-05 2005-10-18 Canon Kabushiki Kaisha Image pickup apparatus
DE69923159T2 (de) 1998-10-30 2005-12-22 Hamamatsu Photonics K.K., Hamamatsu Festkörperbildmatrix
WO2000045592A1 (en) 1999-01-29 2000-08-03 Hamamatsu Photonics K.K. Photodetector device
JP3449468B2 (ja) 1999-05-06 2003-09-22 日本電気株式会社 固体撮像装置およびその駆動方法
US6867806B1 (en) * 1999-11-04 2005-03-15 Taiwan Advanced Sensors Corporation Interlace overlap pixel design for high sensitivity CMOS image sensors
JP4424796B2 (ja) * 1999-11-18 2010-03-03 浜松ホトニクス株式会社 光検出装置
EP1102323B1 (en) * 1999-11-19 2012-08-15 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Method for detecting electromagnetic radiation using an optoelectronic sensor
JP2001177144A (ja) * 1999-12-20 2001-06-29 Hamamatsu Photonics Kk 光位置検出装置
JP4500434B2 (ja) * 2000-11-28 2010-07-14 キヤノン株式会社 撮像装置及び撮像システム、並びに撮像方法
JP2003204488A (ja) 2001-10-30 2003-07-18 Mitsubishi Electric Corp 撮像装置および撮像装置を具備する携帯端末
WO2003049190A1 (fr) * 2001-12-05 2003-06-12 Hamamatsu Photonics K.K. Dispositif de detection de lumiere, dispositif de formation d'images et dispositif d'acquisition d'images a distance
US7030356B2 (en) * 2001-12-14 2006-04-18 California Institute Of Technology CMOS imager for pointing and tracking applications
FR2839363B1 (fr) * 2002-05-06 2004-07-16 Mbdam Procede pour extraire une zone illuminee d'une matrice de photocapteurs d'un dispositif de detection lumineuse et dispositif de detection lumineuse mettant en oeuvre ce procede
US6891143B2 (en) * 2002-10-30 2005-05-10 Microsoft Corporation Photo-sensor array with pixel-level signal comparison
WO2004065899A1 (ja) * 2003-01-22 2004-08-05 Hamamatsu Photonics K.K. 光検出装置
JP2004264034A (ja) * 2003-01-24 2004-09-24 Hamamatsu Photonics Kk 光検出装置
JP4099413B2 (ja) * 2003-03-20 2008-06-11 浜松ホトニクス株式会社 光検出装置
JP2006523074A (ja) * 2003-04-11 2006-10-05 カネスタ インコーポレイテッド センサのダイナミックレンジを差分拡大する方法及びシステム
JP4277984B2 (ja) 2003-06-04 2009-06-10 横浜ゴム株式会社 空気入りタイヤ及びその解体方法
US7105793B2 (en) * 2003-07-02 2006-09-12 Micron Technology, Inc. CMOS pixels for ALC and CDS and methods of forming the same
US7081608B2 (en) * 2003-10-15 2006-07-25 Micron Technology, Inc. Pixel with differential readout

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5886343A (en) 1993-05-28 1999-03-23 Canon Kabushiki Kaisha Image sensor comprising a two-dimensional array of storing elements with both row and column parallel output circuitry
US6091449A (en) 1995-08-11 2000-07-18 Kabushiki Kaisha Toshiba MOS-type solid-state imaging apparatus

Also Published As

Publication number Publication date
CN1605189A (zh) 2005-04-06
JP3965049B2 (ja) 2007-08-22
EP1460839A1 (en) 2004-09-22
US7245317B2 (en) 2007-07-17
CN100512392C (zh) 2009-07-08
US20050041124A1 (en) 2005-02-24
TW200301569A (en) 2003-07-01
JP2003189181A (ja) 2003-07-04
TWI248215B (en) 2006-01-21
AU2002354122A1 (en) 2003-07-09
EP1460839A4 (en) 2006-03-15
WO2003055201A1 (en) 2003-07-03
KR20040065291A (ko) 2004-07-21

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