TWI248215B - Photographing device - Google Patents

Photographing device Download PDF

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Publication number
TWI248215B
TWI248215B TW091136492A TW91136492A TWI248215B TW I248215 B TWI248215 B TW I248215B TW 091136492 A TW091136492 A TW 091136492A TW 91136492 A TW91136492 A TW 91136492A TW I248215 B TWI248215 B TW I248215B
Authority
TW
Taiwan
Prior art keywords
light
output
light sensing
sensing portion
pixels
Prior art date
Application number
TW091136492A
Other languages
English (en)
Chinese (zh)
Other versions
TW200301569A (en
Inventor
Yukinobu Sugiyama
Haruyoshi Toyoda
Naohisa Mukozaka
Original Assignee
Hamamatsu Photonics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics Kk filed Critical Hamamatsu Photonics Kk
Publication of TW200301569A publication Critical patent/TW200301569A/zh
Application granted granted Critical
Publication of TWI248215B publication Critical patent/TWI248215B/zh

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/71—Circuitry for evaluating the brightness variation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/47—Image sensors with pixel address output; Event-driven image sensors; Selection of pixels to be read out based on image data
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/702—SSIS architectures characterised by non-identical, non-equidistant or non-planar pixel layout
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Studio Devices (AREA)
  • Image Analysis (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
TW091136492A 2001-12-21 2002-12-18 Photographing device TWI248215B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001389567A JP3965049B2 (ja) 2001-12-21 2001-12-21 撮像装置

Publications (2)

Publication Number Publication Date
TW200301569A TW200301569A (en) 2003-07-01
TWI248215B true TWI248215B (en) 2006-01-21

Family

ID=19188273

Family Applications (1)

Application Number Title Priority Date Filing Date
TW091136492A TWI248215B (en) 2001-12-21 2002-12-18 Photographing device

Country Status (8)

Country Link
US (1) US7245317B2 (enExample)
EP (1) EP1460839A4 (enExample)
JP (1) JP3965049B2 (enExample)
KR (1) KR100876729B1 (enExample)
CN (1) CN100512392C (enExample)
AU (1) AU2002354122A1 (enExample)
TW (1) TWI248215B (enExample)
WO (1) WO2003055201A1 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100379009C (zh) * 2003-01-22 2008-04-02 浜松光子学株式会社 光检测装置
JP2004264332A (ja) * 2003-01-24 2004-09-24 Hamamatsu Photonics Kk 多重画像形成位置ずれ検出装置、画像濃度検出装置及び多重画像形成装置
JP2004264034A (ja) * 2003-01-24 2004-09-24 Hamamatsu Photonics Kk 光検出装置
JP4099413B2 (ja) 2003-03-20 2008-06-11 浜松ホトニクス株式会社 光検出装置
JP2004289709A (ja) * 2003-03-25 2004-10-14 Toshiba Corp 撮像装置、撮像方法
JP2005218052A (ja) * 2004-02-02 2005-08-11 Hamamatsu Photonics Kk 光検出装置
JP4391315B2 (ja) 2004-05-10 2009-12-24 浜松ホトニクス株式会社 撮像システムおよび撮像方法
JP4920178B2 (ja) * 2004-06-24 2012-04-18 浜松ホトニクス株式会社 歪み検出システムおよび歪み検出方法
JP4536540B2 (ja) * 2005-02-03 2010-09-01 浜松ホトニクス株式会社 固体撮像装置
JP4503481B2 (ja) * 2005-04-05 2010-07-14 浜松ホトニクス株式会社 固体撮像装置
EP1713258B1 (en) * 2005-04-11 2012-11-07 Canon Kabushiki Kaisha Focus detection
US7282685B2 (en) * 2005-04-14 2007-10-16 Micron Technology, Inc. Multi-point correlated sampling for image sensors
JP2006311307A (ja) * 2005-04-28 2006-11-09 Hamamatsu Photonics Kk 固体撮像装置
JP4696877B2 (ja) * 2005-11-29 2011-06-08 ヤマハ株式会社 固体撮像装置
AT504582B1 (de) * 2006-11-23 2008-12-15 Arc Austrian Res Centers Gmbh Verfahren zur generierung eines bildes in elektronischer form, bildelement für einen bildsensor zur generierung eines bildes sowie bildsensor
JP4922776B2 (ja) * 2007-01-30 2012-04-25 富士フイルム株式会社 撮像装置、撮像方法
CN104243843B (zh) 2014-09-30 2017-11-03 北京智谷睿拓技术服务有限公司 拍摄光照补偿方法、补偿装置及用户设备
JP7060413B2 (ja) * 2018-03-08 2022-04-26 浜松ホトニクス株式会社 光検出装置及び光検出方法

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JPH04151129A (ja) 1990-04-20 1992-05-25 Olympus Optical Co Ltd 追尾装置を有するカメラの測光装置
JP2974809B2 (ja) 1991-03-05 1999-11-10 オリンパス光学工業株式会社 固体撮像装置
JPH065832A (ja) 1992-06-19 1994-01-14 Fujitsu Ltd 位置検出装置および位置検出方法
JP3441761B2 (ja) 1993-05-28 2003-09-02 キヤノン株式会社 イメージセンサ
US5406070A (en) 1993-12-16 1995-04-11 International Business Machines Corporation Method and apparatus for scanning an object and correcting image data using concurrently generated illumination data
JP2731115B2 (ja) * 1994-07-14 1998-03-25 シャープ株式会社 分割型受光素子
KR960028217A (ko) * 1994-12-22 1996-07-22 엘리 웨이스 움직임 검출 카메라 시스템 및 방법
JPH08292998A (ja) * 1995-04-20 1996-11-05 Mitsubishi Electric Corp 画像検出装置及び画像検出方法
WO1997007630A1 (en) 1995-08-11 1997-02-27 Kabushiki Kaisha Toshiba Mos image pickup device
KR100279295B1 (ko) * 1998-06-02 2001-02-01 윤종용 액티브 픽셀 센서
US6956605B1 (en) * 1998-08-05 2005-10-18 Canon Kabushiki Kaisha Image pickup apparatus
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AU2321400A (en) 1999-01-29 2000-08-18 Hamamatsu Photonics K.K. Photodetector device
JP3449468B2 (ja) 1999-05-06 2003-09-22 日本電気株式会社 固体撮像装置およびその駆動方法
US6867806B1 (en) * 1999-11-04 2005-03-15 Taiwan Advanced Sensors Corporation Interlace overlap pixel design for high sensitivity CMOS image sensors
JP4424796B2 (ja) * 1999-11-18 2010-03-03 浜松ホトニクス株式会社 光検出装置
EP1102323B1 (en) * 1999-11-19 2012-08-15 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Method for detecting electromagnetic radiation using an optoelectronic sensor
JP2001177144A (ja) * 1999-12-20 2001-06-29 Hamamatsu Photonics Kk 光位置検出装置
JP4500434B2 (ja) * 2000-11-28 2010-07-14 キヤノン株式会社 撮像装置及び撮像システム、並びに撮像方法
JP2003204488A (ja) * 2001-10-30 2003-07-18 Mitsubishi Electric Corp 撮像装置および撮像装置を具備する携帯端末
CN100394606C (zh) * 2001-12-05 2008-06-11 浜松光子学株式会社 光探测装置、成像装置和测距图像捕捉装置
US7030356B2 (en) * 2001-12-14 2006-04-18 California Institute Of Technology CMOS imager for pointing and tracking applications
FR2839363B1 (fr) * 2002-05-06 2004-07-16 Mbdam Procede pour extraire une zone illuminee d'une matrice de photocapteurs d'un dispositif de detection lumineuse et dispositif de detection lumineuse mettant en oeuvre ce procede
US6891143B2 (en) * 2002-10-30 2005-05-10 Microsoft Corporation Photo-sensor array with pixel-level signal comparison
CN100379009C (zh) * 2003-01-22 2008-04-02 浜松光子学株式会社 光检测装置
JP2004264034A (ja) * 2003-01-24 2004-09-24 Hamamatsu Photonics Kk 光検出装置
JP4099413B2 (ja) * 2003-03-20 2008-06-11 浜松ホトニクス株式会社 光検出装置
WO2004093318A2 (en) * 2003-04-11 2004-10-28 Canesta, Inc. Method and system to differentially enhance sensor dynamic range
JP4277984B2 (ja) 2003-06-04 2009-06-10 横浜ゴム株式会社 空気入りタイヤ及びその解体方法
US7105793B2 (en) * 2003-07-02 2006-09-12 Micron Technology, Inc. CMOS pixels for ALC and CDS and methods of forming the same
US7081608B2 (en) * 2003-10-15 2006-07-25 Micron Technology, Inc. Pixel with differential readout

Also Published As

Publication number Publication date
EP1460839A4 (en) 2006-03-15
CN1605189A (zh) 2005-04-06
TW200301569A (en) 2003-07-01
EP1460839A1 (en) 2004-09-22
KR100876729B1 (ko) 2008-12-31
US20050041124A1 (en) 2005-02-24
KR20040065291A (ko) 2004-07-21
CN100512392C (zh) 2009-07-08
JP3965049B2 (ja) 2007-08-22
US7245317B2 (en) 2007-07-17
AU2002354122A1 (en) 2003-07-09
JP2003189181A (ja) 2003-07-04
WO2003055201A1 (en) 2003-07-03

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