KR100872751B1 - 양면-볼록 고체 침지 렌즈 - Google Patents

양면-볼록 고체 침지 렌즈 Download PDF

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Publication number
KR100872751B1
KR100872751B1 KR1020077015713A KR20077015713A KR100872751B1 KR 100872751 B1 KR100872751 B1 KR 100872751B1 KR 1020077015713 A KR1020077015713 A KR 1020077015713A KR 20077015713 A KR20077015713 A KR 20077015713A KR 100872751 B1 KR100872751 B1 KR 100872751B1
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KR
South Korea
Prior art keywords
chip
sil
lens
immersion lens
convex
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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KR1020077015713A
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English (en)
Korean (ko)
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KR20070087002A (ko
Inventor
팩다맨 내더
제임스 에스 비컬즈
Original Assignee
디씨지 시스템스 인코포레이티드
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Application filed by 디씨지 시스템스 인코포레이티드 filed Critical 디씨지 시스템스 인코포레이티드
Publication of KR20070087002A publication Critical patent/KR20070087002A/ko
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/122—Flying-type heads, e.g. analogous to Winchester type in magnetic recording
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/135—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
    • G11B7/1372—Lenses
    • G11B7/1374—Objective lenses
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/135—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
    • G11B7/1372—Lenses
    • G11B7/1378—Separate aberration correction lenses; Cylindrical lenses to generate astigmatism; Beam expanders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/135—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
    • G11B7/1387—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector using the near-field effect
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/806—Optical elements or arrangements associated with the image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/02—Simple or compound lenses with non-spherical faces
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/135—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
    • G11B7/1372—Lenses
    • G11B2007/13727—Compound lenses, i.e. two or more lenses co-operating to perform a function, e.g. compound objective lens including a solid immersion lens, positive and negative lenses either bonded together or with adjustable spacing

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Lenses (AREA)
  • Microscoopes, Condenser (AREA)
  • Acyclic And Carbocyclic Compounds In Medicinal Compositions (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1020077015713A 2002-01-16 2002-12-11 양면-볼록 고체 침지 렌즈 Expired - Fee Related KR100872751B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/052,011 US6594086B1 (en) 2002-01-16 2002-01-16 Bi-convex solid immersion lens
US10/052,011 2002-01-16

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020047007230A Division KR100870214B1 (ko) 2002-01-16 2002-12-11 양면-볼록 고체 침지 렌즈

Publications (2)

Publication Number Publication Date
KR20070087002A KR20070087002A (ko) 2007-08-27
KR100872751B1 true KR100872751B1 (ko) 2008-12-08

Family

ID=21974831

Family Applications (3)

Application Number Title Priority Date Filing Date
KR1020077015713A Expired - Fee Related KR100872751B1 (ko) 2002-01-16 2002-12-11 양면-볼록 고체 침지 렌즈
KR1020087015284A Ceased KR20080064912A (ko) 2002-01-16 2002-12-11 양면-볼록 고체 침지 렌즈
KR1020047007230A Expired - Fee Related KR100870214B1 (ko) 2002-01-16 2002-12-11 양면-볼록 고체 침지 렌즈

Family Applications After (2)

Application Number Title Priority Date Filing Date
KR1020087015284A Ceased KR20080064912A (ko) 2002-01-16 2002-12-11 양면-볼록 고체 침지 렌즈
KR1020047007230A Expired - Fee Related KR100870214B1 (ko) 2002-01-16 2002-12-11 양면-볼록 고체 침지 렌즈

Country Status (9)

Country Link
US (4) US6594086B1 (https=)
EP (1) EP1466194B1 (https=)
JP (1) JP4195921B2 (https=)
KR (3) KR100872751B1 (https=)
CN (1) CN1610843A (https=)
AT (1) ATE358826T1 (https=)
DE (1) DE60219360T2 (https=)
TW (1) TWI249622B (https=)
WO (1) WO2003062864A2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10133051B2 (en) 2014-03-11 2018-11-20 Fei Efa, Inc. Self correcting floating SIL tip

Families Citing this family (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6594086B1 (en) * 2002-01-16 2003-07-15 Optonics, Inc. (A Credence Company) Bi-convex solid immersion lens
US7426171B2 (en) * 2002-11-18 2008-09-16 Sony Corporation Optical lens, condenser lens, optical pickup, and optical recording/reproducing apparatus
US7423816B2 (en) * 2003-03-20 2008-09-09 Hamamatsu Photonics K.K. Solid immersion lens and microscope
EP1607786B1 (en) * 2003-03-20 2012-09-05 Hamamatsu Photonics K.K. Microscope and sample observing method
WO2004088386A1 (ja) * 2003-03-20 2004-10-14 Hamamatsu Photonics K.K. 固浸レンズ、及びそれを用いた試料観察方法
TWI269886B (en) * 2003-03-20 2007-01-01 Hamamatsu Photonics Kk Microscope and specimen observation method
DE10343722A1 (de) * 2003-09-17 2005-04-14 Carl Zeiss Jena Gmbh Festkörper-Immersionslinsen-Spektroskopie und -Mikroskopie
US6961186B2 (en) * 2003-09-26 2005-11-01 Takumi Technology Corp. Contact printing using a magnified mask image
US7042647B2 (en) * 2003-10-02 2006-05-09 Credence Systems Corporation Scanning optical system
US7046418B2 (en) * 2003-10-08 2006-05-16 Gentex Corporation Reversible electrodeposition devices and associated electrochemical media
US7576928B2 (en) * 2003-10-31 2009-08-18 Hamamatsu Photonics K.K. Solid immersion lens holder
US20050094258A1 (en) * 2003-10-31 2005-05-05 Hamamatsu Photonics K.K. Solid immersion lens moving device and microscope using the same
KR101110468B1 (ko) 2003-10-31 2012-01-31 하마마츠 포토닉스 가부시키가이샤 시료 관찰 방법 및 현미경, 및 이것에 이용하는 고침 렌즈및 광학 밀착액
US7312921B2 (en) * 2004-02-27 2007-12-25 Hamamatsu Photonics K.K. Microscope and sample observation method
US7110172B2 (en) * 2004-02-27 2006-09-19 Hamamatsu Photonics K.K. Microscope and sample observation method
JP4643994B2 (ja) * 2005-01-19 2011-03-02 浜松ホトニクス株式会社 固浸レンズホルダ
JP4577023B2 (ja) * 2004-03-15 2010-11-10 ソニー株式会社 ソリッドイマージョンレンズ、集光レンズ、光学ピックアップ装置、光記録再生装置及びソリッドイマージョンレンズの形成方法
CN100359578C (zh) * 2004-09-14 2008-01-02 索尼株式会社 固体浸没透镜以及制造该固体浸没透镜的方法
JP2006114196A (ja) * 2004-09-14 2006-04-27 Sony Corp ソリッドイマージョンレンズとこれを用いた集光レンズ、光学ピックアップ装置、光記録再生装置及びソリッドイマージョンレンズの形成方法
JP2006112808A (ja) * 2004-10-12 2006-04-27 Fujikura Ltd 表面プラズモンセンサー
US7314767B2 (en) * 2005-05-27 2008-01-01 Credence Systems Corporation Method for local wafer thinning and reinforcement
US7659981B2 (en) * 2005-08-26 2010-02-09 Dcg Systems, Inc. Apparatus and method for probing integrated circuits using polarization difference probing
US7450245B2 (en) 2005-06-29 2008-11-11 Dcg Systems, Inc. Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
US7616312B2 (en) 2005-06-29 2009-11-10 Dcg Systems, Inc. Apparatus and method for probing integrated circuits using laser illumination
US7733100B2 (en) 2005-08-26 2010-06-08 Dcg Systems, Inc. System and method for modulation mapping
JP5045148B2 (ja) * 2006-04-27 2012-10-10 セイコーエプソン株式会社 プラスチック偏光レンズ
FR2902226B1 (fr) 2006-06-12 2010-01-29 Commissariat Energie Atomique Composant optique fonctionnant en transmission en champ proche
US20070291361A1 (en) * 2006-06-19 2007-12-20 Credence Systems Corporation Lens housing with integrated thermal management
CN101126491B (zh) * 2006-08-18 2011-03-23 鸿富锦精密工业（深圳）有限公司 发光二极管模组
US7660054B2 (en) * 2007-06-29 2010-02-09 Intel Corporation Thermally controlled sold immersion lens fixture
US8424594B2 (en) * 2007-12-10 2013-04-23 Presto Engineering, Inc. Apparatus for thermal control in the analysis of electronic devices
US8553322B2 (en) * 2008-11-04 2013-10-08 Dcg Systems, Inc. Variable magnification optics with spray cooling
SG10201401887YA (en) 2009-05-01 2014-06-27 Dcg Systems Inc Systems and method for laser voltage imaging state mapping
US8072699B2 (en) * 2009-06-17 2011-12-06 Semicaps Pte Ltd Solid immersion lens optics assembly
US8767199B2 (en) * 2010-10-15 2014-07-01 Infrared Laboratories, Inc. Inspection system utilizing solid immersion lenses
CN102540408A (zh) * 2011-12-26 2012-07-04 吉林大学 超半球型电光固浸透镜
KR102102007B1 (ko) * 2012-06-26 2020-04-20 케이엘에이 코포레이션 근접장 계측
TWI512867B (zh) * 2012-12-14 2015-12-11 Yayatech Co Ltd 晶圓切割道之檢測方法及其檢測治具
US8873032B1 (en) 2013-05-07 2014-10-28 CheckPoint Technologies, LLC. Optical probing system having reliable temperature control
US9030658B1 (en) 2013-05-07 2015-05-12 Checkpoint Technologies, Llc Multi-resolution optical probing system having reliable temperature control and mechanical isolation
US9217855B1 (en) 2013-08-30 2015-12-22 Checkpoint Technologies, Llc Multi-magnification high sensitivity optical system for probing electronic devices
US9182580B1 (en) 2013-08-30 2015-11-10 Checkpoint Technologies, Llc Optical probe system having accurate positional and orientational adjustments for multiple optical objectives
TWI673528B (zh) * 2014-09-26 2019-10-01 日商濱松赫德尼古斯股份有限公司 固態浸沒式透鏡保持器及圖像取得裝置
US9417281B1 (en) 2014-09-30 2016-08-16 Checkpoint Technologies Llc Adjustable split-beam optical probing (ASOP)
KR20170011708A (ko) * 2015-07-24 2017-02-02 엘지전자 주식회사 광학 렌즈 및 이를 포함하는 백라이트 유닛과 디스플레이 디바이스
CN108292106B (zh) * 2015-10-09 2021-05-25 Asml荷兰有限公司 用于检查及量测的方法和设备
GB201710324D0 (en) * 2017-06-28 2017-08-09 Lig Tech Ltd Microsphere lens assembly
WO2020008613A1 (ja) * 2018-07-06 2020-01-09 オリンパス株式会社 対物光学系
WO2020150239A1 (en) 2019-01-14 2020-07-23 University Of Washington Apparatuses, systems and methods for solid immersion meniscus lenses
US11329722B2 (en) 2020-03-27 2022-05-10 Relative Dynamics Incorporated Optical terminals
JP2022108161A (ja) * 2021-01-12 2022-07-25 浜松ホトニクス株式会社 光学装置及び固浸レンズ
GB202301375D0 (en) * 2023-01-31 2023-03-15 Refeyn Ltd Improvements in or relating to a flow device
CN119104882B (zh) * 2024-11-08 2025-02-18 杭州芯海半导体技术有限公司 环境温度的调节方法、装置、电子设备及存储介质

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05189796A (ja) * 1991-03-14 1993-07-30 Univ Leland Stanford Jr 固体液浸レンズ

Family Cites Families (61)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1002407A (en) * 1911-01-30 1911-09-05 Carl Kleinschmidt Heating and ventilating system.
CH437995A (de) * 1963-11-01 1967-06-15 Hoffmann La Roche Verfahren zur Gewinnung von lipophile Substanzen enthaltenden Präparaten
DE1472167A1 (de) 1965-11-26 1969-01-09 Leitz Ernst Gmbh Mikroskop-Immersionsobjektiv
US3436159A (en) 1966-02-04 1969-04-01 Bausch & Lomb Internal reflection element for spectroscopy with film optical cavity to enhance absorption
DE1572072C3 (de) * 1966-03-19 1974-02-28 Kalle Ag, 6202 Wiesbaden-Biebrich Wärmeentwicke lbares Diazotypiematerial
US3524691A (en) 1968-03-18 1970-08-18 Watson Mfg Co File drawer
GB1281611A (en) 1970-02-10 1972-07-12 Vickers Ltd Apochromatic microscope objectives
JPS5141355B2 (https=) 1973-02-08 1976-11-09
US4002107A (en) 1973-12-17 1977-01-11 Caterpillar Tractor Co. Disposable fluid actuator
JPS5410497B2 (https=) 1974-12-06 1979-05-07
DE2848590A1 (de) 1978-11-09 1980-05-22 Leitz Ernst Gmbh Optische anordnung zur reflexionsmikroskopischen untersuchung biologischer gewebe und organoberflaechen
WO1983002463A1 (fr) * 1982-01-12 1983-07-21 Yamataka, Kazunori Procede de production d'un ester de dimethyl d'acide bibasique superieur
FR2543075B1 (fr) * 1983-03-23 1987-04-24 Saint Gobain Vitrage Vitrage pour toit panoramique
DD215640A1 (de) 1983-05-02 1984-11-14 Zeiss Jena Veb Carl Frontlinsengruppe fuer immersionsmikroskopobjektiv in hd-ausfuehrung mit hoher apertur
US4625111A (en) * 1985-02-04 1986-11-25 Halliburton Company Method and apparatus for pulsed neutron capture measurement of borehole conditions and formation hydrogen index
US4625114A (en) 1985-07-15 1986-11-25 At&T Technologies, Inc. Method and apparatus for nondestructively determining the characteristics of a multilayer thin film structure
US5004307A (en) 1990-04-12 1991-04-02 The Board Of Trustees Of The Leland Stanford Junior University Near field and solid immersion optical microscope
AU8633491A (en) * 1990-08-23 1992-03-17 Blue Water Holding Company, Inc. Improvements to locking wrenches
US5220403A (en) 1991-03-11 1993-06-15 International Business Machines Corporation Apparatus and a method for high numerical aperture microscopic examination of materials
US5208648A (en) 1991-03-11 1993-05-04 International Business Machines Corporation Apparatus and a method for high numerical aperture microscopic examination of materials
US5247392A (en) 1991-05-21 1993-09-21 Siemens Aktiengesellschaft Objective lens for producing a radiation focus in the inside of a specimen
US5282088A (en) 1992-10-19 1994-01-25 Mark Davidson Aplanatic microlens and method for making same
US5217392A (en) * 1992-11-13 1993-06-08 The Whitaker Corporation Coaxial cable-to-cable splice connector
DE4244268A1 (de) * 1992-12-28 1994-07-07 Max Planck Gesellschaft Hochauflösendes optisches System mit einer Tastspitze
US5475316A (en) * 1993-12-27 1995-12-12 Hypervision, Inc. Transportable image emission microscope
US5497359A (en) 1994-08-30 1996-03-05 National Business Machines Corporation Optical disk data storage system with radiation-transparent air-bearing slider
US5948972A (en) * 1994-12-22 1999-09-07 Kla-Tencor Corporation Dual stage instrument for scanning a specimen
JPH08315404A (ja) 1995-05-18 1996-11-29 Sony Corp 光学ピックアップ装置
DK0937098T3 (da) * 1995-06-07 2002-12-02 Invitrogen Corp Rekombinatorisk kloning under anvendelse af gensplejsede rekombinationssites
US5729393A (en) 1996-04-03 1998-03-17 Digital Papyrus Corporation Optical flying head with solid immersion lens having raised central surface facing medium
US6270696B1 (en) * 1996-06-03 2001-08-07 Terastor Corporation Method of fabricating and integrating an optical assembly into a flying head
US5940545A (en) * 1996-07-18 1999-08-17 International Business Machines Corporation Noninvasive optical method for measuring internal switching and other dynamic parameters of CMOS circuits
US6591121B1 (en) * 1996-09-10 2003-07-08 Xoetronics Llc Measurement, data acquisition, and signal processing
US5910940A (en) * 1996-10-08 1999-06-08 Polaroid Corporation Storage medium having a layer of micro-optical lenses each lens generating an evanescent field
US5852232A (en) * 1997-01-02 1998-12-22 Kla-Tencor Corporation Acoustic sensor as proximity detector
WO1998047138A1 (en) * 1997-04-14 1998-10-22 Toray Industries, Inc. Optical recording device and optical recording medium
JPH113534A (ja) 1997-04-14 1999-01-06 Toray Ind Inc 光記録装置および光記録媒体
US5939709A (en) * 1997-06-19 1999-08-17 Ghislain; Lucien P. Scanning probe optical microscope using a solid immersion lens
JP2001507463A (ja) * 1997-10-06 2001-06-05 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 球面収差検出系及びこれを用いる光学装置
JPH11273132A (ja) * 1998-03-25 1999-10-08 Hitachi Ltd 光ヘッド
US6441359B1 (en) * 1998-10-20 2002-08-27 The Board Of Trustees Of The Leland Stanford Junior University Near field optical scanning system employing microfabricated solid immersion lens
JP2000171611A (ja) 1998-12-04 2000-06-23 Minolta Co Ltd 固浸レンズ及び光ヘッド
US6252412B1 (en) * 1999-01-08 2001-06-26 Schlumberger Technologies, Inc. Method of detecting defects in patterned substrates
EP1196792A4 (en) 1999-06-21 2008-08-27 Univ Boston TECHNIQUES FOR MANUFACTURING LENSES INCREASING THE DIGITAL OPENING FOR HIGH RESOLUTION SUB-SURFACE IMAGING
JP2001034998A (ja) 1999-07-26 2001-02-09 Minolta Co Ltd 光ヘッド及びその製造方法
TW504582B (en) * 1999-09-01 2002-10-01 Konishiroku Photo Ind Objective lens for pickup and light pickup apparatus
US6507433B2 (en) * 1999-10-08 2003-01-14 Westover Scientific, Inc. Method and apparatus for preventing application of excessive force between microscope objective and stage
US6462814B1 (en) * 2000-03-15 2002-10-08 Schlumberger Technologies, Inc. Beam delivery and imaging for optical probing of a device operating under electrical test
JP3887139B2 (ja) * 2000-04-21 2007-02-28 株式会社日立製作所 対物レンズ、これを用いた光ヘッド
US6301055B1 (en) * 2000-08-16 2001-10-09 California Institute Of Technology Solid immersion lens structures and methods for producing solid immersion lens structures
WO2002033700A2 (en) * 2000-10-16 2002-04-25 Konica Corporation Objective lens, coupling lens, light converging optical system, and optical pick-up apparatus
US6818907B2 (en) * 2000-10-17 2004-11-16 The President And Fellows Of Harvard College Surface plasmon enhanced illumination system
US6381081B1 (en) * 2001-01-19 2002-04-30 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Flexure-ring for centering a concave lens in a bore of a housing for an optical system
JP2002236087A (ja) 2001-02-08 2002-08-23 Minolta Co Ltd 光学系調整方法、並びにその光学系調整方法を利用した光記録再生装置、顕微鏡装置及び加工装置
JP3712628B2 (ja) * 2001-04-06 2005-11-02 シャープ株式会社 対物レンズおよびその製造誤差の補正方法並びに該対物レンズを用いた光ピックアップ装置
US6621275B2 (en) * 2001-11-28 2003-09-16 Optonics Inc. Time resolved non-invasive diagnostics system
US6594086B1 (en) * 2002-01-16 2003-07-15 Optonics, Inc. (A Credence Company) Bi-convex solid immersion lens
US6822800B2 (en) * 2002-06-10 2004-11-23 Pentax Corporation Objective lens for optical pickup
US6683724B2 (en) * 2002-06-13 2004-01-27 Eastman Kodak Company Solid immersion lens array and methods for producing a solid immersion lens array
JP2004327773A (ja) * 2003-04-25 2004-11-18 Renesas Technology Corp 故障解析装置
US7576928B2 (en) 2003-10-31 2009-08-18 Hamamatsu Photonics K.K. Solid immersion lens holder

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05189796A (ja) * 1991-03-14 1993-07-30 Univ Leland Stanford Jr 固体液浸レンズ

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
일본공개특허공보 평05-189796호(1993.07.30)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10133051B2 (en) 2014-03-11 2018-11-20 Fei Efa, Inc. Self correcting floating SIL tip
US10718933B2 (en) 2014-03-11 2020-07-21 Fei Efa, Inc. Self correcting floating SIL tip

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JP4195921B2 (ja) 2008-12-17
US20040240074A1 (en) 2004-12-02
US20030202255A1 (en) 2003-10-30
DE60219360D1 (de) 2007-05-16
WO2003062864A2 (en) 2003-07-31
US6778327B2 (en) 2004-08-17
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WO2003062864A3 (en) 2003-10-16
KR100870214B1 (ko) 2008-11-27
EP1466194A2 (en) 2004-10-13
KR20070087002A (ko) 2007-08-27
US7492529B2 (en) 2009-02-17
US6594086B1 (en) 2003-07-15
ATE358826T1 (de) 2007-04-15
US20070205795A1 (en) 2007-09-06
CN1610843A (zh) 2005-04-27
TWI249622B (en) 2006-02-21
US7227702B2 (en) 2007-06-05
EP1466194B1 (en) 2007-04-04
KR20080064912A (ko) 2008-07-09
JP2005515514A (ja) 2005-05-26

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