KR100780142B1 - 기재의 코팅방법 및 기재에 층을 코팅하기 위한 장치 - Google Patents
기재의 코팅방법 및 기재에 층을 코팅하기 위한 장치 Download PDFInfo
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- KR100780142B1 KR100780142B1 KR1020027010576A KR20027010576A KR100780142B1 KR 100780142 B1 KR100780142 B1 KR 100780142B1 KR 1020027010576 A KR1020027010576 A KR 1020027010576A KR 20027010576 A KR20027010576 A KR 20027010576A KR 100780142 B1 KR100780142 B1 KR 100780142B1
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- 238000000859 sublimation Methods 0.000 claims abstract description 14
- 230000008022 sublimation Effects 0.000 claims abstract description 14
- 239000012495 reaction gas Substances 0.000 claims abstract description 12
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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Abstract
Description
탱크(1)(3)로 형성된 소오스들은 별도로 온도 조절이 이루어질 수 있음으로써, 모든 공간과 가스유입구 유니트의 면들에 대해서 양의 온도기울기(a positive temperature gradient)가 설정되고 운반되는 기체상 출발물질의 양이 압력과 온도에 의하여 조절될 수 있다.
또한 탱크의 가열은, 기재에 층을 코팅하기 위한 가스를 가스유입구 유니트에 공급하는데 사용되는 공정온도보다 더 높은 온도를 이용함으로써 탱크의 세정이 가능해지는 방식으로 이루어진다.
아울러 서셉터(13)용 히터는, 기재의 코팅이 이루어지게 되는 공정온도보다 더 높은 온도까지 서셉터(13)를 가열하는 것에 의해 서셉터(13)와 반응챔버(11)의 세정이 수행될 수 있도록 하는 방식으로 구성되어 있다.
Claims (27)
- 반응챔버내에서, 반응가스가 가스유입구 유니트(15)를 통하여 반응챔버로 분사된 결과로서의 응축에 의하여 하나의 층이 서셉터에 의해 지지되는 하나 이상의 기재상에 형성되고, 액체 또는 고체 출발물질이 반응가스의 적어도 일부를 위해 사용되며, 반응가스가 기재에 도달하기 전에 응축되는 것을 방지하기 위하여 소오스와 기재사이에서 반응가스의 농도와 온도가 제어되는 기재의 코팅방법에 있어서, 탱크(1)(3)로 형성되되 승화소오스를 포함하는 소오스와, 반응챔버 벽(37)과, 가스유입구 유니트(15)는 각각의 경우에 있어서 기재보다 더 높은 온도로 유지되어, 출발물질이 기재상에 응축됨을 특징으로 하는 기재의 코팅방법.
- 제 1 항에 있어서, 기생증착반응을 방지하기 위하여 반응가스의 분리가 이루어지도록 하는 유입구조를 갖는 가스유입구 유니트(15)가 사용됨을 특징으로 하는 기재의 코팅방법.
- 제 1 항에 있어서, 탱크(1)(3)로 형성된 소오스가 상이한 온도로 유지됨을 특징으로 하는 기재의 코팅방법.
- 제 1 항에 있어서, 가스유입구 유니트(15)의 다수의 분사장치(25)(26)를 이용함을 특징으로 하는 기재의 코팅방법.
- 제 1 항에 있어서, 기생증착됨으로서 가스상태로부터 손실되는 것을 최소화하기 위하여 각 반응가스가 중복됨이 없이 주입됨을 특징으로 하는 기재의 코팅방법.
- 제 1 항에 있어서, 상기 가스유입구 유니트는 공간(22)(23)과 분사장치(25)(26)들을 포함하되, 공간(22)(23)내에 위치하는 가스는 가스유입구 유니트(15)의 개별적인 분사장치(25)(26)를 통과하여 나가고, 공간(22)(23) 및 분사장치(25)(26)로부터 나오는 가스의 유출속도는 부분적인 베르누이 효과가 나타나지 않도록 선택됨을 특징으로 하는 기재의 코팅방법.
- 제 1 항에 있어서, 출발물질의 탱크(1)(3)의 압력이 불활성 캐리어 가스(35)의 흐름과 조절 밸브(34)에 의하여 반응챔버(11)의 압력에 관계없이 조절됨을 특징으로 하는 기재의 코팅방법.
- 반응챔버(11), 하나 이상의 서셉터(13)와, 출발물질을 위한 하나 이상의 소오스를 갖는 용기(5)(5')를 가지며, 서셉터(13)와 반응챔버 벽(37)이 별도로 온도조절되고 기재에 층을 코팅하기 위한 장치에 있어서, 소오스가 고체 또는 액체 출발물질을 저장하는 탱크(1)(3)이며 ; 반응챔버 벽(37), 가스유입구 유니트(15) 및 탱크(1)(3)가 서셉터(13)상의 기재(12) 보다 더 높은 온도로 조절될 수 있어 가스유입구 유니트(15)로부터 나오는 가스가 기재상에 응축됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 탱크(1)(3)로 형성된 소오스들이 별도로 온도조절(thermostated)될 수 있음으로써, 가스유입구 유니트(15) 쪽으로 가고 나서 반응챔버내로 들어가는 유로에 대한 양의 온도기울기(a positive temperature gradient)가 설정되되 모든 공간(22)(23)과 가스유입구 유니트(15)의 면들에 대해 설정되고, 운반되는 기체상 출발물질의 양이 압력과 온도에 의하여 조절될 수 있음을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 9 항에 있어서, 탱크(1)(3)로 형성된 소오스들 중 하나 또는 모두의 온도조절이 액체 또는 전기적으로 활성적인 구성요소에 의하여 수행됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 탱크(1)(3)의 가열은, 기재에 층을 코팅하기 위한 가스를 가스유입구 유니트(15)에 공급하는데 사용되는 공정온도보다 더 높은 온도를 사용함으로써 탱크(1)(3)의 세정이 가능해지는 방식으로 이루어짐을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 가스유입구 유니트(15)가 하나 이상의 공간(22)(23)을 갖는 단일챔버 또는 다중챔버형의 샤워헤드 형태로 구성됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 사용된 캐리어 가스가 Ar, H2, N2 , H2 또는 이들의 혼합체임을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 12 항에 있어서, 각 공간(22)(23)의 각 기체상 출발물질이 각각의 분사장치(25)(26)를 통하여 반응챔버(11)로 주입되어 소오스물질이 이들이 가스유입구로부터 나온 후 기재(12)에 도달하기 직전에 혼합됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 12 항에 있어서, 각 공간(22)(23)의 둘 이상의 기체상 출발물질이 각각 분사장치(25)(26)를 통하여 반응챔버로 주입됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 12 항에 있어서, 각 공간의 분사장치(25)(26)가 기재(12)에 대하여 원하는 임의의 각도로 배치됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 12 항에 있어서, 각 공간의 분사장치(25)(26)가 동일 또는 상이한 직경을 가짐으로서 동일 또는 상이한 속도를 갖는 출발물질의 질량유동이 균일한 주입분포를 이룸을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 12 항에 있어서, 각 공간의 분사장치(25)(26)가 상대측에 대하여 동일 또는 상이한 거리를 두고 형성되어 있어 연속적이고 균일한 주입분포가 이루어짐을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 12 항에 있어서, 각 공간(22)(23)이 독립적으로 온도조절되어 승화정도가 상이한 출발물질이 사용될 수 있음을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 19 항에 있어서, 하나 또는 모든 공간(22)(23)의 온도조절이 액체 또는 전기적으로 활성적인 가열코일(30)(32)에 의하여 이루어지고, 각 공간(22)(23)에서 출발물질의 응축이 방지됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 반응챔버 벽에 센서(38)와 이에 결합되는 통로(39)가 구비되어 있어 층의 특성 또는 기재(12)의 표면상의 특성을 측정할 수 있음을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 서셉터(13)가 원형, 다각형, 평면형 또는 만곡형 또는 시이트 형태인 기재를 수용할 수 있게 구성되어 있음을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 서셉터(13)가, 이 서셉터(13)와 반응챔버 벽(37)의 사이 및 서셉터(13) 위의 반응챔버가스에 대한 음의 온도기울기(a negative temperature gradient)가 존재하게 되는 방식으로 중공자켓(14)내의 유체 또는 전기적으로 활성인 요소(펠티에르/저항열)에 의해 온도제어될 수 있음으로써, 응축에 의한 기재의 코팅이 조절될 수 있게 되어 있음을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 서셉터(13)용 히터는, 기재의 코팅이 이루어지게 되는 공정온도 보다 더 높은 온도까지 서셉터(13)를 가열하는 것에 의해 서셉터(13)와 반응챔버(11)의 세정이 수행될 수 있도록 하는 방식으로 구성됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 탱크(1)(3)로부터 나오는 가스를 캐리어 가스(35)로 희석함으로써, 파이프 라인(6) 또는 가스유입구 유니트(15)내 출발물질의 농도가 감소하게 되어 파이프 라인(6) 또는 가스유입구 유니트(15) 내의 출발물질의 응축온도가 상기 소오스의 온도보다 더 낮아지게 됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 기재가 코팅과정중에 새도우 마스크에 의하여 마스킹됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
- 제 8 항에 있어서, 질량유동의 급격한 변화를 방지하기 위하여 탱크에 대한 조절된 질량유동이 바이패스 라인(44)에 의하여 전환됨을 특징으로 하는 기재에 층을 코팅하기 위한 장치.
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Families Citing this family (105)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6302964B1 (en) * | 1998-06-16 | 2001-10-16 | Applied Materials, Inc. | One-piece dual gas faceplate for a showerhead in a semiconductor wafer processing system |
US20030101938A1 (en) * | 1998-10-27 | 2003-06-05 | Applied Materials, Inc. | Apparatus for the deposition of high dielectric constant films |
JP3682465B2 (ja) * | 1999-03-31 | 2005-08-10 | 独立行政法人産業技術総合研究所 | 樹脂成形物表面層の改質方法およびそのための装置および表面層が改質された樹脂成形物、および樹脂成形物表面層の着色方法およびそのための装置および表面層が着色された樹脂成形物、および表面層の改質により機能性を付与された樹脂成形物 |
US6572706B1 (en) * | 2000-06-19 | 2003-06-03 | Simplus Systems Corporation | Integrated precursor delivery system |
KR100516844B1 (ko) | 2001-01-22 | 2005-09-26 | 동경 엘렉트론 주식회사 | 처리 장치 및 처리 방법 |
JP3990881B2 (ja) * | 2001-07-23 | 2007-10-17 | 株式会社日立製作所 | 半導体製造装置及びそのクリーニング方法 |
EP2275587B1 (en) * | 2001-09-04 | 2020-03-18 | The Trustees of Princeton University | Process for organic vapor jet deposition |
US7431968B1 (en) | 2001-09-04 | 2008-10-07 | The Trustees Of Princeton University | Process and apparatus for organic vapor jet deposition |
US7404862B2 (en) | 2001-09-04 | 2008-07-29 | The Trustees Of Princeton University | Device and method for organic vapor jet deposition |
US8535759B2 (en) | 2001-09-04 | 2013-09-17 | The Trustees Of Princeton University | Method and apparatus for depositing material using a dynamic pressure |
US7744957B2 (en) | 2003-10-23 | 2010-06-29 | The Trustees Of Princeton University | Method and apparatus for depositing material |
US20030111014A1 (en) * | 2001-12-18 | 2003-06-19 | Donatucci Matthew B. | Vaporizer/delivery vessel for volatile/thermally sensitive solid and liquid compounds |
DE10212923A1 (de) * | 2002-03-22 | 2004-01-08 | Aixtron Ag | Verfahren zum Beschichten eines Substrates und Vorrichtung zur Durchführung des Verfahrens |
US7208195B2 (en) * | 2002-03-27 | 2007-04-24 | Ener1Group, Inc. | Methods and apparatus for deposition of thin films |
JP2004055401A (ja) * | 2002-07-22 | 2004-02-19 | Sony Corp | 有機膜形成装置 |
US7300038B2 (en) * | 2002-07-23 | 2007-11-27 | Advanced Technology Materials, Inc. | Method and apparatus to help promote contact of gas with vaporized material |
US6921062B2 (en) | 2002-07-23 | 2005-07-26 | Advanced Technology Materials, Inc. | Vaporizer delivery ampoule |
US6797337B2 (en) * | 2002-08-19 | 2004-09-28 | Micron Technology, Inc. | Method for delivering precursors |
JP4352783B2 (ja) | 2002-08-23 | 2009-10-28 | 東京エレクトロン株式会社 | ガス供給系及び処理システム |
US7067170B2 (en) | 2002-09-23 | 2006-06-27 | Eastman Kodak Company | Depositing layers in OLED devices using viscous flow |
KR100473806B1 (ko) * | 2002-09-28 | 2005-03-10 | 한국전자통신연구원 | 유기물 박막 및 유기물 소자를 위한 대면적 유기물 기상증착 장치 및 제조 방법 |
DE10256850A1 (de) * | 2002-12-04 | 2004-06-24 | Basf Ag | Verfahren und Aufdampfung von Verbindung(en) auf einen Träger |
WO2004088729A1 (en) * | 2003-03-26 | 2004-10-14 | Tokyo Electron Limited | Chemical processing system and method |
JP4463492B2 (ja) * | 2003-04-10 | 2010-05-19 | 株式会社半導体エネルギー研究所 | 製造装置 |
US7611587B2 (en) * | 2003-05-16 | 2009-11-03 | Chow Peter P | Thin-film deposition evaporator |
US20050000428A1 (en) * | 2003-05-16 | 2005-01-06 | Shero Eric J. | Method and apparatus for vaporizing and delivering reactant |
DE10324880B4 (de) * | 2003-05-30 | 2007-04-05 | Schott Ag | Verfahren zur Herstellung von OLEDs |
US6837939B1 (en) * | 2003-07-22 | 2005-01-04 | Eastman Kodak Company | Thermal physical vapor deposition source using pellets of organic material for making OLED displays |
DE102004021578A1 (de) * | 2003-09-17 | 2005-04-21 | Aixtron Ag | Verfahren und Vorrichtung zur Abscheidung von ein-oder mehrkomponentigen Schichten und Schichtfolgen unter Verwendung von nicht-kontinuierlicher Injektion von flüssigen und gelösten Ausgangssubstanzen über eine Mehrkanalinjektionseinheit |
US20050079278A1 (en) * | 2003-10-14 | 2005-04-14 | Burrows Paul E. | Method and apparatus for coating an organic thin film on a substrate from a fluid source with continuous feed capability |
KR100513920B1 (ko) * | 2003-10-31 | 2005-09-08 | 주식회사 시스넥스 | 화학기상증착 반응기 |
US7645341B2 (en) * | 2003-12-23 | 2010-01-12 | Lam Research Corporation | Showerhead electrode assembly for plasma processing apparatuses |
JP4607474B2 (ja) * | 2004-02-12 | 2011-01-05 | 東京エレクトロン株式会社 | 成膜装置 |
JP4451684B2 (ja) * | 2004-03-17 | 2010-04-14 | キヤノンアネルバ株式会社 | 真空処理装置 |
US20050281948A1 (en) * | 2004-06-17 | 2005-12-22 | Eastman Kodak Company | Vaporizing temperature sensitive materials |
JP2008506617A (ja) * | 2004-07-15 | 2008-03-06 | アイクストロン、アーゲー | SiとGeを含有する膜の堆積方法 |
JP4545504B2 (ja) * | 2004-07-15 | 2010-09-15 | 株式会社半導体エネルギー研究所 | 膜形成方法、発光装置の作製方法 |
JP2006057173A (ja) * | 2004-08-24 | 2006-03-02 | Tohoku Pioneer Corp | 成膜源、真空成膜装置、有機elパネルの製造方法 |
KR101121417B1 (ko) * | 2004-10-28 | 2012-03-15 | 주성엔지니어링(주) | 표시소자의 제조장치 |
KR100583542B1 (ko) * | 2004-11-06 | 2006-05-26 | 주식회사 아이피에스 | 박막증착장치 |
KR100965408B1 (ko) * | 2004-12-02 | 2010-06-24 | 엘아이지에이디피 주식회사 | Oled용 증착장치 |
US7776456B2 (en) * | 2004-12-03 | 2010-08-17 | Universal Display Corporation | Organic light emitting devices with an emissive region having emissive and non-emissive layers and method of making |
FR2878863B1 (fr) * | 2004-12-07 | 2007-11-23 | Addon Sa | Dispositif de depot sous vide a reservoir de recharge et procede de depot sous vide correspondant. |
JP4560394B2 (ja) * | 2004-12-13 | 2010-10-13 | 長州産業株式会社 | 薄膜形成用分子供給装置 |
US20060134301A1 (en) * | 2004-12-22 | 2006-06-22 | Unilever Bestfoods, North America, Division Of Conopco, Inc. | Method for making a food composition with a preservative free enhancer and a food composition |
EP1752555A1 (de) * | 2005-07-28 | 2007-02-14 | Applied Materials GmbH & Co. KG | Verdampfervorrichtung |
CN101258260B (zh) | 2005-09-06 | 2012-11-21 | 国立大学法人东北大学 | 成膜用材料及成膜用材料的推定方法 |
US20090087545A1 (en) * | 2005-09-20 | 2009-04-02 | Tadahiro Ohmi | Film Forming Apparatus, Evaporating Jig, and Measurement Method |
US8357434B1 (en) * | 2005-12-13 | 2013-01-22 | Lam Research Corporation | Apparatus for the deposition of a conformal film on a substrate and methods therefor |
KR100764627B1 (ko) * | 2006-02-01 | 2007-10-08 | 주식회사 에스에프에이 | 평면디스플레이용 화학 기상 증착장치 |
US20080241805A1 (en) | 2006-08-31 | 2008-10-02 | Q-Track Corporation | System and method for simulated dosimetry using a real time locating system |
KR100849929B1 (ko) * | 2006-09-16 | 2008-08-26 | 주식회사 피에조닉스 | 반응 기체의 분사 속도를 적극적으로 조절하는 샤워헤드를구비한 화학기상 증착 방법 및 장치 |
JP5179739B2 (ja) * | 2006-09-27 | 2013-04-10 | 東京エレクトロン株式会社 | 蒸着装置、蒸着装置の制御装置、蒸着装置の制御方法および蒸着装置の使用方法 |
US8069817B2 (en) * | 2007-03-30 | 2011-12-06 | Lam Research Corporation | Showerhead electrodes and showerhead electrode assemblies having low-particle performance for semiconductor material processing apparatuses |
DE102007020852A1 (de) * | 2007-05-02 | 2008-11-06 | Stein, Ralf | Gasversorgungssystem und Verfahren zur Bereitstellung eines gasförmigen Abscheidungsmediums |
DE102007030499A1 (de) * | 2007-06-30 | 2009-01-08 | Aixtron Ag | Vorrichtung und Verfahren zum Abscheiden von insbesondere dotierten Schichten mittels OVPD oder dergleichen |
US8673080B2 (en) | 2007-10-16 | 2014-03-18 | Novellus Systems, Inc. | Temperature controlled showerhead |
FR2930561B1 (fr) * | 2008-04-28 | 2011-01-14 | Altatech Semiconductor | Dispositif et procede de traitement chimique en phase vapeur. |
US20110070370A1 (en) * | 2008-05-28 | 2011-03-24 | Aixtron Ag | Thermal gradient enhanced chemical vapour deposition (tge-cvd) |
DE102009003781A1 (de) * | 2008-06-03 | 2009-12-10 | Aixtron Ag | Verfahren zum Abscheiden eines dünnschichtigen Polymers in einer Niederdruckgasphase |
DE102008026974A1 (de) * | 2008-06-03 | 2009-12-10 | Aixtron Ag | Verfahren und Vorrichtung zum Abscheiden dünner Schichten aus polymeren Para-Xylylene oder substituiertem Para-Xylylene |
KR100994920B1 (ko) * | 2008-06-05 | 2010-11-17 | 주식회사 소로나 | 기상 자기조립 단분자막 코팅장치 |
US20100266765A1 (en) * | 2009-04-21 | 2010-10-21 | White Carl L | Method and apparatus for growing a thin film onto a substrate |
US9117773B2 (en) * | 2009-08-26 | 2015-08-25 | Asm America, Inc. | High concentration water pulses for atomic layer deposition |
US8801856B2 (en) | 2009-09-08 | 2014-08-12 | Universal Display Corporation | Method and system for high-throughput deposition of patterned organic thin films |
US9449859B2 (en) * | 2009-10-09 | 2016-09-20 | Applied Materials, Inc. | Multi-gas centrally cooled showerhead design |
US9634165B2 (en) * | 2009-11-02 | 2017-04-25 | International Business Machines Corporation | Regeneration method for restoring photovoltaic cell efficiency |
JP2011117030A (ja) * | 2009-12-02 | 2011-06-16 | Ulvac Japan Ltd | 蒸着重合装置 |
TWI372081B (en) | 2010-02-02 | 2012-09-11 | Hermes Epitek Corp | Showerhead |
SG192967A1 (en) | 2011-03-04 | 2013-09-30 | Novellus Systems Inc | Hybrid ceramic showerhead |
DE102011051263B4 (de) * | 2011-06-22 | 2022-08-11 | Aixtron Se | Vorrichtung zur Aerosolerzeugung und Abscheiden einer lichtemittierenden Schicht |
DE102012203212A1 (de) * | 2012-03-01 | 2013-09-05 | Osram Opto Semiconductors Gmbh | Beschichtungsanlage und verfahren zur durchführung eines aufwachsprozesses |
KR20210135341A (ko) | 2012-05-31 | 2021-11-12 | 엔테그리스, 아이엔씨. | 배취식 침착을 위한 고 물질 플럭스를 갖는 유체의 소스 시약-기반 수송 |
US9388494B2 (en) | 2012-06-25 | 2016-07-12 | Novellus Systems, Inc. | Suppression of parasitic deposition in a substrate processing system by suppressing precursor flow and plasma outside of substrate region |
DE102012022744B4 (de) * | 2012-11-21 | 2016-11-24 | Helmholtz-Zentrum Berlin Für Materialien Und Energie Gmbh | Vorrichtung zum Einstellen einer Gasphase in einer Reaktionskammer |
US10316409B2 (en) | 2012-12-21 | 2019-06-11 | Novellus Systems, Inc. | Radical source design for remote plasma atomic layer deposition |
US9399228B2 (en) | 2013-02-06 | 2016-07-26 | Novellus Systems, Inc. | Method and apparatus for purging and plasma suppression in a process chamber |
US10741365B2 (en) * | 2014-05-05 | 2020-08-11 | Lam Research Corporation | Low volume showerhead with porous baffle |
JP5837962B1 (ja) * | 2014-07-08 | 2015-12-24 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法およびガス整流部 |
WO2016037964A1 (de) * | 2014-09-08 | 2016-03-17 | Cynora Gmbh | Verbesserte optisch aktive schicht und verfahren zur herstellung |
US9793096B2 (en) * | 2014-09-12 | 2017-10-17 | Lam Research Corporation | Systems and methods for suppressing parasitic plasma and reducing within-wafer non-uniformity |
DE102014115497A1 (de) * | 2014-10-24 | 2016-05-12 | Aixtron Se | Temperierte Gaszuleitung mit an mehreren Stellen eingespeisten Verdünnungsgasströmen |
JP6442234B2 (ja) * | 2014-11-07 | 2018-12-19 | 株式会社ニューフレアテクノロジー | 気相成長装置、貯留容器および気相成長方法 |
US10378107B2 (en) | 2015-05-22 | 2019-08-13 | Lam Research Corporation | Low volume showerhead with faceplate holes for improved flow uniformity |
US10023959B2 (en) * | 2015-05-26 | 2018-07-17 | Lam Research Corporation | Anti-transient showerhead |
GB201513339D0 (en) * | 2015-07-29 | 2015-09-09 | Pilkington Group Ltd | Coating apparatus |
US10403515B2 (en) * | 2015-09-24 | 2019-09-03 | Applied Materials, Inc. | Loadlock integrated bevel etcher system |
US10662529B2 (en) * | 2016-01-05 | 2020-05-26 | Applied Materials, Inc. | Cooled gas feed block with baffle and nozzle for HDP-CVD |
US9758868B1 (en) | 2016-03-10 | 2017-09-12 | Lam Research Corporation | Plasma suppression behind a showerhead through the use of increased pressure |
US10403474B2 (en) * | 2016-07-11 | 2019-09-03 | Lam Research Corporation | Collar, conical showerheads and/or top plates for reducing recirculation in a substrate processing system |
DE102016118345A1 (de) | 2016-08-01 | 2018-02-01 | Aixtron Se | Konditionierverfahren für einen CVD-Reaktor |
JP2019529691A (ja) | 2016-08-09 | 2019-10-17 | ジングルス・テヒノロギース・アクチェンゲゼルシャフトSingulus Technologies Ag | 基板の同時の回転及び浮揚のための非接触基板キャリア |
US10604841B2 (en) | 2016-12-14 | 2020-03-31 | Lam Research Corporation | Integrated showerhead with thermal control for delivering radical and precursor gas to a downstream chamber to enable remote plasma film deposition |
US11694911B2 (en) * | 2016-12-20 | 2023-07-04 | Lam Research Corporation | Systems and methods for metastable activated radical selective strip and etch using dual plenum showerhead |
TWI649446B (zh) * | 2017-03-15 | 2019-02-01 | 漢民科技股份有限公司 | 應用於半導體設備之可拆卸式噴氣裝置 |
DE102017106431A1 (de) * | 2017-03-24 | 2018-09-27 | Aixtron Se | Vorrichtung und Verfahren zum Herabsetzen des Wasserpartialdrucks in einer OVPD-Beschichtungseinrichtung |
KR102369676B1 (ko) * | 2017-04-10 | 2022-03-04 | 삼성디스플레이 주식회사 | 표시 장치의 제조장치 및 표시 장치의 제조방법 |
KR20200087267A (ko) | 2017-12-08 | 2020-07-20 | 램 리써치 코포레이션 | 리모트 플라즈마 막 증착을 인에이블하도록 다운스트림 챔버로 라디칼 및 전구체 가스를 전달하기 위해 개선된 홀 패턴을 갖는 통합된 샤워헤드 |
KR20190090414A (ko) * | 2018-01-24 | 2019-08-02 | 삼성디스플레이 주식회사 | 증착 장치 |
CN111837221B (zh) * | 2019-02-14 | 2024-03-05 | 株式会社日立高新技术 | 半导体制造装置 |
FI129578B (en) * | 2019-06-28 | 2022-05-13 | Beneq Oy | Atomic layer growth equipment |
WO2021011950A1 (en) | 2019-07-17 | 2021-01-21 | Lam Research Corporation | Modulation of oxidation profile for substrate processing |
DE102019129789A1 (de) * | 2019-11-05 | 2021-05-06 | Aixtron Se | Verfahren zum Abscheiden einer zweidimensionalen Schicht sowie CVD-Reaktor |
TW202237888A (zh) * | 2020-12-19 | 2022-10-01 | 美商蘭姆研究公司 | 利用多個均勻加熱進料容積的原子層沉積 |
DE102021120004A1 (de) | 2021-08-02 | 2023-02-02 | Thyssenkrupp Steel Europe Ag | Beschichtungsanlage zur Beschichtung eines Gegenstands, Verfahren zum Beschichten eines Gegenstands sowie Verwendung |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5186410A (en) | 1991-06-12 | 1993-02-16 | Toews Timothy R | Wire reel mechanism |
US5381605A (en) | 1993-01-08 | 1995-01-17 | Photonics Research Incorporated | Method and apparatus for delivering gas |
US5496410A (en) | 1992-03-10 | 1996-03-05 | Hitachi, Ltd. | Plasma processing apparatus and method of processing substrates by using same apparatus |
US5776254A (en) | 1994-12-28 | 1998-07-07 | Mitsubishi Denki Kabushiki Kaisha | Apparatus for forming thin film by chemical vapor deposition |
US5882410A (en) | 1996-10-01 | 1999-03-16 | Mitsubishi Denki Kabushiki Kaisha | High dielectric constant thin film structure, method for forming high dielectric constant thin film, and apparatus for forming high dielectric constant thin film |
US5989635A (en) | 1996-02-13 | 1999-11-23 | Mitsubishi Denki Kabushiki Kaisha | High dielectric constant thin film structure, method for forming high dielectric constant thin film and apparatus for forming high dielectric constant thin film |
Family Cites Families (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62273714A (ja) * | 1986-05-21 | 1987-11-27 | Clarion Co Ltd | 有機金属ガス供給方法および装置 |
JPH04114728A (ja) * | 1990-09-04 | 1992-04-15 | Matsushita Electric Ind Co Ltd | 液体ソース供給装置 |
US5447568A (en) * | 1991-12-26 | 1995-09-05 | Canon Kabushiki Kaisha | Chemical vapor deposition method and apparatus making use of liquid starting material |
FR2707671B1 (fr) | 1993-07-12 | 1995-09-15 | Centre Nat Rech Scient | Procédé et dispositif d'introduction de précurseurs dans une enceinte de dépôt chimique en phase vapeur. |
JPH0781965A (ja) * | 1993-07-22 | 1995-03-28 | Sumitomo Electric Ind Ltd | ガス生成装置並びに光導波路及び光ファイバ母材を製造する方法及び装置 |
EP1026549B1 (en) * | 1994-04-08 | 2007-02-28 | Canon Kabushiki Kaisha | Processing system adapted for semiconductor device manufacture |
GB9411911D0 (en) | 1994-06-14 | 1994-08-03 | Swan Thomas & Co Ltd | Improvements in or relating to chemical vapour deposition |
US5410178A (en) * | 1994-08-22 | 1995-04-25 | Northwestern University | Semiconductor films |
JPH08176826A (ja) * | 1994-12-28 | 1996-07-09 | Mitsubishi Electric Corp | Cvd法による薄膜の堆積装置及び堆積方法並びに該堆積装置又は該堆積方法で用いられるcvd原料及び液体原料容器 |
JP3360098B2 (ja) * | 1995-04-20 | 2002-12-24 | 東京エレクトロン株式会社 | 処理装置のシャワーヘッド構造 |
US5554220A (en) | 1995-05-19 | 1996-09-10 | The Trustees Of Princeton University | Method and apparatus using organic vapor phase deposition for the growth of organic thin films with large optical non-linearities |
JP3585633B2 (ja) * | 1996-03-19 | 2004-11-04 | 株式会社アルバック | 蒸着重合装置 |
US5997642A (en) | 1996-05-21 | 1999-12-07 | Symetrix Corporation | Method and apparatus for misted deposition of integrated circuit quality thin films |
US5976261A (en) | 1996-07-11 | 1999-11-02 | Cvc Products, Inc. | Multi-zone gas injection apparatus and method for microelectronics manufacturing equipment |
US6090210A (en) | 1996-07-24 | 2000-07-18 | Applied Materials, Inc. | Multi-zone gas flow control in a process chamber |
US5804259A (en) * | 1996-11-07 | 1998-09-08 | Applied Materials, Inc. | Method and apparatus for depositing a multilayered low dielectric constant film |
US6019848A (en) * | 1996-11-13 | 2000-02-01 | Applied Materials, Inc. | Lid assembly for high temperature processing chamber |
US5935334A (en) * | 1996-11-13 | 1999-08-10 | Applied Materials, Inc. | Substrate processing apparatus with bottom-mounted remote plasma system |
JP2001506803A (ja) * | 1996-11-27 | 2001-05-22 | エムコア・コーポレイション | 化学蒸着装置 |
US6035101A (en) * | 1997-02-12 | 2000-03-07 | Applied Materials, Inc. | High temperature multi-layered alloy heater assembly and related methods |
JPH10330910A (ja) * | 1997-06-04 | 1998-12-15 | Toray Ind Inc | シャドーマスクおよびその製造方法 |
US5882416A (en) * | 1997-06-19 | 1999-03-16 | Advanced Technology Materials, Inc. | Liquid delivery system, heater apparatus for liquid delivery system, and vaporizer |
US6258170B1 (en) * | 1997-09-11 | 2001-07-10 | Applied Materials, Inc. | Vaporization and deposition apparatus |
US6337102B1 (en) * | 1997-11-17 | 2002-01-08 | The Trustees Of Princeton University | Low pressure vapor phase deposition of organic thin films |
DE19813523C2 (de) | 1998-03-26 | 2000-03-02 | Aixtron Ag | CVD-Reaktor und dessen Verwendung |
DE19980266D2 (de) * | 1998-02-18 | 2000-05-25 | Aixtron Ag | CVD-Reaktor und dessen Verwendung |
JP2000001783A (ja) * | 1998-06-15 | 2000-01-07 | Sony Corp | 成膜装置およびそのクリーニング方法 |
US6148761A (en) * | 1998-06-16 | 2000-11-21 | Applied Materials, Inc. | Dual channel gas distribution plate |
US6309465B1 (en) * | 1999-02-18 | 2001-10-30 | Aixtron Ag. | CVD reactor |
DE50100603D1 (de) * | 2000-02-04 | 2003-10-16 | Aixtron Ag | Vorrichtung und verfahren zum abscheiden einer oder mehrerer schichten auf ein substrat |
-
2000
- 2000-02-16 DE DE10007059A patent/DE10007059A1/de not_active Withdrawn
-
2001
- 2001-02-15 KR KR1020027010576A patent/KR100780142B1/ko active IP Right Grant
- 2001-02-15 DE DE50100443T patent/DE50100443D1/de not_active Expired - Lifetime
- 2001-02-15 WO PCT/EP2001/001698 patent/WO2001061071A2/de active IP Right Grant
- 2001-02-15 EP EP01903774A patent/EP1255876B1/de not_active Expired - Lifetime
- 2001-02-15 AU AU2001231753A patent/AU2001231753A1/en not_active Abandoned
- 2001-02-15 JP JP2001559904A patent/JP4789384B2/ja not_active Expired - Fee Related
- 2001-02-15 AT AT01903774T patent/ATE246268T1/de not_active IP Right Cessation
- 2001-02-16 TW TW090103529A patent/TWI227748B/zh not_active IP Right Cessation
-
2002
- 2002-08-09 US US10/215,858 patent/US7201942B2/en not_active Expired - Lifetime
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5186410A (en) | 1991-06-12 | 1993-02-16 | Toews Timothy R | Wire reel mechanism |
US5496410A (en) | 1992-03-10 | 1996-03-05 | Hitachi, Ltd. | Plasma processing apparatus and method of processing substrates by using same apparatus |
US5381605A (en) | 1993-01-08 | 1995-01-17 | Photonics Research Incorporated | Method and apparatus for delivering gas |
US5776254A (en) | 1994-12-28 | 1998-07-07 | Mitsubishi Denki Kabushiki Kaisha | Apparatus for forming thin film by chemical vapor deposition |
US5989635A (en) | 1996-02-13 | 1999-11-23 | Mitsubishi Denki Kabushiki Kaisha | High dielectric constant thin film structure, method for forming high dielectric constant thin film and apparatus for forming high dielectric constant thin film |
US5882410A (en) | 1996-10-01 | 1999-03-16 | Mitsubishi Denki Kabushiki Kaisha | High dielectric constant thin film structure, method for forming high dielectric constant thin film, and apparatus for forming high dielectric constant thin film |
Also Published As
Publication number | Publication date |
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JP4789384B2 (ja) | 2011-10-12 |
WO2001061071B1 (de) | 2002-11-14 |
JP2003522839A (ja) | 2003-07-29 |
EP1255876A2 (de) | 2002-11-13 |
EP1255876B1 (de) | 2003-07-30 |
US7201942B2 (en) | 2007-04-10 |
ATE246268T1 (de) | 2003-08-15 |
KR20020089350A (ko) | 2002-11-29 |
US20030054099A1 (en) | 2003-03-20 |
DE50100443D1 (de) | 2003-09-04 |
AU2001231753A1 (en) | 2001-08-27 |
DE10007059A1 (de) | 2001-08-23 |
WO2001061071A2 (de) | 2001-08-23 |
TWI227748B (en) | 2005-02-11 |
WO2001061071A3 (de) | 2002-06-20 |
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