KR100708329B1 - Ｉｃ 테스터 - Google Patents

Ｉｃ 테스터 Download PDF

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Publication number
KR100708329B1
KR100708329B1 KR1020050084662A KR20050084662A KR100708329B1 KR 100708329 B1 KR100708329 B1 KR 100708329B1 KR 1020050084662 A KR1020050084662 A KR 1020050084662A KR 20050084662 A KR20050084662 A KR 20050084662A KR 100708329 B1 KR100708329 B1 KR 100708329B1
Authority
KR
South Korea
Prior art keywords
output
voltage
converter
data
memory
Prior art date
Application number
KR1020050084662A
Other languages
English (en)
Korean (ko)
Other versions
KR20060051204A (ko
Inventor
다쿠야 요코스카
Original Assignee
요코가와 덴키 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 요코가와 덴키 가부시키가이샤 filed Critical 요코가와 덴키 가부시키가이샤
Publication of KR20060051204A publication Critical patent/KR20060051204A/ko
Application granted granted Critical
Publication of KR100708329B1 publication Critical patent/KR100708329B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31932—Comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
KR1020050084662A 2004-10-14 2005-09-12 Ｉｃ 테스터 KR100708329B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004299546 2004-10-14
JPJP-P-2004-00299546 2004-10-14

Publications (2)

Publication Number Publication Date
KR20060051204A KR20060051204A (ko) 2006-05-19
KR100708329B1 true KR100708329B1 (ko) 2007-04-17

Family

ID=36706835

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020050084662A KR100708329B1 (ko) 2004-10-14 2005-09-12 Ｉｃ 테스터

Country Status (3)

Country Link
KR (1) KR100708329B1 (zh)
CN (1) CN100465656C (zh)
TW (1) TWI276823B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101354414B (zh) * 2007-07-26 2011-03-16 联华电子股份有限公司 具有多阶输出功能的缺陷检测系统及方法
CN104483527A (zh) * 2014-12-23 2015-04-01 浪潮电子信息产业股份有限公司 一种电源分配板电压监测的装置及方法
CN107861055B (zh) * 2017-12-15 2020-04-07 中国电子产品可靠性与环境试验研究所 集成电路动态输出性能测定方法、装置和系统
CN110488176A (zh) * 2019-08-02 2019-11-22 上海芯旺微电子技术有限公司 一种集成电路测试板及其使用方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990063014A (ko) * 1997-12-12 1999-07-26 오우라 히로시 Ic시험장치의 전압인가 전류측정회로
KR20010042313A (ko) * 1998-04-01 2001-05-25 칼 하인쯔 호르닝어 전자장치의 두개의 서로 다른 공급 전압용 전압-모니터링장치
KR20040025189A (ko) * 2002-09-18 2004-03-24 삼성전자주식회사 고전압 집적 회로 장치를 테스트할 수 있는 로직 테스터장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1206467A (zh) * 1996-11-15 1999-01-27 株式会社爱德万测试 集成电路设备测试器
GB2338311B (en) * 1997-11-20 2002-04-17 Advantest Corp IC testing apparatus
JP3554767B2 (ja) * 1999-07-02 2004-08-18 横河電機株式会社 半導体テスト装置
JP3558964B2 (ja) * 1999-07-23 2004-08-25 シャープ株式会社 半導体集積回路の検査装置及びその検査方法
JP3617621B2 (ja) * 2000-09-29 2005-02-09 シャープ株式会社 半導体集積回路の検査装置及びその検査方法
CN1459027A (zh) * 2001-03-13 2003-11-26 皇家菲利浦电子有限公司 具有改进的可靠性的集成电路测试装置
JP2003240821A (ja) * 2002-02-14 2003-08-27 Yokogawa Electric Corp Ｉｃテスタ
JP3983123B2 (ja) * 2002-07-11 2007-09-26 シャープ株式会社 半導体検査装置及び半導体検査方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990063014A (ko) * 1997-12-12 1999-07-26 오우라 히로시 Ic시험장치의 전압인가 전류측정회로
KR20010042313A (ko) * 1998-04-01 2001-05-25 칼 하인쯔 호르닝어 전자장치의 두개의 서로 다른 공급 전압용 전압-모니터링장치
KR20040025189A (ko) * 2002-09-18 2004-03-24 삼성전자주식회사 고전압 집적 회로 장치를 테스트할 수 있는 로직 테스터장치

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
1019990063014
1020010042313
1020040025189

Also Published As

Publication number Publication date
TW200612106A (en) 2006-04-16
TWI276823B (en) 2007-03-21
CN100465656C (zh) 2009-03-04
CN1760689A (zh) 2006-04-19
KR20060051204A (ko) 2006-05-19

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