TW200612106A - IC tester - Google Patents

IC tester

Info

Publication number
TW200612106A
TW200612106A TW094135483A TW94135483A TW200612106A TW 200612106 A TW200612106 A TW 200612106A TW 094135483 A TW094135483 A TW 094135483A TW 94135483 A TW94135483 A TW 94135483A TW 200612106 A TW200612106 A TW 200612106A
Authority
TW
Taiwan
Prior art keywords
converter
tester
output
under test
device under
Prior art date
Application number
TW094135483A
Other languages
Chinese (zh)
Other versions
TWI276823B (en
Inventor
Takuya Yokosuka
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Publication of TW200612106A publication Critical patent/TW200612106A/en
Application granted granted Critical
Publication of TWI276823B publication Critical patent/TWI276823B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31932—Comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

This invention aims to provide an IC tester which can achieve a reduction in testing time and the invention provides improvements to an IC tester which tests a device under test and which outputs an multistage pressure. The apparatus of the present invention is characterized by including A/D converter which inputs output from the device under test, a memory which stores output from the A/D converter, and a digital comparator which compares output from the A/D converter and pressure data for comparison.
TW094135483A 2004-10-14 2005-10-12 IC tester TWI276823B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004299546 2004-10-14

Publications (2)

Publication Number Publication Date
TW200612106A true TW200612106A (en) 2006-04-16
TWI276823B TWI276823B (en) 2007-03-21

Family

ID=36706835

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094135483A TWI276823B (en) 2004-10-14 2005-10-12 IC tester

Country Status (3)

Country Link
KR (1) KR100708329B1 (en)
CN (1) CN100465656C (en)
TW (1) TWI276823B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101354414B (en) * 2007-07-26 2011-03-16 联华电子股份有限公司 System and method for detecting defect with multi-step output function
CN104483527A (en) * 2014-12-23 2015-04-01 浪潮电子信息产业股份有限公司 Device and method for monitoring voltage of power distribution board
CN107861055B (en) * 2017-12-15 2020-04-07 中国电子产品可靠性与环境试验研究所 Method, device and system for measuring dynamic output performance of integrated circuit
CN110488176A (en) * 2019-08-02 2019-11-22 上海芯旺微电子技术有限公司 A kind of integrated circuit testing plate and its application method

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1206467A (en) * 1996-11-15 1999-01-27 株式会社爱德万测试 Integrated circuit device tester
US6323668B1 (en) * 1997-11-20 2001-11-27 Advantest Corporation IC testing device
JP3392029B2 (en) * 1997-12-12 2003-03-31 株式会社アドバンテスト IC tester voltage applied current measuring circuit
DE19814696C1 (en) * 1998-04-01 1999-07-08 Siemens Ag Voltage monitoring device for micro-controller supply voltages, e.g. for engine control
JP3554767B2 (en) * 1999-07-02 2004-08-18 横河電機株式会社 Semiconductor test equipment
JP3558964B2 (en) * 1999-07-23 2004-08-25 シャープ株式会社 Semiconductor integrated circuit inspection apparatus and inspection method
JP3617621B2 (en) * 2000-09-29 2005-02-09 シャープ株式会社 Semiconductor integrated circuit inspection apparatus and inspection method thereof
WO2002073225A1 (en) * 2001-03-13 2002-09-19 Koninklijke Philips Electronics N.V. Integrated circuit testing device with improved reliability
JP2003240821A (en) * 2002-02-14 2003-08-27 Yokogawa Electric Corp Ic tester
JP3983123B2 (en) * 2002-07-11 2007-09-26 シャープ株式会社 Semiconductor inspection apparatus and semiconductor inspection method
KR20040025189A (en) * 2002-09-18 2004-03-24 삼성전자주식회사 Logic tester apparatus for testing high-voltage integrated circuit device

Also Published As

Publication number Publication date
TWI276823B (en) 2007-03-21
KR100708329B1 (en) 2007-04-17
CN100465656C (en) 2009-03-04
CN1760689A (en) 2006-04-19
KR20060051204A (en) 2006-05-19

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees