KR100474953B1 - 반도체장치및그제조방법 - Google Patents
반도체장치및그제조방법 Download PDFInfo
- Publication number
- KR100474953B1 KR100474953B1 KR1019960005070A KR19960005070A KR100474953B1 KR 100474953 B1 KR100474953 B1 KR 100474953B1 KR 1019960005070 A KR1019960005070 A KR 1019960005070A KR 19960005070 A KR19960005070 A KR 19960005070A KR 100474953 B1 KR100474953 B1 KR 100474953B1
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- conductive
- wiring
- insulating layer
- conductive material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0149—Manufacturing their interconnections or electrodes, e.g. source or drain electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/5226—Via connections in a multilevel interconnection structure
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
- H10B12/48—Data lines or contacts therefor
- H10B12/482—Bit lines
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP95-064905 | 1995-02-28 | ||
| JP7064905A JPH08236622A (ja) | 1995-02-28 | 1995-02-28 | 半導体装置及びその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR960032687A KR960032687A (ko) | 1996-09-17 |
| KR100474953B1 true KR100474953B1 (ko) | 2005-05-18 |
Family
ID=13271550
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019960005070A Expired - Fee Related KR100474953B1 (ko) | 1995-02-28 | 1996-02-28 | 반도체장치및그제조방법 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPH08236622A (enExample) |
| KR (1) | KR100474953B1 (enExample) |
| TW (1) | TW308736B (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100578117B1 (ko) * | 1998-12-21 | 2006-09-27 | 삼성전자주식회사 | 반도체 장치의 배선 형성 방법 |
| KR100727449B1 (ko) * | 2000-09-25 | 2007-06-13 | 하이닉스 세미컨덕터 매뉴팩쳐링 아메리카 인코포레이티드 | 고도전성 게이트, 로컬 인터커넥트 또는 커패시터 노드를 갖는 집적 장치 |
| KR100868607B1 (ko) * | 2008-02-21 | 2008-11-13 | 가부시키가이샤 히타치세이사쿠쇼 | 반도체 장치 및 그 제조 방법 |
| KR101885766B1 (ko) * | 2016-05-10 | 2018-08-06 | 한국과학기술원 | 스트레인 센서 및 이의 제조방법 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4833096A (en) * | 1988-01-19 | 1989-05-23 | Atmel Corporation | EEPROM fabrication process |
| JPH0445571A (ja) * | 1990-06-13 | 1992-02-14 | Oki Electric Ind Co Ltd | 半導体装置の製造方法 |
| US5210053A (en) * | 1991-03-06 | 1993-05-11 | Nec Corporation | Method for fabricating semiconductor device |
| JPH05343401A (ja) * | 1992-06-12 | 1993-12-24 | Fujitsu Ltd | 半導体装置 |
| JPH06163711A (ja) * | 1992-11-20 | 1994-06-10 | Mitsubishi Electric Corp | 半導体装置及びその製造方法 |
-
1995
- 1995-02-28 JP JP7064905A patent/JPH08236622A/ja active Pending
-
1996
- 1996-02-28 KR KR1019960005070A patent/KR100474953B1/ko not_active Expired - Fee Related
- 1996-04-12 TW TW085104321A patent/TW308736B/zh not_active IP Right Cessation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4833096A (en) * | 1988-01-19 | 1989-05-23 | Atmel Corporation | EEPROM fabrication process |
| JPH0445571A (ja) * | 1990-06-13 | 1992-02-14 | Oki Electric Ind Co Ltd | 半導体装置の製造方法 |
| US5210053A (en) * | 1991-03-06 | 1993-05-11 | Nec Corporation | Method for fabricating semiconductor device |
| JPH05343401A (ja) * | 1992-06-12 | 1993-12-24 | Fujitsu Ltd | 半導体装置 |
| JPH06163711A (ja) * | 1992-11-20 | 1994-06-10 | Mitsubishi Electric Corp | 半導体装置及びその製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW308736B (enExample) | 1997-06-21 |
| JPH08236622A (ja) | 1996-09-13 |
| KR960032687A (ko) | 1996-09-17 |
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