KR0172816B1 - 마스크 제조방법 - Google Patents
마스크 제조방법 Download PDFInfo
- Publication number
- KR0172816B1 KR0172816B1 KR1019910000461A KR910000461A KR0172816B1 KR 0172816 B1 KR0172816 B1 KR 0172816B1 KR 1019910000461 A KR1019910000461 A KR 1019910000461A KR 910000461 A KR910000461 A KR 910000461A KR 0172816 B1 KR0172816 B1 KR 0172816B1
- Authority
- KR
- South Korea
- Prior art keywords
- silicon
- chromium
- mask
- electron beam
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/26—Phase shift masks [PSM]; PSM blanks; Preparation thereof
- G03F1/29—Rim PSM or outrigger PSM; Preparation thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019910000461A KR0172816B1 (ko) | 1991-01-14 | 1991-01-14 | 마스크 제조방법 |
| TW080110098A TW276352B (enExample) | 1991-01-14 | 1991-12-24 | |
| DE4200647A DE4200647C2 (de) | 1991-01-14 | 1992-01-13 | Verfahren zur Herstellung einer Maske |
| US07/821,938 US5597666A (en) | 1991-01-14 | 1992-01-14 | Method for fabrication of a mask |
| JP2333292A JP2824817B2 (ja) | 1991-01-14 | 1992-01-14 | マスクの製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019910000461A KR0172816B1 (ko) | 1991-01-14 | 1991-01-14 | 마스크 제조방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR920015428A KR920015428A (ko) | 1992-08-26 |
| KR0172816B1 true KR0172816B1 (ko) | 1999-03-30 |
Family
ID=19309740
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019910000461A Expired - Fee Related KR0172816B1 (ko) | 1991-01-14 | 1991-01-14 | 마스크 제조방법 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5597666A (enExample) |
| JP (1) | JP2824817B2 (enExample) |
| KR (1) | KR0172816B1 (enExample) |
| DE (1) | DE4200647C2 (enExample) |
| TW (1) | TW276352B (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100328448B1 (ko) * | 1999-12-29 | 2002-03-16 | 박종섭 | 반도체 소자의 위상반전 마스크 제조방법 |
| KR20210095515A (ko) * | 2020-01-23 | 2021-08-02 | 김용석 | 원 스텝 습식 에칭 기술을 이용한 oled 패널 제조용 파인 메탈 마스크 제조 방법 |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR0152952B1 (ko) * | 1995-05-13 | 1998-10-01 | 문정환 | 위상반전 마스크 및 그 제조방법 |
| KR0166825B1 (ko) * | 1996-06-26 | 1999-01-15 | 문정환 | 위상반전 마스크의 제조 방법 |
| KR100790751B1 (ko) * | 2006-12-06 | 2008-01-02 | 삼성전기주식회사 | 수정판 제조방법 |
| TWI707195B (zh) * | 2020-02-14 | 2020-10-11 | 力晶積成電子製造股份有限公司 | 相位轉移光罩的製造方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4360586A (en) * | 1979-05-29 | 1982-11-23 | Massachusetts Institute Of Technology | Spatial period division exposing |
| DE3168688D1 (en) * | 1980-11-06 | 1985-03-14 | Toshiba Kk | Method for manufacturing a semiconductor device |
| JPS6195356A (ja) * | 1984-10-16 | 1986-05-14 | Mitsubishi Electric Corp | フオトマスクブランク |
| US4890309A (en) * | 1987-02-25 | 1989-12-26 | Massachusetts Institute Of Technology | Lithography mask with a π-phase shifting attenuator |
| JP2710967B2 (ja) * | 1988-11-22 | 1998-02-10 | 株式会社日立製作所 | 集積回路装置の製造方法 |
| JPH03211554A (ja) * | 1990-01-17 | 1991-09-17 | Fujitsu Ltd | 位相シフトマスクの製造方法 |
| JPH04127149A (ja) * | 1990-09-19 | 1992-04-28 | Hitachi Ltd | ホトマスク及びその製造方法 |
-
1991
- 1991-01-14 KR KR1019910000461A patent/KR0172816B1/ko not_active Expired - Fee Related
- 1991-12-24 TW TW080110098A patent/TW276352B/zh active
-
1992
- 1992-01-13 DE DE4200647A patent/DE4200647C2/de not_active Expired - Fee Related
- 1992-01-14 US US07/821,938 patent/US5597666A/en not_active Expired - Fee Related
- 1992-01-14 JP JP2333292A patent/JP2824817B2/ja not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100328448B1 (ko) * | 1999-12-29 | 2002-03-16 | 박종섭 | 반도체 소자의 위상반전 마스크 제조방법 |
| KR20210095515A (ko) * | 2020-01-23 | 2021-08-02 | 김용석 | 원 스텝 습식 에칭 기술을 이용한 oled 패널 제조용 파인 메탈 마스크 제조 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR920015428A (ko) | 1992-08-26 |
| JP2824817B2 (ja) | 1998-11-18 |
| DE4200647A1 (de) | 1992-07-23 |
| DE4200647C2 (de) | 1994-03-10 |
| US5597666A (en) | 1997-01-28 |
| TW276352B (enExample) | 1996-05-21 |
| JPH06138637A (ja) | 1994-05-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR0172816B1 (ko) | 마스크 제조방법 | |
| US5495959A (en) | Method of making substractive rim phase shifting masks | |
| JP3531666B2 (ja) | 位相シフトマスク及びその製造方法 | |
| KR100219570B1 (ko) | 하프톤 위상 반전 마스크 및 그 제조방법 | |
| JP2002318449A (ja) | 位相シフト・マスク | |
| JP2002156739A (ja) | 位相シフトマスクブランク及び位相シフトマスク | |
| KR20020001230A (ko) | 반도체 소자의 위상반전 마스크 제조방법 | |
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| JP3257130B2 (ja) | エッジ強調型位相シフトマスクの製造方法 | |
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| KR0143346B1 (ko) | 위상반전 마스크 제조방법 | |
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| JPH05289308A (ja) | フォトマスクの製造方法 | |
| JPH05197127A (ja) | 位相シフトマスク | |
| KR20020058287A (ko) | 반도체 소자의 위상 반전 마스크 제조방법 | |
| KR100226738B1 (ko) | 마스크의 제조 방법 | |
| KR100406584B1 (ko) | 위상 반전 마스크의 제조 방법 | |
| JPH04258955A (ja) | 位相シフトマスクの製造方法 | |
| JPH11295874A (ja) | 位相シフトマスクの製造方法 | |
| US6379849B1 (en) | Method for forming binary intensity masks | |
| KR970004479B1 (ko) | 위상반전마스크 및 그 제조방법 |
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