JPS645461B2 - - Google Patents

Info

Publication number
JPS645461B2
JPS645461B2 JP16364080A JP16364080A JPS645461B2 JP S645461 B2 JPS645461 B2 JP S645461B2 JP 16364080 A JP16364080 A JP 16364080A JP 16364080 A JP16364080 A JP 16364080A JP S645461 B2 JPS645461 B2 JP S645461B2
Authority
JP
Japan
Prior art keywords
output
signal
input
output signal
switching means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP16364080A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5787150A (en
Inventor
Kazuo Nomura
Takanori Senoo
Yoryasu Takeguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP16364080A priority Critical patent/JPS5787150A/ja
Publication of JPS5787150A publication Critical patent/JPS5787150A/ja
Publication of JPS645461B2 publication Critical patent/JPS645461B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP16364080A 1980-11-19 1980-11-19 Large-scale integrated circuit Granted JPS5787150A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16364080A JPS5787150A (en) 1980-11-19 1980-11-19 Large-scale integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16364080A JPS5787150A (en) 1980-11-19 1980-11-19 Large-scale integrated circuit

Publications (2)

Publication Number Publication Date
JPS5787150A JPS5787150A (en) 1982-05-31
JPS645461B2 true JPS645461B2 (el) 1989-01-30

Family

ID=15777777

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16364080A Granted JPS5787150A (en) 1980-11-19 1980-11-19 Large-scale integrated circuit

Country Status (1)

Country Link
JP (1) JPS5787150A (el)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02106849U (el) * 1989-02-09 1990-08-24

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58145140A (ja) * 1982-02-23 1983-08-29 Nec Corp 半導体特性測定装置
JPS604232A (ja) * 1983-06-22 1985-01-10 Toshiba Corp Ｌｓｉのテストモ−ド指定方式
US4553049A (en) * 1983-10-07 1985-11-12 International Business Machines Corporation Oscillation prevention during testing of integrated circuit logic chips
JPS60150662A (ja) * 1984-01-18 1985-08-08 Hitachi Ltd 半導体集積論理装置
JP2590105B2 (ja) * 1987-05-30 1997-03-12 株式会社東芝 半導体集積回路装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02106849U (el) * 1989-02-09 1990-08-24

Also Published As

Publication number Publication date
JPS5787150A (en) 1982-05-31

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