JPS6319811Y2 - - Google Patents
Info
- Publication number
- JPS6319811Y2 JPS6319811Y2 JP1980150109U JP15010980U JPS6319811Y2 JP S6319811 Y2 JPS6319811 Y2 JP S6319811Y2 JP 1980150109 U JP1980150109 U JP 1980150109U JP 15010980 U JP15010980 U JP 15010980U JP S6319811 Y2 JPS6319811 Y2 JP S6319811Y2
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- resistance value
- resistance
- terminals
- comparator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007689 inspection Methods 0.000 claims description 21
- 238000012360 testing method Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 5
- 238000007796 conventional method Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1980150109U JPS6319811Y2 (de) | 1980-10-20 | 1980-10-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1980150109U JPS6319811Y2 (de) | 1980-10-20 | 1980-10-20 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5772178U JPS5772178U (de) | 1982-05-01 |
| JPS6319811Y2 true JPS6319811Y2 (de) | 1988-06-02 |
Family
ID=29509486
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1980150109U Expired JPS6319811Y2 (de) | 1980-10-20 | 1980-10-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6319811Y2 (de) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60111278U (ja) * | 1983-12-29 | 1985-07-27 | 日本電気ホームエレクトロニクス株式会社 | オ−プン／シヨ−トインサ−キツトテスタ |
| JPH0422307Y2 (de) * | 1984-12-14 | 1992-05-21 |
-
1980
- 1980-10-20 JP JP1980150109U patent/JPS6319811Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5772178U (de) | 1982-05-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110554273A (zh) | 一种pcba短路点的检测方法 | |
| JPS6319811Y2 (de) | ||
| JPH09203764A (ja) | 四端子測定法による接続不良リードの有無判別方法 | |
| US6815969B2 (en) | Semiconductor inspection device capable of performing various inspections on a semiconductor device | |
| JPH10170585A (ja) | 回路基板検査方法 | |
| KR100355716B1 (ko) | 인서키트테스터에서의 저저항 측정방법 | |
| JP2730504B2 (ja) | 試験用プローブピンの接触不良判断方法およびインサーキットテスタ | |
| JPH0411180Y2 (de) | ||
| JP3150414B2 (ja) | 半導体装置の再検査方法及び半導体装置の検査装置 | |
| JPH0697254B2 (ja) | 回路基板検査方法 | |
| KR0177987B1 (ko) | 복수 개의 반도체 칩 테스트 방법 | |
| JP2983109B2 (ja) | 抵抗検査装置 | |
| JP2601849Y2 (ja) | Ｌｓｉテスタ | |
| JPH01100474A (ja) | 回路基板検査装置 | |
| JP2003255007A (ja) | 回路配線検査方法およびその装置 | |
| JPS5853839A (ja) | 集積回路 | |
| JPS63256872A (ja) | ２点間測定式導通試験器 | |
| JPH10112651A (ja) | ディジタルテスタを用いたｄ／ａ変換器の検査方法 | |
| JPS61134684A (ja) | Ｉｃテスタ | |
| JPS58171830A (ja) | 集積回路装置の分類方法 | |
| JPS62294984A (ja) | 半導体検査装置 | |
| JPH01242973A (ja) | 回路基板パターンのオープン・ショート検査方法 | |
| JPH04177855A (ja) | 集積回路装置の検査方法 | |
| JPH0326973A (ja) | 集積回路検査装置の検査方法 | |
| JPS5965473A (ja) | 半導体基板 |