JPS6248862B2 - - Google Patents

Info

Publication number
JPS6248862B2
JPS6248862B2 JP57044706A JP4470682A JPS6248862B2 JP S6248862 B2 JPS6248862 B2 JP S6248862B2 JP 57044706 A JP57044706 A JP 57044706A JP 4470682 A JP4470682 A JP 4470682A JP S6248862 B2 JPS6248862 B2 JP S6248862B2
Authority
JP
Japan
Prior art keywords
signal
internal
output
check
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57044706A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58163048A (ja
Inventor
Fumio Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP57044706A priority Critical patent/JPS58163048A/ja
Publication of JPS58163048A publication Critical patent/JPS58163048A/ja
Publication of JPS6248862B2 publication Critical patent/JPS6248862B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP57044706A 1982-03-23 1982-03-23 内部信号チエツク機能付集積回路 Granted JPS58163048A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57044706A JPS58163048A (ja) 1982-03-23 1982-03-23 内部信号チエツク機能付集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57044706A JPS58163048A (ja) 1982-03-23 1982-03-23 内部信号チエツク機能付集積回路

Publications (2)

Publication Number Publication Date
JPS58163048A JPS58163048A (ja) 1983-09-27
JPS6248862B2 true JPS6248862B2 (enrdf_load_stackoverflow) 1987-10-15

Family

ID=12698857

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57044706A Granted JPS58163048A (ja) 1982-03-23 1982-03-23 内部信号チエツク機能付集積回路

Country Status (1)

Country Link
JP (1) JPS58163048A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61266973A (ja) * 1985-05-22 1986-11-26 Fujitsu Ltd バ−ンイン試験機用チエツク装置
JP2007157944A (ja) * 2005-12-02 2007-06-21 Matsushita Electric Ind Co Ltd 半導体集積回路装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6029980B2 (ja) * 1978-06-13 1985-07-13 富士通株式会社 テスト・モ−ド設定機能をもつワンチツプ・マイクロ・コンピユ−タ
JPS5644867A (en) * 1979-09-21 1981-04-24 Nippon Telegr & Teleph Corp <Ntt> Logic integrated circuit

Also Published As

Publication number Publication date
JPS58163048A (ja) 1983-09-27

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