JPS62123098A - シリコン単結晶の製造方法 - Google Patents

シリコン単結晶の製造方法

Info

Publication number
JPS62123098A
JPS62123098A JP26135185A JP26135185A JPS62123098A JP S62123098 A JPS62123098 A JP S62123098A JP 26135185 A JP26135185 A JP 26135185A JP 26135185 A JP26135185 A JP 26135185A JP S62123098 A JPS62123098 A JP S62123098A
Authority
JP
Japan
Prior art keywords
gas
silicon single
single crystal
oxidation
heat treatment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP26135185A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0561240B2 (enrdf_load_stackoverflow
Inventor
Hiroshi Shirai
宏 白井
Norihei Takai
高井 法平
Yoshio Kirino
桐野 好生
Kenji Akai
赤井 賢二
Takeshi Kon
今 武志
Hiromitsu Nakanishi
中西 宏円
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Original Assignee
Toshiba Ceramics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Ceramics Co Ltd filed Critical Toshiba Ceramics Co Ltd
Priority to JP26135185A priority Critical patent/JPS62123098A/ja
Publication of JPS62123098A publication Critical patent/JPS62123098A/ja
Publication of JPH0561240B2 publication Critical patent/JPH0561240B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)
JP26135185A 1985-11-22 1985-11-22 シリコン単結晶の製造方法 Granted JPS62123098A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26135185A JPS62123098A (ja) 1985-11-22 1985-11-22 シリコン単結晶の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26135185A JPS62123098A (ja) 1985-11-22 1985-11-22 シリコン単結晶の製造方法

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP6232516A Division JP2652344B2 (ja) 1994-09-02 1994-09-02 シリコンウエーハ
JP6234476A Division JP2652346B2 (ja) 1994-09-05 1994-09-05 シリコンウエーハの製造方法

Publications (2)

Publication Number Publication Date
JPS62123098A true JPS62123098A (ja) 1987-06-04
JPH0561240B2 JPH0561240B2 (enrdf_load_stackoverflow) 1993-09-03

Family

ID=17360634

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26135185A Granted JPS62123098A (ja) 1985-11-22 1985-11-22 シリコン単結晶の製造方法

Country Status (1)

Country Link
JP (1) JPS62123098A (enrdf_load_stackoverflow)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01183825A (ja) * 1988-01-19 1989-07-21 Sanyo Electric Co Ltd 単結晶シリコン膜の形成方法
JPH03233936A (ja) * 1990-02-08 1991-10-17 Mitsubishi Materials Corp シリコンウエーハの製造方法
JPH04285099A (ja) * 1991-03-15 1992-10-09 Shin Etsu Handotai Co Ltd Si単結晶ウエーハの熱処理方法
JPH06183900A (ja) * 1990-12-14 1994-07-05 Hughes Aircraft Co ガス相から固体への注入
US6121117A (en) * 1992-01-30 2000-09-19 Canon Kabushiki Kaisha Process for producing semiconductor substrate by heat treating
US6313014B1 (en) 1998-06-18 2001-11-06 Canon Kabushiki Kaisha Semiconductor substrate and manufacturing method of semiconductor substrate
JP2003332344A (ja) * 2002-03-05 2003-11-21 Sumitomo Mitsubishi Silicon Corp シリコン単結晶層の製造方法及びシリコン単結晶層
US6809015B2 (en) 1998-12-28 2004-10-26 Shin-Etsu Handotai Co., Ltd. Method for heat treatment of silicon wafers and silicon wafer

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51134071A (en) * 1975-05-16 1976-11-20 Nippon Denshi Kinzoku Kk Method to eliminate crystal defects of silicon
JPS5885534A (ja) * 1981-11-18 1983-05-21 Komatsu Denshi Kinzoku Kk 半導体シリコン基板の製造法
JPS58164229A (ja) * 1982-03-25 1983-09-29 Sony Corp 半導体基板処理法
JPS59202640A (ja) * 1983-05-02 1984-11-16 Toshiba Corp 半導体ウエハの処理方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51134071A (en) * 1975-05-16 1976-11-20 Nippon Denshi Kinzoku Kk Method to eliminate crystal defects of silicon
JPS5885534A (ja) * 1981-11-18 1983-05-21 Komatsu Denshi Kinzoku Kk 半導体シリコン基板の製造法
JPS58164229A (ja) * 1982-03-25 1983-09-29 Sony Corp 半導体基板処理法
JPS59202640A (ja) * 1983-05-02 1984-11-16 Toshiba Corp 半導体ウエハの処理方法

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01183825A (ja) * 1988-01-19 1989-07-21 Sanyo Electric Co Ltd 単結晶シリコン膜の形成方法
JPH03233936A (ja) * 1990-02-08 1991-10-17 Mitsubishi Materials Corp シリコンウエーハの製造方法
JPH06183900A (ja) * 1990-12-14 1994-07-05 Hughes Aircraft Co ガス相から固体への注入
JPH04285099A (ja) * 1991-03-15 1992-10-09 Shin Etsu Handotai Co Ltd Si単結晶ウエーハの熱処理方法
US6121117A (en) * 1992-01-30 2000-09-19 Canon Kabushiki Kaisha Process for producing semiconductor substrate by heat treating
US6313014B1 (en) 1998-06-18 2001-11-06 Canon Kabushiki Kaisha Semiconductor substrate and manufacturing method of semiconductor substrate
US6809015B2 (en) 1998-12-28 2004-10-26 Shin-Etsu Handotai Co., Ltd. Method for heat treatment of silicon wafers and silicon wafer
US7011717B2 (en) 1998-12-28 2006-03-14 Shin-Etsu Handotai Co., Ltd. Method for heat treatment of silicon wafers and silicon wafer
JP2003332344A (ja) * 2002-03-05 2003-11-21 Sumitomo Mitsubishi Silicon Corp シリコン単結晶層の製造方法及びシリコン単結晶層

Also Published As

Publication number Publication date
JPH0561240B2 (enrdf_load_stackoverflow) 1993-09-03

Similar Documents

Publication Publication Date Title
JP3011178B2 (ja) 半導体シリコンウェーハ並びにその製造方法と熱処理装置
KR100733111B1 (ko) 접합 soi 웨이퍼의 제조방법 및 접합 soi 웨이퍼
JPS6255697B2 (enrdf_load_stackoverflow)
JP4013276B2 (ja) シリコンエピタキシャルウェーハの製造方法
JP2009170656A (ja) 単結晶シリコンウェーハおよびその製造方法
JPH11168106A (ja) 半導体基板の処理方法
US4666532A (en) Denuding silicon substrates with oxygen and halogen
JPS62123098A (ja) シリコン単結晶の製造方法
JP2742247B2 (ja) シリコン単結晶基板の製造方法および品質管理方法
JPH05291097A (ja) シリコン基板およびその製造方法
WO2010131412A1 (ja) シリコンウェーハおよびその製造方法
JPH0518254B2 (enrdf_load_stackoverflow)
JP3080501B2 (ja) シリコンウェーハの製造方法
JP2006040980A (ja) シリコンウェーハおよびその製造方法
JPH0341437B2 (enrdf_load_stackoverflow)
JP4259881B2 (ja) シリコンウエハの清浄化方法
JPH06295913A (ja) シリコンウエハの製造方法及びシリコンウエハ
JP2004095717A (ja) アニールウェーハのボロン汚染消滅方法
JP3890819B2 (ja) シリコンウェーハの熱処理方法
KR100312971B1 (ko) 실리콘 웨이퍼내의 산소 불순물 농도 감소방법
JP2652344B2 (ja) シリコンウエーハ
JP3238957B2 (ja) シリコンウェーハ
JPS6326541B2 (enrdf_load_stackoverflow)
JP3565068B2 (ja) シリコンウエーハの熱処理方法およびシリコンウエーハ
JP2652346B2 (ja) シリコンウエーハの製造方法