JPS6161546B2 - - Google Patents
Info
- Publication number
- JPS6161546B2 JPS6161546B2 JP55034907A JP3490780A JPS6161546B2 JP S6161546 B2 JPS6161546 B2 JP S6161546B2 JP 55034907 A JP55034907 A JP 55034907A JP 3490780 A JP3490780 A JP 3490780A JP S6161546 B2 JPS6161546 B2 JP S6161546B2
- Authority
- JP
- Japan
- Prior art keywords
- oxide film
- gate electrode
- polycrystalline silicon
- mask
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 24
- 239000000758 substrate Substances 0.000 claims description 17
- 239000004065 semiconductor Substances 0.000 claims description 15
- 238000004519 manufacturing process Methods 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 10
- 238000005530 etching Methods 0.000 claims description 9
- 238000009792 diffusion process Methods 0.000 description 12
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 11
- 229910052750 molybdenum Inorganic materials 0.000 description 11
- 239000011733 molybdenum Substances 0.000 description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 10
- 229910052710 silicon Inorganic materials 0.000 description 10
- 239000010703 silicon Substances 0.000 description 10
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 8
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 229910052698 phosphorus Inorganic materials 0.000 description 5
- 239000011574 phosphorus Substances 0.000 description 5
- 238000001459 lithography Methods 0.000 description 4
- 230000010354 integration Effects 0.000 description 3
- 238000005468 ion implantation Methods 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- RLOWWWKZYUNIDI-UHFFFAOYSA-N phosphinic chloride Chemical compound ClP=O RLOWWWKZYUNIDI-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 125000000896 monocarboxylic acid group Chemical group 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/611—Insulated-gate field-effect transistors [IGFET] having multiple independently-addressable gate electrodes influencing the same channel
Landscapes
- Bipolar Transistors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- Electrodes Of Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3490780A JPS56133868A (en) | 1980-03-21 | 1980-03-21 | Manufacture of mos type semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3490780A JPS56133868A (en) | 1980-03-21 | 1980-03-21 | Manufacture of mos type semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56133868A JPS56133868A (en) | 1981-10-20 |
JPS6161546B2 true JPS6161546B2 (en, 2012) | 1986-12-26 |
Family
ID=12427261
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3490780A Granted JPS56133868A (en) | 1980-03-21 | 1980-03-21 | Manufacture of mos type semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56133868A (en, 2012) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2712230B2 (ja) * | 1988-02-16 | 1998-02-10 | セイコーエプソン株式会社 | Mos型半導体装置の製造方法 |
-
1980
- 1980-03-21 JP JP3490780A patent/JPS56133868A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS56133868A (en) | 1981-10-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4253888A (en) | Pretreatment of photoresist masking layers resulting in higher temperature device processing | |
JPS60124967A (ja) | 集積回路構造体 | |
JPH0147020B2 (en, 2012) | ||
JP2971085B2 (ja) | 半導体装置の製造方法 | |
JPS6161546B2 (en, 2012) | ||
JPS6220711B2 (en, 2012) | ||
JPS603157A (ja) | 半導体装置の製造方法 | |
JPS6024009A (ja) | 半導体の不純物領域形成方法 | |
JPS59105363A (ja) | 半導体装置の製造方法 | |
JPS6320383B2 (en, 2012) | ||
EP0053484B1 (en) | A method for fabricating semiconductor device | |
JPS6316672A (ja) | 半導体素子の製造方法 | |
JPH0369168A (ja) | 薄膜電界効果トランジスタ | |
JPS59195859A (ja) | 半導体装置の製造方法 | |
JPH0713958B2 (ja) | 半導体装置の製造方法 | |
JPH0420256B2 (en, 2012) | ||
JPS6077460A (ja) | 半導体装置の製造方法 | |
JPS5968950A (ja) | 半導体装置の製造方法 | |
JPS5922348A (ja) | 半導体装置の製造方法 | |
JPS60785B2 (ja) | Mos型半導体装置の製造方法 | |
JPH0564457B2 (en, 2012) | ||
JPH0575067A (ja) | 半導体装置の製造方法 | |
JPS5974623A (ja) | 半導体集積回路の製造方法 | |
JPH0140502B2 (en, 2012) | ||
JPS5858770A (ja) | 半導体装置の製造方法 |