Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu LtdfiledCriticalFujitsu Ltd
Priority to JP56176419ApriorityCriticalpatent/JPS5878242A/ja
Publication of JPS5878242ApublicationCriticalpatent/JPS5878242A/ja
Publication of JPS6149698B2publicationCriticalpatent/JPS6149698B2/ja
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/28—Testing of electronic circuits, e.g. by signal tracer
G01R31/317—Testing of digital circuits
G01R31/3181—Functional testing
G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
G01R31/318558—Addressing or selecting of subparts of the device under test
G—PHYSICS
G06—COMPUTING OR CALCULATING; COUNTING
G06F—ELECTRIC DIGITAL DATA PROCESSING
G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
Memory device containing a static RAM memory that is adapted for executing a self-test, and integrated circuit containing such a device as an embedded static RAM memory