JPS6143441A - 半導体装置のテスト方法 - Google Patents

半導体装置のテスト方法

Info

Publication number
JPS6143441A
JPS6143441A JP59166709A JP16670984A JPS6143441A JP S6143441 A JPS6143441 A JP S6143441A JP 59166709 A JP59166709 A JP 59166709A JP 16670984 A JP16670984 A JP 16670984A JP S6143441 A JPS6143441 A JP S6143441A
Authority
JP
Japan
Prior art keywords
integrated circuit
wafer
circuit element
fixed
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59166709A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0262947B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Tsugio Tawara
田原　次夫
Sumio Doi
土井　純夫
Teijiro Otsuki
大槻　貞二郎
Osamu Higaki
桧垣　修
Isao Furuta
古田　勲
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP59166709A priority Critical patent/JPS6143441A/ja
Publication of JPS6143441A publication Critical patent/JPS6143441A/ja
Publication of JPH0262947B2 publication Critical patent/JPH0262947B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP59166709A 1984-08-07 1984-08-07 半導体装置のテスト方法 Granted JPS6143441A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59166709A JPS6143441A (ja) 1984-08-07 1984-08-07 半導体装置のテスト方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59166709A JPS6143441A (ja) 1984-08-07 1984-08-07 半導体装置のテスト方法

Publications (2)

Publication Number Publication Date
JPS6143441A true JPS6143441A (ja) 1986-03-03
JPH0262947B2 JPH0262947B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-12-27

Family

ID=15836304

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59166709A Granted JPS6143441A (ja) 1984-08-07 1984-08-07 半導体装置のテスト方法

Country Status (1)

Country Link
JP (1) JPS6143441A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015141985A (ja) * 2014-01-28 2015-08-03 株式会社東芝 検査装置、及び検査方法
JP2016025250A (ja) * 2014-07-22 2016-02-08 トヨタ自動車株式会社 半導体装置の製造方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015141985A (ja) * 2014-01-28 2015-08-03 株式会社東芝 検査装置、及び検査方法
US10060967B2 (en) 2014-01-28 2018-08-28 Toshiba Memory Corporation Testing apparatus and method for testing semiconductor chips
JP2016025250A (ja) * 2014-07-22 2016-02-08 トヨタ自動車株式会社 半導体装置の製造方法
US9633901B2 (en) 2014-07-22 2017-04-25 Toyota Jidosha Kabushiki Kaisha Method for manufacturing semiconductor device

Also Published As

Publication number Publication date
JPH0262947B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-12-27

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