JPS6132757B2 - - Google Patents
Info
- Publication number
- JPS6132757B2 JPS6132757B2 JP54150902A JP15090279A JPS6132757B2 JP S6132757 B2 JPS6132757 B2 JP S6132757B2 JP 54150902 A JP54150902 A JP 54150902A JP 15090279 A JP15090279 A JP 15090279A JP S6132757 B2 JPS6132757 B2 JP S6132757B2
- Authority
- JP
- Japan
- Prior art keywords
- address
- storage section
- test
- output
- selector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 79
- 230000001934 delay Effects 0.000 claims 1
- 230000002950 deficient Effects 0.000 description 17
- 230000007547 defect Effects 0.000 description 6
- 230000003111 delayed effect Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000000873 masking effect Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15090279A JPS5673362A (en) | 1979-11-21 | 1979-11-21 | Testing device of memory |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15090279A JPS5673362A (en) | 1979-11-21 | 1979-11-21 | Testing device of memory |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5673362A JPS5673362A (en) | 1981-06-18 |
JPS6132757B2 true JPS6132757B2 (enrdf_load_stackoverflow) | 1986-07-29 |
Family
ID=15506875
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15090279A Granted JPS5673362A (en) | 1979-11-21 | 1979-11-21 | Testing device of memory |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5673362A (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63177772U (enrdf_load_stackoverflow) * | 1987-05-08 | 1988-11-17 |
-
1979
- 1979-11-21 JP JP15090279A patent/JPS5673362A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5673362A (en) | 1981-06-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4369511A (en) | Semiconductor memory test equipment | |
JP3558252B2 (ja) | 半導体メモリ試験装置 | |
JPH0434109B2 (enrdf_load_stackoverflow) | ||
JPH01184700A (ja) | メモリ試験装置 | |
JPH0318280B2 (enrdf_load_stackoverflow) | ||
KR100310964B1 (ko) | 메모리시험장치및이시험장치를ram시험모드와rom시험모드로전환하는방법 | |
JP3871384B2 (ja) | 半導体メモリ試験装置用不良解析メモリ | |
US6019501A (en) | Address generating device for memory tester | |
JPH10170607A (ja) | 半導体デバイスのテスト装置 | |
JP3549174B2 (ja) | メモリ試験装置 | |
JPS6132757B2 (enrdf_load_stackoverflow) | ||
JPS63148498A (ja) | 自己診断機能を具備した記憶装置 | |
JPH1186593A (ja) | 集積回路試験装置 | |
JPH04339399A (ja) | メモリテスタの救済アドレス解析回路 | |
JPS5938679B2 (ja) | Ic試験装置 | |
JPS6232559B2 (enrdf_load_stackoverflow) | ||
JPH0612894A (ja) | 半導体メモリ試験装置 | |
JP3001012B2 (ja) | メモリ試験装置 | |
JPS5870174A (ja) | 半導体icメモリのテスト方式 | |
JP2903890B2 (ja) | Icテスタ | |
JPS62272164A (ja) | 半導体メモリ試験装置 | |
JPS63191081A (ja) | 半導体試験装置 | |
JP4922506B2 (ja) | 半導体メモリ試験装置 | |
JPS6228874B2 (enrdf_load_stackoverflow) | ||
JPH0267977A (ja) | メモリ試験装置 |