JPS6132757B2 - - Google Patents

Info

Publication number
JPS6132757B2
JPS6132757B2 JP54150902A JP15090279A JPS6132757B2 JP S6132757 B2 JPS6132757 B2 JP S6132757B2 JP 54150902 A JP54150902 A JP 54150902A JP 15090279 A JP15090279 A JP 15090279A JP S6132757 B2 JPS6132757 B2 JP S6132757B2
Authority
JP
Japan
Prior art keywords
address
storage section
test
output
selector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54150902A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5673362A (en
Inventor
Kenji Kimura
Shigeru Sugamori
Koji Ishikawa
Naoaki Narumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP15090279A priority Critical patent/JPS5673362A/ja
Publication of JPS5673362A publication Critical patent/JPS5673362A/ja
Publication of JPS6132757B2 publication Critical patent/JPS6132757B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP15090279A 1979-11-21 1979-11-21 Testing device of memory Granted JPS5673362A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15090279A JPS5673362A (en) 1979-11-21 1979-11-21 Testing device of memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15090279A JPS5673362A (en) 1979-11-21 1979-11-21 Testing device of memory

Publications (2)

Publication Number Publication Date
JPS5673362A JPS5673362A (en) 1981-06-18
JPS6132757B2 true JPS6132757B2 (enrdf_load_stackoverflow) 1986-07-29

Family

ID=15506875

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15090279A Granted JPS5673362A (en) 1979-11-21 1979-11-21 Testing device of memory

Country Status (1)

Country Link
JP (1) JPS5673362A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63177772U (enrdf_load_stackoverflow) * 1987-05-08 1988-11-17

Also Published As

Publication number Publication date
JPS5673362A (en) 1981-06-18

Similar Documents

Publication Publication Date Title
US4369511A (en) Semiconductor memory test equipment
JP3558252B2 (ja) 半導体メモリ試験装置
JPH0434109B2 (enrdf_load_stackoverflow)
JPH01184700A (ja) メモリ試験装置
JPH0318280B2 (enrdf_load_stackoverflow)
KR100310964B1 (ko) 메모리시험장치및이시험장치를ram시험모드와rom시험모드로전환하는방법
JP3871384B2 (ja) 半導体メモリ試験装置用不良解析メモリ
US6019501A (en) Address generating device for memory tester
JPH10170607A (ja) 半導体デバイスのテスト装置
JP3549174B2 (ja) メモリ試験装置
JPS6132757B2 (enrdf_load_stackoverflow)
JPS63148498A (ja) 自己診断機能を具備した記憶装置
JPH1186593A (ja) 集積回路試験装置
JPH04339399A (ja) メモリテスタの救済アドレス解析回路
JPS5938679B2 (ja) Ic試験装置
JPS6232559B2 (enrdf_load_stackoverflow)
JPH0612894A (ja) 半導体メモリ試験装置
JP3001012B2 (ja) メモリ試験装置
JPS5870174A (ja) 半導体icメモリのテスト方式
JP2903890B2 (ja) Icテスタ
JPS62272164A (ja) 半導体メモリ試験装置
JPS63191081A (ja) 半導体試験装置
JP4922506B2 (ja) 半導体メモリ試験装置
JPS6228874B2 (enrdf_load_stackoverflow)
JPH0267977A (ja) メモリ試験装置