JPS6128215B2 - - Google Patents
Info
- Publication number
- JPS6128215B2 JPS6128215B2 JP52073445A JP7344577A JPS6128215B2 JP S6128215 B2 JPS6128215 B2 JP S6128215B2 JP 52073445 A JP52073445 A JP 52073445A JP 7344577 A JP7344577 A JP 7344577A JP S6128215 B2 JPS6128215 B2 JP S6128215B2
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- applying
- electrical stress
- electronic devices
- main surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 29
- 239000004065 semiconductor Substances 0.000 claims description 25
- 239000000758 substrate Substances 0.000 claims description 22
- 239000012212 insulator Substances 0.000 claims description 8
- 230000007774 longterm Effects 0.000 claims description 4
- 238000000034 method Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000000523 sample Substances 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 230000020169 heat generation Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7344577A JPS547877A (en) | 1977-06-20 | 1977-06-20 | Test method for electronic device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7344577A JPS547877A (en) | 1977-06-20 | 1977-06-20 | Test method for electronic device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS547877A JPS547877A (en) | 1979-01-20 |
| JPS6128215B2 true JPS6128215B2 (enrdf_load_stackoverflow) | 1986-06-28 |
Family
ID=13518426
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7344577A Granted JPS547877A (en) | 1977-06-20 | 1977-06-20 | Test method for electronic device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS547877A (enrdf_load_stackoverflow) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5599734A (en) * | 1979-01-26 | 1980-07-30 | Hitachi Ltd | Pattern-sheet for characteristic test of semiconductor element |
| US5637925A (en) * | 1988-02-05 | 1997-06-10 | Raychem Ltd | Uses of uniaxially electrically conductive articles |
| JP2919757B2 (ja) * | 1994-11-14 | 1999-07-19 | ローム株式会社 | 絶縁ゲート型半導体装置 |
-
1977
- 1977-06-20 JP JP7344577A patent/JPS547877A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS547877A (en) | 1979-01-20 |
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