JPS547877A - Test method for electronic device - Google Patents

Test method for electronic device

Info

Publication number
JPS547877A
JPS547877A JP7344577A JP7344577A JPS547877A JP S547877 A JPS547877 A JP S547877A JP 7344577 A JP7344577 A JP 7344577A JP 7344577 A JP7344577 A JP 7344577A JP S547877 A JPS547877 A JP S547877A
Authority
JP
Japan
Prior art keywords
electronic device
test method
repetition
electrical stress
conductor unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7344577A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6128215B2 (enrdf_load_stackoverflow
Inventor
Kiyoshi Futagawa
Nobukatsu Manabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP7344577A priority Critical patent/JPS547877A/ja
Publication of JPS547877A publication Critical patent/JPS547877A/ja
Publication of JPS6128215B2 publication Critical patent/JPS6128215B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP7344577A 1977-06-20 1977-06-20 Test method for electronic device Granted JPS547877A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7344577A JPS547877A (en) 1977-06-20 1977-06-20 Test method for electronic device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7344577A JPS547877A (en) 1977-06-20 1977-06-20 Test method for electronic device

Publications (2)

Publication Number Publication Date
JPS547877A true JPS547877A (en) 1979-01-20
JPS6128215B2 JPS6128215B2 (enrdf_load_stackoverflow) 1986-06-28

Family

ID=13518426

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7344577A Granted JPS547877A (en) 1977-06-20 1977-06-20 Test method for electronic device

Country Status (1)

Country Link
JP (1) JPS547877A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5599734A (en) * 1979-01-26 1980-07-30 Hitachi Ltd Pattern-sheet for characteristic test of semiconductor element
US5637925A (en) * 1988-02-05 1997-06-10 Raychem Ltd Uses of uniaxially electrically conductive articles
US5734175A (en) * 1994-11-14 1998-03-31 Rohm Co., Ltd. Insulated-gate semiconductor device having a position recognizing pattern directly on the gate contact area

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5599734A (en) * 1979-01-26 1980-07-30 Hitachi Ltd Pattern-sheet for characteristic test of semiconductor element
US5637925A (en) * 1988-02-05 1997-06-10 Raychem Ltd Uses of uniaxially electrically conductive articles
US5734175A (en) * 1994-11-14 1998-03-31 Rohm Co., Ltd. Insulated-gate semiconductor device having a position recognizing pattern directly on the gate contact area

Also Published As

Publication number Publication date
JPS6128215B2 (enrdf_load_stackoverflow) 1986-06-28

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