JPS61117627A - 論理回路の診断回路 - Google Patents

論理回路の診断回路

Info

Publication number
JPS61117627A
JPS61117627A JP59238876A JP23887684A JPS61117627A JP S61117627 A JPS61117627 A JP S61117627A JP 59238876 A JP59238876 A JP 59238876A JP 23887684 A JP23887684 A JP 23887684A JP S61117627 A JPS61117627 A JP S61117627A
Authority
JP
Japan
Prior art keywords
scan
circuit
logic
diagnostic
logic circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59238876A
Other languages
English (en)
Japanese (ja)
Other versions
JPS641810B2 (enrdf_load_stackoverflow
Inventor
Tsutomu Hirasawa
平沢 務
Shohei Ikehara
池原 昌平
Shuji Ito
修二 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP59238876A priority Critical patent/JPS61117627A/ja
Publication of JPS61117627A publication Critical patent/JPS61117627A/ja
Publication of JPS641810B2 publication Critical patent/JPS641810B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP59238876A 1984-11-13 1984-11-13 論理回路の診断回路 Granted JPS61117627A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59238876A JPS61117627A (ja) 1984-11-13 1984-11-13 論理回路の診断回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59238876A JPS61117627A (ja) 1984-11-13 1984-11-13 論理回路の診断回路

Publications (2)

Publication Number Publication Date
JPS61117627A true JPS61117627A (ja) 1986-06-05
JPS641810B2 JPS641810B2 (enrdf_load_stackoverflow) 1989-01-12

Family

ID=17036572

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59238876A Granted JPS61117627A (ja) 1984-11-13 1984-11-13 論理回路の診断回路

Country Status (1)

Country Link
JP (1) JPS61117627A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03266119A (ja) * 1990-03-16 1991-11-27 Nec Corp ループ処理方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178549A (ja) * 1983-03-30 1984-10-09 Mitsubishi Electric Corp シフトリング回路

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178549A (ja) * 1983-03-30 1984-10-09 Mitsubishi Electric Corp シフトリング回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03266119A (ja) * 1990-03-16 1991-11-27 Nec Corp ループ処理方法

Also Published As

Publication number Publication date
JPS641810B2 (enrdf_load_stackoverflow) 1989-01-12

Similar Documents

Publication Publication Date Title
CA1218424A (en) Scannable asynchronous/synchronous cmos latch
US5109190A (en) Semiconductor apparatus including semiconductor integrated circuit and operating method thereof
JPS62220879A (ja) 半導体装置
JPS6134173B2 (enrdf_load_stackoverflow)
JPS60124744A (ja) エラ−・テスト及び診断装置
GB1593674A (en) Data processing unit
JPS6329276A (ja) 論理lsi
JPH06230088A (ja) 順序回路素子のアレイを含む集積回路および論理素子を含む集積回路
JPS5853774B2 (ja) 情報処理装置
JP2778443B2 (ja) スキャンパステスト回路の最適化方法
JPS61117627A (ja) 論理回路の診断回路
JPH06160489A (ja) バウンダリスキャン内部テスト方式
JPS62195169A (ja) 大規模集積回路
JP3695768B2 (ja) テスト回路の検証方法
JPH01197675A (ja) 論理回路の診断方法
JPH077345B2 (ja) 論理回路ブロックの自己診断回路
JPH02247586A (ja) 半導体集積回路装置
JP2874248B2 (ja) 診断用スキャンパス付き電子回路
JPS5868156A (ja) 集積回路
JPH026772A (ja) 集積回路
JPS6327735B2 (enrdf_load_stackoverflow)
JPH06118133A (ja) Lsiのテスト方法
JPS59121434A (ja) 論理回路装置
JPH0429254B2 (enrdf_load_stackoverflow)
JPS63193238A (ja) アドレススキヤン方式