JPS641810B2 - - Google Patents

Info

Publication number
JPS641810B2
JPS641810B2 JP59238876A JP23887684A JPS641810B2 JP S641810 B2 JPS641810 B2 JP S641810B2 JP 59238876 A JP59238876 A JP 59238876A JP 23887684 A JP23887684 A JP 23887684A JP S641810 B2 JPS641810 B2 JP S641810B2
Authority
JP
Japan
Prior art keywords
scan
logic block
scan loop
logic
flip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP59238876A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61117627A (ja
Inventor
Tsutomu Hirasawa
Shohei Ikehara
Shuji Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP59238876A priority Critical patent/JPS61117627A/ja
Publication of JPS61117627A publication Critical patent/JPS61117627A/ja
Publication of JPS641810B2 publication Critical patent/JPS641810B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP59238876A 1984-11-13 1984-11-13 論理回路の診断回路 Granted JPS61117627A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59238876A JPS61117627A (ja) 1984-11-13 1984-11-13 論理回路の診断回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59238876A JPS61117627A (ja) 1984-11-13 1984-11-13 論理回路の診断回路

Publications (2)

Publication Number Publication Date
JPS61117627A JPS61117627A (ja) 1986-06-05
JPS641810B2 true JPS641810B2 (enrdf_load_stackoverflow) 1989-01-12

Family

ID=17036572

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59238876A Granted JPS61117627A (ja) 1984-11-13 1984-11-13 論理回路の診断回路

Country Status (1)

Country Link
JP (1) JPS61117627A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2679343B2 (ja) * 1990-03-16 1997-11-19 日本電気株式会社 ループ処理方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178549A (ja) * 1983-03-30 1984-10-09 Mitsubishi Electric Corp シフトリング回路

Also Published As

Publication number Publication date
JPS61117627A (ja) 1986-06-05

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