JPS60256004A - チツプ部品のはんだ付検査方法 - Google Patents
チツプ部品のはんだ付検査方法Info
- Publication number
- JPS60256004A JPS60256004A JP11360984A JP11360984A JPS60256004A JP S60256004 A JPS60256004 A JP S60256004A JP 11360984 A JP11360984 A JP 11360984A JP 11360984 A JP11360984 A JP 11360984A JP S60256004 A JPS60256004 A JP S60256004A
- Authority
- JP
- Japan
- Prior art keywords
- window
- soldered
- inspection
- chip component
- soldering
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title abstract 4
- 238000007689 inspection Methods 0.000 claims abstract description 67
- 238000005476 soldering Methods 0.000 claims description 44
- 238000000034 method Methods 0.000 claims description 13
- 238000003384 imaging method Methods 0.000 claims description 6
- 229910000679 solder Inorganic materials 0.000 description 14
- 230000002950 deficient Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000006073 displacement reaction Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 239000003795 chemical substances by application Substances 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 101100282617 Bovine herpesvirus 1.1 (strain Cooper) gC gene Proteins 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010422 painting Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11360984A JPS60256004A (ja) | 1984-06-01 | 1984-06-01 | チツプ部品のはんだ付検査方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11360984A JPS60256004A (ja) | 1984-06-01 | 1984-06-01 | チツプ部品のはんだ付検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60256004A true JPS60256004A (ja) | 1985-12-17 |
JPH0437923B2 JPH0437923B2 (enrdf_load_stackoverflow) | 1992-06-22 |
Family
ID=14616552
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11360984A Granted JPS60256004A (ja) | 1984-06-01 | 1984-06-01 | チツプ部品のはんだ付検査方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60256004A (enrdf_load_stackoverflow) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62217104A (ja) * | 1986-03-19 | 1987-09-24 | Tokyo Electron Ltd | 電子部品の認識方式 |
JPS631908A (ja) * | 1986-06-23 | 1988-01-06 | Matsushita Electric Works Ltd | チツプ部品外観検査方法 |
JPS6332311A (ja) * | 1986-07-26 | 1988-02-12 | Shigumatsukusu Kk | 物体認識装置 |
JPH0242344A (ja) * | 1988-08-03 | 1990-02-13 | Matsushita Electric Ind Co Ltd | 半田フィレットの検査方法 |
JP2006030106A (ja) * | 2004-07-21 | 2006-02-02 | Dainippon Screen Mfg Co Ltd | 画像の領域分割による物体の表面領域配置の取得 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57163807A (en) * | 1981-04-01 | 1982-10-08 | Mitsubishi Electric Corp | Shape detector |
JPS57208404A (en) * | 1981-06-19 | 1982-12-21 | Hitachi Ltd | Configuration detecting method |
JPS5842906A (ja) * | 1981-09-08 | 1983-03-12 | Eiwa Denki Kk | 光学的外形検査装置 |
JPS58190708A (ja) * | 1982-04-30 | 1983-11-07 | Fuji Electric Co Ltd | X−y2次元画像中の基準位置決定方式 |
-
1984
- 1984-06-01 JP JP11360984A patent/JPS60256004A/ja active Granted
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57163807A (en) * | 1981-04-01 | 1982-10-08 | Mitsubishi Electric Corp | Shape detector |
JPS57208404A (en) * | 1981-06-19 | 1982-12-21 | Hitachi Ltd | Configuration detecting method |
JPS5842906A (ja) * | 1981-09-08 | 1983-03-12 | Eiwa Denki Kk | 光学的外形検査装置 |
JPS58190708A (ja) * | 1982-04-30 | 1983-11-07 | Fuji Electric Co Ltd | X−y2次元画像中の基準位置決定方式 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62217104A (ja) * | 1986-03-19 | 1987-09-24 | Tokyo Electron Ltd | 電子部品の認識方式 |
JPS631908A (ja) * | 1986-06-23 | 1988-01-06 | Matsushita Electric Works Ltd | チツプ部品外観検査方法 |
JPS6332311A (ja) * | 1986-07-26 | 1988-02-12 | Shigumatsukusu Kk | 物体認識装置 |
JPH0242344A (ja) * | 1988-08-03 | 1990-02-13 | Matsushita Electric Ind Co Ltd | 半田フィレットの検査方法 |
JP2006030106A (ja) * | 2004-07-21 | 2006-02-02 | Dainippon Screen Mfg Co Ltd | 画像の領域分割による物体の表面領域配置の取得 |
Also Published As
Publication number | Publication date |
---|---|
JPH0437923B2 (enrdf_load_stackoverflow) | 1992-06-22 |
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