JPS57163807A - Shape detector - Google Patents
Shape detectorInfo
- Publication number
- JPS57163807A JPS57163807A JP4983481A JP4983481A JPS57163807A JP S57163807 A JPS57163807 A JP S57163807A JP 4983481 A JP4983481 A JP 4983481A JP 4983481 A JP4983481 A JP 4983481A JP S57163807 A JPS57163807 A JP S57163807A
- Authority
- JP
- Japan
- Prior art keywords
- steel plate
- shape
- external circumference
- arithmetic
- windows
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
PURPOSE:To extract a shape precisely in detecting the shape by extracting data on external circumference edges from the radiant light distribution of a red- heated steel plate, by using three kinds of windows which conform to the external circumference shape in processing the shape by track arithmetic. CONSTITUTION:Radiant light from a red-heated steel plate is detected to obtain the digital value of each part of the steel plate which corresponds to temperature distribution, and this data is processed by temperature histogram arithmetic to eliminate a blur due to the scattering, etc., of the external circumference part of the steel plate. Then, the edge parts of the external circumference are emphasized by spatial differential arithmetic and the edges are processed by track arithmetic to detect the deformation of the front and rear end parts of the steel plate. Then, the representative front end parts A-C of the steel plate are divided into three areas P-R and three kinds of windows M1-M3 which have directional weight coefficients W1-W4 (W1>...>W4) correspondingly are set, thereby tracking the edge parts. The windows have the maximum weight coefficient W1 in the advance direction, so tracking is facilitated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4983481A JPS57163807A (en) | 1981-04-01 | 1981-04-01 | Shape detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4983481A JPS57163807A (en) | 1981-04-01 | 1981-04-01 | Shape detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57163807A true JPS57163807A (en) | 1982-10-08 |
JPS6363043B2 JPS6363043B2 (en) | 1988-12-06 |
Family
ID=12842106
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4983481A Granted JPS57163807A (en) | 1981-04-01 | 1981-04-01 | Shape detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57163807A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60256004A (en) * | 1984-06-01 | 1985-12-17 | Matsushita Electric Works Ltd | Testing device of soldered condition of chip part |
JPS61120002A (en) * | 1984-11-16 | 1986-06-07 | Toyota Central Res & Dev Lab Inc | Method and device for detecting corner point of image |
JPH01131429A (en) * | 1987-11-17 | 1989-05-24 | Anzen Jidosha Kk | Device for detecting contour of luminous flux |
JPH046404A (en) * | 1990-04-25 | 1992-01-10 | Seikosha Co Ltd | Image monitoring method |
-
1981
- 1981-04-01 JP JP4983481A patent/JPS57163807A/en active Granted
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60256004A (en) * | 1984-06-01 | 1985-12-17 | Matsushita Electric Works Ltd | Testing device of soldered condition of chip part |
JPH0437923B2 (en) * | 1984-06-01 | 1992-06-22 | Matsushita Electric Works Ltd | |
JPS61120002A (en) * | 1984-11-16 | 1986-06-07 | Toyota Central Res & Dev Lab Inc | Method and device for detecting corner point of image |
JPH0346045B2 (en) * | 1984-11-16 | 1991-07-15 | Toyoda Chuo Kenkyusho Kk | |
JPH01131429A (en) * | 1987-11-17 | 1989-05-24 | Anzen Jidosha Kk | Device for detecting contour of luminous flux |
JPH046404A (en) * | 1990-04-25 | 1992-01-10 | Seikosha Co Ltd | Image monitoring method |
Also Published As
Publication number | Publication date |
---|---|
JPS6363043B2 (en) | 1988-12-06 |
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