JPS60164847A - スキヤン制御方式 - Google Patents

スキヤン制御方式

Info

Publication number
JPS60164847A
JPS60164847A JP59021173A JP2117384A JPS60164847A JP S60164847 A JPS60164847 A JP S60164847A JP 59021173 A JP59021173 A JP 59021173A JP 2117384 A JP2117384 A JP 2117384A JP S60164847 A JPS60164847 A JP S60164847A
Authority
JP
Japan
Prior art keywords
clock
scan
state
stopped
latch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59021173A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6362775B2 (enrdf_load_stackoverflow
Inventor
Takashi Ibi
孝 井比
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP59021173A priority Critical patent/JPS60164847A/ja
Publication of JPS60164847A publication Critical patent/JPS60164847A/ja
Publication of JPS6362775B2 publication Critical patent/JPS6362775B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP59021173A 1984-02-08 1984-02-08 スキヤン制御方式 Granted JPS60164847A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59021173A JPS60164847A (ja) 1984-02-08 1984-02-08 スキヤン制御方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59021173A JPS60164847A (ja) 1984-02-08 1984-02-08 スキヤン制御方式

Publications (2)

Publication Number Publication Date
JPS60164847A true JPS60164847A (ja) 1985-08-27
JPS6362775B2 JPS6362775B2 (enrdf_load_stackoverflow) 1988-12-05

Family

ID=12047526

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59021173A Granted JPS60164847A (ja) 1984-02-08 1984-02-08 スキヤン制御方式

Country Status (1)

Country Link
JP (1) JPS60164847A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS6362775B2 (enrdf_load_stackoverflow) 1988-12-05

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