JPS5970944A - 粒径測定装置 - Google Patents

粒径測定装置

Info

Publication number
JPS5970944A
JPS5970944A JP57179739A JP17973982A JPS5970944A JP S5970944 A JPS5970944 A JP S5970944A JP 57179739 A JP57179739 A JP 57179739A JP 17973982 A JP17973982 A JP 17973982A JP S5970944 A JPS5970944 A JP S5970944A
Authority
JP
Japan
Prior art keywords
scattered light
intensity distribution
light intensity
particle size
photodetector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57179739A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0225448B2 (it
Inventor
Kyoichi Tatsuno
恭市 辰野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP57179739A priority Critical patent/JPS5970944A/ja
Priority to US06/541,023 priority patent/US4595291A/en
Priority to EP83306227A priority patent/EP0106684B1/en
Priority to DE8383306227T priority patent/DE3381178D1/de
Publication of JPS5970944A publication Critical patent/JPS5970944A/ja
Publication of JPH0225448B2 publication Critical patent/JPH0225448B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP57179739A 1982-10-15 1982-10-15 粒径測定装置 Granted JPS5970944A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP57179739A JPS5970944A (ja) 1982-10-15 1982-10-15 粒径測定装置
US06/541,023 US4595291A (en) 1982-10-15 1983-10-12 Particle diameter measuring device
EP83306227A EP0106684B1 (en) 1982-10-15 1983-10-14 Particle diameter measuring device
DE8383306227T DE3381178D1 (de) 1982-10-15 1983-10-14 Teilchendurchmesser-messvorrichtung.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57179739A JPS5970944A (ja) 1982-10-15 1982-10-15 粒径測定装置

Publications (2)

Publication Number Publication Date
JPS5970944A true JPS5970944A (ja) 1984-04-21
JPH0225448B2 JPH0225448B2 (it) 1990-06-04

Family

ID=16071014

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57179739A Granted JPS5970944A (ja) 1982-10-15 1982-10-15 粒径測定装置

Country Status (1)

Country Link
JP (1) JPS5970944A (it)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6117940A (ja) * 1984-07-05 1986-01-25 Nippon Paint Co Ltd 高濃度懸濁液中等の粒子の分散状態測定方法及び装置
JPS6171336A (ja) * 1984-09-14 1986-04-12 Nippon Paint Co Ltd 粒度測定装置
JPS61234339A (ja) * 1985-04-10 1986-10-18 Fuji Electric Co Ltd 液体用微粒子検出装置
JPS6255545A (ja) * 1985-09-05 1987-03-11 Toshiba Corp 粒径測定装置
JPH0264435A (ja) * 1988-08-31 1990-03-05 Y D K:Kk 粒度測定装置
JPH0478543U (it) * 1990-11-17 1992-07-08
CN104596991A (zh) * 2014-12-25 2015-05-06 北京农业智能装备技术研究中心 一种水体浑浊度检测装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8852511B2 (en) 2009-07-10 2014-10-07 Hitachi High-Technologies Corporation Automatic analyzer

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6117940A (ja) * 1984-07-05 1986-01-25 Nippon Paint Co Ltd 高濃度懸濁液中等の粒子の分散状態測定方法及び装置
JPS6171336A (ja) * 1984-09-14 1986-04-12 Nippon Paint Co Ltd 粒度測定装置
JPH0437937B2 (it) * 1984-09-14 1992-06-22 Nippon Paint Co Ltd
JPS61234339A (ja) * 1985-04-10 1986-10-18 Fuji Electric Co Ltd 液体用微粒子検出装置
JPH04545B2 (it) * 1985-04-10 1992-01-07 Fuji Electric Co Ltd
JPS6255545A (ja) * 1985-09-05 1987-03-11 Toshiba Corp 粒径測定装置
JPH0264435A (ja) * 1988-08-31 1990-03-05 Y D K:Kk 粒度測定装置
JPH0478543U (it) * 1990-11-17 1992-07-08
CN104596991A (zh) * 2014-12-25 2015-05-06 北京农业智能装备技术研究中心 一种水体浑浊度检测装置

Also Published As

Publication number Publication date
JPH0225448B2 (it) 1990-06-04

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