JPS5870500A - 半導体記憶回路 - Google Patents

半導体記憶回路

Info

Publication number
JPS5870500A
JPS5870500A JP56169251A JP16925181A JPS5870500A JP S5870500 A JPS5870500 A JP S5870500A JP 56169251 A JP56169251 A JP 56169251A JP 16925181 A JP16925181 A JP 16925181A JP S5870500 A JPS5870500 A JP S5870500A
Authority
JP
Japan
Prior art keywords
circuit section
read
data
row
error correction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56169251A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6226120B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Nobuyuki Yasuoka
安岡　信幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56169251A priority Critical patent/JPS5870500A/ja
Publication of JPS5870500A publication Critical patent/JPS5870500A/ja
Publication of JPS6226120B2 publication Critical patent/JPS6226120B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP56169251A 1981-10-21 1981-10-21 半導体記憶回路 Granted JPS5870500A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56169251A JPS5870500A (ja) 1981-10-21 1981-10-21 半導体記憶回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56169251A JPS5870500A (ja) 1981-10-21 1981-10-21 半導体記憶回路

Publications (2)

Publication Number Publication Date
JPS5870500A true JPS5870500A (ja) 1983-04-26
JPS6226120B2 JPS6226120B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-06-06

Family

ID=15883042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56169251A Granted JPS5870500A (ja) 1981-10-21 1981-10-21 半導体記憶回路

Country Status (1)

Country Link
JP (1) JPS5870500A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01128298A (ja) * 1987-11-12 1989-05-19 Mitsubishi Electric Corp 半導体記憶装置
JPH02257498A (ja) * 1988-12-27 1990-10-18 Nec Corp 集積回路
JPH07169297A (ja) * 1994-11-18 1995-07-04 Mitsubishi Electric Corp 半導体記憶装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01128298A (ja) * 1987-11-12 1989-05-19 Mitsubishi Electric Corp 半導体記憶装置
JPH02257498A (ja) * 1988-12-27 1990-10-18 Nec Corp 集積回路
JPH07169297A (ja) * 1994-11-18 1995-07-04 Mitsubishi Electric Corp 半導体記憶装置

Also Published As

Publication number Publication date
JPS6226120B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-06-06

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