JPS5831407Y2 - 電子部品用ハンドリング装置 - Google Patents
電子部品用ハンドリング装置Info
- Publication number
- JPS5831407Y2 JPS5831407Y2 JP1977115016U JP11501677U JPS5831407Y2 JP S5831407 Y2 JPS5831407 Y2 JP S5831407Y2 JP 1977115016 U JP1977115016 U JP 1977115016U JP 11501677 U JP11501677 U JP 11501677U JP S5831407 Y2 JPS5831407 Y2 JP S5831407Y2
- Authority
- JP
- Japan
- Prior art keywords
- measuring section
- electronic component
- defective
- section
- good
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1977115016U JPS5831407Y2 (ja) | 1977-08-26 | 1977-08-26 | 電子部品用ハンドリング装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1977115016U JPS5831407Y2 (ja) | 1977-08-26 | 1977-08-26 | 電子部品用ハンドリング装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5441173U JPS5441173U (enrdf_load_stackoverflow) | 1979-03-19 |
JPS5831407Y2 true JPS5831407Y2 (ja) | 1983-07-12 |
Family
ID=29066278
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1977115016U Expired JPS5831407Y2 (ja) | 1977-08-26 | 1977-08-26 | 電子部品用ハンドリング装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5831407Y2 (enrdf_load_stackoverflow) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5820119Y2 (ja) * | 1979-11-09 | 1983-04-26 | 芙蓉海洋開発株式会社 | 餌料用動物プランクトン濃縮給餌装置 |
JPS58168246A (ja) * | 1982-03-30 | 1983-10-04 | Toshiba Corp | 選別収納装置 |
JPS594133A (ja) * | 1982-06-30 | 1984-01-10 | Fujitsu Ltd | 半導体装置の試験装置 |
JPH07117572B2 (ja) * | 1986-08-28 | 1995-12-18 | ソニー株式会社 | 半導体装置の測定装置 |
JP2008008658A (ja) * | 2006-06-27 | 2008-01-17 | Wajima Electronics Engineering Co Ltd | ハンドラ |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5948207B2 (ja) * | 1975-03-28 | 1984-11-24 | 株式会社日立製作所 | 部品移送装置 |
-
1977
- 1977-08-26 JP JP1977115016U patent/JPS5831407Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5441173U (enrdf_load_stackoverflow) | 1979-03-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101859092B1 (ko) | 부품 검사장치 | |
JPS5831407Y2 (ja) | 電子部品用ハンドリング装置 | |
CN203190943U (zh) | 气门液压挺杆自动检测装置 | |
US9134342B2 (en) | Intergrated apparatus and method for testing of semiconductor components using a turret machine | |
KR200332887Y1 (ko) | 비접촉식 부품외관검사장치 | |
JPS5923423Y2 (ja) | リ−ドの曲がつたicの検出排除装置 | |
KR101949597B1 (ko) | 반도체 pcb 검사장비 및 검사방법 | |
JPS6399541A (ja) | 半導体ウエハプロ−バ装置 | |
JPH0574888A (ja) | ウエーハプロービング装置 | |
CN119426206B (zh) | 一种用于汽车导向器的检测分选设备及工艺 | |
JPH0574899A (ja) | Icオートハンドラー | |
KR0157742B1 (ko) | 페라이트 코어 검사장치 및 방법 | |
JPH01302147A (ja) | 外観検査装置 | |
JPS63127545A (ja) | プロ−ブ装置 | |
JPH0241173B2 (enrdf_load_stackoverflow) | ||
JPH04205899A (ja) | 半導体製造装置 | |
KR100205352B1 (ko) | 반도체소자 테스트용 핸들러의 반도체소자 양.불량 식별용 마킹장치 | |
JP2717115B2 (ja) | Ic実装ボードの検査方法 | |
JP4490168B2 (ja) | 不良デバイス解析方法 | |
JPH0794559A (ja) | プローバ | |
JPH04314400A (ja) | 連続検査装置 | |
JPS59144144A (ja) | 半導体装置の検査方法 | |
JPH01134941A (ja) | ウェーハ試験方法 | |
JPH0217520Y2 (enrdf_load_stackoverflow) | ||
JPS6086900A (ja) | 半導体装置測定用ハンドラ− |