JPS5831407Y2 - 電子部品用ハンドリング装置 - Google Patents

電子部品用ハンドリング装置

Info

Publication number
JPS5831407Y2
JPS5831407Y2 JP1977115016U JP11501677U JPS5831407Y2 JP S5831407 Y2 JPS5831407 Y2 JP S5831407Y2 JP 1977115016 U JP1977115016 U JP 1977115016U JP 11501677 U JP11501677 U JP 11501677U JP S5831407 Y2 JPS5831407 Y2 JP S5831407Y2
Authority
JP
Japan
Prior art keywords
measuring section
electronic component
defective
section
good
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1977115016U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5441173U (enrdf_load_stackoverflow
Inventor
綏彦 堀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1977115016U priority Critical patent/JPS5831407Y2/ja
Publication of JPS5441173U publication Critical patent/JPS5441173U/ja
Application granted granted Critical
Publication of JPS5831407Y2 publication Critical patent/JPS5831407Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1977115016U 1977-08-26 1977-08-26 電子部品用ハンドリング装置 Expired JPS5831407Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1977115016U JPS5831407Y2 (ja) 1977-08-26 1977-08-26 電子部品用ハンドリング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1977115016U JPS5831407Y2 (ja) 1977-08-26 1977-08-26 電子部品用ハンドリング装置

Publications (2)

Publication Number Publication Date
JPS5441173U JPS5441173U (enrdf_load_stackoverflow) 1979-03-19
JPS5831407Y2 true JPS5831407Y2 (ja) 1983-07-12

Family

ID=29066278

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1977115016U Expired JPS5831407Y2 (ja) 1977-08-26 1977-08-26 電子部品用ハンドリング装置

Country Status (1)

Country Link
JP (1) JPS5831407Y2 (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5820119Y2 (ja) * 1979-11-09 1983-04-26 芙蓉海洋開発株式会社 餌料用動物プランクトン濃縮給餌装置
JPS58168246A (ja) * 1982-03-30 1983-10-04 Toshiba Corp 選別収納装置
JPS594133A (ja) * 1982-06-30 1984-01-10 Fujitsu Ltd 半導体装置の試験装置
JPH07117572B2 (ja) * 1986-08-28 1995-12-18 ソニー株式会社 半導体装置の測定装置
JP2008008658A (ja) * 2006-06-27 2008-01-17 Wajima Electronics Engineering Co Ltd ハンドラ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5948207B2 (ja) * 1975-03-28 1984-11-24 株式会社日立製作所 部品移送装置

Also Published As

Publication number Publication date
JPS5441173U (enrdf_load_stackoverflow) 1979-03-19

Similar Documents

Publication Publication Date Title
KR101859092B1 (ko) 부품 검사장치
JPS5831407Y2 (ja) 電子部品用ハンドリング装置
CN203190943U (zh) 气门液压挺杆自动检测装置
US9134342B2 (en) Intergrated apparatus and method for testing of semiconductor components using a turret machine
KR200332887Y1 (ko) 비접촉식 부품외관검사장치
JPS5923423Y2 (ja) リ−ドの曲がつたicの検出排除装置
KR101949597B1 (ko) 반도체 pcb 검사장비 및 검사방법
JPS6399541A (ja) 半導体ウエハプロ−バ装置
JPH0574888A (ja) ウエーハプロービング装置
CN119426206B (zh) 一种用于汽车导向器的检测分选设备及工艺
JPH0574899A (ja) Icオートハンドラー
KR0157742B1 (ko) 페라이트 코어 검사장치 및 방법
JPH01302147A (ja) 外観検査装置
JPS63127545A (ja) プロ−ブ装置
JPH0241173B2 (enrdf_load_stackoverflow)
JPH04205899A (ja) 半導体製造装置
KR100205352B1 (ko) 반도체소자 테스트용 핸들러의 반도체소자 양.불량 식별용 마킹장치
JP2717115B2 (ja) Ic実装ボードの検査方法
JP4490168B2 (ja) 不良デバイス解析方法
JPH0794559A (ja) プローバ
JPH04314400A (ja) 連続検査装置
JPS59144144A (ja) 半導体装置の検査方法
JPH01134941A (ja) ウェーハ試験方法
JPH0217520Y2 (enrdf_load_stackoverflow)
JPS6086900A (ja) 半導体装置測定用ハンドラ−