JPS5831407Y2 - Handling equipment for electronic parts - Google Patents

Description

[Detailed Description of the Invention] The present invention relates to an inspection device for electronic components, and in particular to a device for inspecting integrated in-line packaged semiconductor integrated circuits (hereinafter referred to as DIP).
The present invention relates to an IC handling device (hereinafter referred to as a handler) in an inspection and sorting process for ICs (hereinafter referred to as a handler).

Conventionally, as shown in the perspective view of FIG. 1, in the IC sorting process, in order to check the operation of the tester 1 and the test station 2 and to judge the quality of the test program,
Good IC sample 6 was set in test station 2.

However, with the above method, only the operation of the tester 1 and the test station 2 and the quality of the test program can be checked.

) are not checked. In addition, in order to check the system, the supply unit (unit) 3a of the handler 3
It becomes necessary to remove the storage unit unit) 3b and set the good IC sample 6 in the handler 3.

However, handlers have recently become faster, and the capacity of the supply unit 3a and storage unit 3b, which are made up of a plurality of magazines 4, is increasing.

Therefore 1. Setting the good IC sample 6 in the handler 3 and checking it via the measuring section 5 requires stopping the handler 3 for a long time, resulting in extremely low efficiency and is difficult.

An object of the present invention is to provide a handler that can perform system checks at any time.

According to the present invention, there is obtained an electronic component handling device characterized in that it is equipped with a means for introducing and extracting a non-defective sample into a measuring section of a handler having a measuring section.

In particular, according to the present invention, in an electronic component handling device that includes an electronic component supply section, a measurement section connected to the supply section, and a storage section connected to the measurement section, the supply section and the measurement section are connected to each other. The device is characterized by comprising means for supplying the non-defective sample to the measuring section, located between the measuring section and means for separating the non-defective sample from the measuring section, located between the measuring section and the storage section. A handling device for electronic parts is obtained.

Hereinafter, the present invention will be explained based on examples and drawings.
FIG. 2 is a perspective view of the vicinity of the measuring section of a handler in which ICs flow in a straight line.
7 passes through the movable rail 9a and enters the measuring section 11.

After the measurement, the IC 7 passes through the movable rail 14a, and if the characteristics of the IC are judged to be good, the IC 7 passes over the defect removal rail 16.
into the storage magazine (not shown).

If the characteristics of the IC 7 are determined to be defective, the defect removal rail 16 moves and the IC 7 is placed in a defect storage box (not shown).

)to go into. The good IC sample 6 is set on the movable rail 9b in advance.

When the above normal operation is stopped and the movable rails 9 and 14 are moved simultaneously, the non-defective IC sample 6 is moved to the stopper 10.
It enters the measuring section 11. from the movable rail 9b that has left the station, performs a check, and after checking, reaches the movable rail 14b.

At this time, since the movable rail 14b is provided with the stopper 15, the movable rail 14. Stop on b.

From the above 1, if the test judgment is good, the system check is good.

□ Fig. 3 is a main view illustrating the operation of a type of handler in which ICs flow on an arc. In normal operation, unsorted ICs 7 pass through a fixed rail 8 and pass through a groove 20 formed in a turret 19. to go into.

At this time, the shutters 183.18b are open and the shutters 180.18d are closed.

The IC 7 that has entered the groove 20 enters the measuring section 5 as the turret 19 rotates in the direction of the arrow 30, and after measurement, the turret 19 rotates again so that it moves to the front of the defect removal rail 16.

If the characteristic judgment of IC7 is good, it flows on the defect removal rail 16 and enters the storage/gazine 4.

Also, if the characteristic judgment of IC7 is defective, the defect removal rail 16
moves, and the IC7 enters the defect storage box 21.

In advance, the good IC sample 6 shutters 18a and 18b are closed, and the shutter 18C is closed.
, 18 d are operated so that they are open, and the rotation of 19 causes the measurement unit 5 to move from the good IC sample 61 to the measuring unit 5.
It will be brought to the site and checked.

After checking, the turret 19 rotates again and the good product I is detected.
The C sample 6 is carried to the front of the stocker 23 and enters the stocker 23.

According to the above, if the test judgment is good, the system check is good.

Therefore, according to the present invention, it is possible to obtain a handler having a mechanism for holding the non-defective IC sample 6 in the device and checking it at any time so as to enable a system check.

[Brief explanation of the drawing]

FIG. 1 is a perspective view of the configuration of the sorting process. FIGS. 2 and 3 are a perspective view and a front view, respectively, showing two embodiments of the present invention. 1... Tester; 2... Test station; 3... Handler; 4... Magazine; 5, 11... Measuring section: 6・・・・・・
・Good IC sample; 7...IC; 8...
・Joint rail between supply unit and movable rail; 9a
,9b,14a,14b...Movable rail; 10,15...Stopper;12...
...Movable stopper';13...Contactor;1
6... Defect removal rail; 17... Joint rail between storage unit and defect removal rail; 18
a ) g b , 18C, 18d...□... Shutter; 19... Turret; 20...
Groove; 21... Defective storage box; 22, 23...
··stocker.

Claims (1)

[Scope of utility model registration request] In an electronic component handling device in which an electronic component to be measured is supplied to a measuring section, measured by the measuring section, its quality is determined, and non-defective products and defective products are stored in respective storage sections. means for holding a non-defective electronic component to be determined; means for supplying a non-defective electronic component for determining the function of the measuring section to the measuring section in place of the electronic component to be measured; and determining the function of the determining section. means for measuring a non-defective electronic component with the measuring section to determine the quality of the function of the measuring section;
1. A handling device for electronic components, comprising means for storing a non-defective electronic component for determining the function of the measuring section separately from the electronic component to be measured.