JPS5727029A - Formation of mo pattern - Google Patents
Formation of mo patternInfo
- Publication number
- JPS5727029A JPS5727029A JP10125280A JP10125280A JPS5727029A JP S5727029 A JPS5727029 A JP S5727029A JP 10125280 A JP10125280 A JP 10125280A JP 10125280 A JP10125280 A JP 10125280A JP S5727029 A JPS5727029 A JP S5727029A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- etching
- cms
- adhered
- oxide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000015572 biosynthetic process Effects 0.000 title 1
- 238000005530 etching Methods 0.000 abstract 3
- 239000004793 Polystyrene Substances 0.000 abstract 2
- 229920002223 polystyrene Polymers 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 238000005566 electron beam evaporation Methods 0.000 abstract 1
- 230000002349 favourable effect Effects 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
PURPOSE:To obtain an Mo pattern of high quality by a method wherein Mo is adhered on an Si substrate, and thus obtained Mo substrate is heat treated, etc., to form Mo oxide thereon, and chloromethylated polystyrene is applied thereon to form a resist pattern, and uniform and rapid etching is performed. CONSTITUTION:After Mo is adhered on the Si wafer by electron beam evaporation, heat treatment is performed to form the Mo oxide. Chloromethylated polystyrene (CMS) is applied thereon to form the resist pattern, and etching is performed. Accordingly generation of degenerated layer to be generated by Mo and CMS is avoided, and uniform etching is performed to form the favorable Mo pattern.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10125280A JPS5727029A (en) | 1980-07-25 | 1980-07-25 | Formation of mo pattern |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10125280A JPS5727029A (en) | 1980-07-25 | 1980-07-25 | Formation of mo pattern |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5727029A true JPS5727029A (en) | 1982-02-13 |
JPS6137774B2 JPS6137774B2 (en) | 1986-08-26 |
Family
ID=14295717
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10125280A Granted JPS5727029A (en) | 1980-07-25 | 1980-07-25 | Formation of mo pattern |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5727029A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60123373A (en) * | 1983-12-06 | 1985-07-02 | 齋藤 武雄 | Heating vessel by latent heat |
JPS6299558U (en) * | 1985-12-13 | 1987-06-25 | ||
JPH01500507A (en) * | 1986-07-02 | 1989-02-23 | マックヴェイ,マーチン リンゼイ | insulated carry bag |
JPH0517288U (en) * | 1991-08-21 | 1993-03-05 | 日野自動車工業株式会社 | Structure of mounting part for resin parts |
JP2009069852A (en) * | 2001-11-02 | 2009-04-02 | Samsung Electronics Co Ltd | Method for manufacturing reflection-transmission type liquid crystal display device |
-
1980
- 1980-07-25 JP JP10125280A patent/JPS5727029A/en active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60123373A (en) * | 1983-12-06 | 1985-07-02 | 齋藤 武雄 | Heating vessel by latent heat |
JPS6299558U (en) * | 1985-12-13 | 1987-06-25 | ||
JPH01500507A (en) * | 1986-07-02 | 1989-02-23 | マックヴェイ,マーチン リンゼイ | insulated carry bag |
JPH0517288U (en) * | 1991-08-21 | 1993-03-05 | 日野自動車工業株式会社 | Structure of mounting part for resin parts |
JP2009069852A (en) * | 2001-11-02 | 2009-04-02 | Samsung Electronics Co Ltd | Method for manufacturing reflection-transmission type liquid crystal display device |
Also Published As
Publication number | Publication date |
---|---|
JPS6137774B2 (en) | 1986-08-26 |
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