JPS5691433A - Preparation of semiconductor device - Google Patents
Preparation of semiconductor deviceInfo
- Publication number
- JPS5691433A JPS5691433A JP16810679A JP16810679A JPS5691433A JP S5691433 A JPS5691433 A JP S5691433A JP 16810679 A JP16810679 A JP 16810679A JP 16810679 A JP16810679 A JP 16810679A JP S5691433 A JPS5691433 A JP S5691433A
- Authority
- JP
- Japan
- Prior art keywords
- nitride film
- substrate
- film
- window
- opening
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
Abstract
PURPOSE:To make a self matching window which enables high integration by providing a thick oxide film mask on an Si substrate, then providing a thin nitride film on the substrate surface in its opening and forming a window with a boundary in the opening part by selectively etching a part of the nitride film. CONSTITUTION:A thick SiO2 film 3 is provided on the surface of an Si substrate 1 by a thermo oxidizing method, and after opening a window 3a, a nitride film 12 is formed by implanting N<+> ions 10 to the exposed surface of the substrate 1. Through this nitride film 12, is formed, for example, the base 5 of a transistor, then removing the nitride film 12 selectively with a liquid which etches the nitride film 12 with priority to the SiO2 film 3, a part of the base is exposed. Then, a photoresist 4 is formed only on the SiO2 film 3 in one direction of the substrate 1, and in the direction perpendicular to the former, it is formed also on the nitride film 12 except the selectively etched part. By so doing, an emitter diffusing window can be opened surely by self matching with the thick SiO2 film 3.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16810679A JPS5691433A (en) | 1979-12-26 | 1979-12-26 | Preparation of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16810679A JPS5691433A (en) | 1979-12-26 | 1979-12-26 | Preparation of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5691433A true JPS5691433A (en) | 1981-07-24 |
Family
ID=15861948
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16810679A Pending JPS5691433A (en) | 1979-12-26 | 1979-12-26 | Preparation of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5691433A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6829134B2 (en) | 2002-07-09 | 2004-12-07 | Murata Manufacturing Co., Ltd. | Laminated ceramic electronic component and method for manufacturing the same |
-
1979
- 1979-12-26 JP JP16810679A patent/JPS5691433A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6829134B2 (en) | 2002-07-09 | 2004-12-07 | Murata Manufacturing Co., Ltd. | Laminated ceramic electronic component and method for manufacturing the same |
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