JPS5574544A - Photo mask correcting method - Google Patents
Photo mask correcting methodInfo
- Publication number
- JPS5574544A JPS5574544A JP14940578A JP14940578A JPS5574544A JP S5574544 A JPS5574544 A JP S5574544A JP 14940578 A JP14940578 A JP 14940578A JP 14940578 A JP14940578 A JP 14940578A JP S5574544 A JPS5574544 A JP S5574544A
- Authority
- JP
- Japan
- Prior art keywords
- dropped
- transparent
- exposed
- mask
- out parts
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/72—Repair or correction of mask defects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Abstract
PURPOSE:To mask the restoration of the dropped-out parts easy by coating photosensitive resin on the surface of the side having patterns, selectively exposing only the dropped-out parts, then removing the resin of the exposed parts and making the glass of the dropped-out parts non-transparent with a hydrofluoric-acid-base processing solution in correcting the pattern dropped-out parts. CONSTITUTION:In the correcting the dropped-out part 3 of the metal film pattern 2 on, e.g., a glass substrate 1 in a photo mask for semiconductor device production, etc., said part is restored by coating photosensitive resin 6 of positive type over the entire surface, giving exposure to a minimum range including the dropped-out part 3, developing the same and removing the resin of the exposed part, thence dropping a processing solution 7 of hydrofluoric acid or hydrofluoric acid and NH4F, etc. on the exposed dropped-out part 3 thereby making the glass surface of the substrate 1 non-transparent 8. Thus, protrusion of non-transparent part 8 is prevented and occurence of poor contact with mask and wafer, etc. is eliminated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14940578A JPS5574544A (en) | 1978-11-30 | 1978-11-30 | Photo mask correcting method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14940578A JPS5574544A (en) | 1978-11-30 | 1978-11-30 | Photo mask correcting method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5574544A true JPS5574544A (en) | 1980-06-05 |
Family
ID=15474405
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14940578A Pending JPS5574544A (en) | 1978-11-30 | 1978-11-30 | Photo mask correcting method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5574544A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS561534A (en) * | 1979-06-15 | 1981-01-09 | Nec Corp | Manufacture of photomask |
JPS6131921A (en) * | 1984-07-25 | 1986-02-14 | Toshiba Corp | Electronic flow meter structure |
US4725558A (en) * | 1985-11-06 | 1988-02-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor defects curing method and apparatus |
US4774193A (en) * | 1986-03-11 | 1988-09-27 | Siemens Aktiengesellschaft | Method for avoiding shorts in the manufacture of layered electrical components |
-
1978
- 1978-11-30 JP JP14940578A patent/JPS5574544A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS561534A (en) * | 1979-06-15 | 1981-01-09 | Nec Corp | Manufacture of photomask |
JPS6131921A (en) * | 1984-07-25 | 1986-02-14 | Toshiba Corp | Electronic flow meter structure |
JPH0576567B2 (en) * | 1984-07-25 | 1993-10-22 | Toshiba Kk | |
US4725558A (en) * | 1985-11-06 | 1988-02-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor defects curing method and apparatus |
US4774193A (en) * | 1986-03-11 | 1988-09-27 | Siemens Aktiengesellschaft | Method for avoiding shorts in the manufacture of layered electrical components |
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