JPS5574544A - Photo mask correcting method - Google Patents

Photo mask correcting method

Info

Publication number
JPS5574544A
JPS5574544A JP14940578A JP14940578A JPS5574544A JP S5574544 A JPS5574544 A JP S5574544A JP 14940578 A JP14940578 A JP 14940578A JP 14940578 A JP14940578 A JP 14940578A JP S5574544 A JPS5574544 A JP S5574544A
Authority
JP
Japan
Prior art keywords
dropped
transparent
exposed
mask
out parts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14940578A
Other languages
Japanese (ja)
Inventor
Isao Morita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP14940578A priority Critical patent/JPS5574544A/en
Publication of JPS5574544A publication Critical patent/JPS5574544A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/72Repair or correction of mask defects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)

Abstract

PURPOSE:To mask the restoration of the dropped-out parts easy by coating photosensitive resin on the surface of the side having patterns, selectively exposing only the dropped-out parts, then removing the resin of the exposed parts and making the glass of the dropped-out parts non-transparent with a hydrofluoric-acid-base processing solution in correcting the pattern dropped-out parts. CONSTITUTION:In the correcting the dropped-out part 3 of the metal film pattern 2 on, e.g., a glass substrate 1 in a photo mask for semiconductor device production, etc., said part is restored by coating photosensitive resin 6 of positive type over the entire surface, giving exposure to a minimum range including the dropped-out part 3, developing the same and removing the resin of the exposed part, thence dropping a processing solution 7 of hydrofluoric acid or hydrofluoric acid and NH4F, etc. on the exposed dropped-out part 3 thereby making the glass surface of the substrate 1 non-transparent 8. Thus, protrusion of non-transparent part 8 is prevented and occurence of poor contact with mask and wafer, etc. is eliminated.
JP14940578A 1978-11-30 1978-11-30 Photo mask correcting method Pending JPS5574544A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14940578A JPS5574544A (en) 1978-11-30 1978-11-30 Photo mask correcting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14940578A JPS5574544A (en) 1978-11-30 1978-11-30 Photo mask correcting method

Publications (1)

Publication Number Publication Date
JPS5574544A true JPS5574544A (en) 1980-06-05

Family

ID=15474405

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14940578A Pending JPS5574544A (en) 1978-11-30 1978-11-30 Photo mask correcting method

Country Status (1)

Country Link
JP (1) JPS5574544A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS561534A (en) * 1979-06-15 1981-01-09 Nec Corp Manufacture of photomask
JPS6131921A (en) * 1984-07-25 1986-02-14 Toshiba Corp Electronic flow meter structure
US4725558A (en) * 1985-11-06 1988-02-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor defects curing method and apparatus
US4774193A (en) * 1986-03-11 1988-09-27 Siemens Aktiengesellschaft Method for avoiding shorts in the manufacture of layered electrical components

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS561534A (en) * 1979-06-15 1981-01-09 Nec Corp Manufacture of photomask
JPS6131921A (en) * 1984-07-25 1986-02-14 Toshiba Corp Electronic flow meter structure
JPH0576567B2 (en) * 1984-07-25 1993-10-22 Toshiba Kk
US4725558A (en) * 1985-11-06 1988-02-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor defects curing method and apparatus
US4774193A (en) * 1986-03-11 1988-09-27 Siemens Aktiengesellschaft Method for avoiding shorts in the manufacture of layered electrical components

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