JPS55138834A - Dry etching method - Google Patents
Dry etching methodInfo
- Publication number
- JPS55138834A JPS55138834A JP4531979A JP4531979A JPS55138834A JP S55138834 A JPS55138834 A JP S55138834A JP 4531979 A JP4531979 A JP 4531979A JP 4531979 A JP4531979 A JP 4531979A JP S55138834 A JPS55138834 A JP S55138834A
- Authority
- JP
- Japan
- Prior art keywords
- bromine
- iodine
- gas
- fluoride
- fluorine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Abstract
PURPOSE:To enable fluoride to selectively etch a volatile substance layer without any undercut by employing a gas having a molecular structure of the type that a part of the fluorine of carbon fluoride is substituted for bromine or iodine for an etching gas. CONSTITUTION:A volatile substance layer 2 coated on an SiO2 base 3 is selectively etched with an SiO2 as a mask 1 by fluoride. In a dry etching method therefor, a mixture gas of gas having a molecular structure of the type that a part of the fluorine of carbon fluoride is substituted for bromine or iodine or that carbon fluoride and a part of the bromine, iodine of fluorine of the carbon fluoride is substituted for bromine or iodine for an etching gas.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4531979A JPS55138834A (en) | 1979-04-16 | 1979-04-16 | Dry etching method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4531979A JPS55138834A (en) | 1979-04-16 | 1979-04-16 | Dry etching method |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20598182A Division JPS58100684A (en) | 1982-11-26 | 1982-11-26 | Dry etching method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55138834A true JPS55138834A (en) | 1980-10-30 |
JPS5713137B2 JPS5713137B2 (en) | 1982-03-15 |
Family
ID=12715976
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4531979A Granted JPS55138834A (en) | 1979-04-16 | 1979-04-16 | Dry etching method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55138834A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5157091A (en) * | 1987-10-07 | 1992-10-20 | Murahara Masataka | Ultraviolet-absorbing polymer material and photoetching process |
JPH1187324A (en) * | 1997-09-04 | 1999-03-30 | Hitachi Ltd | Plasma processing method |
WO2018225661A1 (en) * | 2017-06-08 | 2018-12-13 | 昭和電工株式会社 | Etching method |
-
1979
- 1979-04-16 JP JP4531979A patent/JPS55138834A/en active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5157091A (en) * | 1987-10-07 | 1992-10-20 | Murahara Masataka | Ultraviolet-absorbing polymer material and photoetching process |
JPH1187324A (en) * | 1997-09-04 | 1999-03-30 | Hitachi Ltd | Plasma processing method |
WO2018225661A1 (en) * | 2017-06-08 | 2018-12-13 | 昭和電工株式会社 | Etching method |
JPWO2018225661A1 (en) * | 2017-06-08 | 2020-04-09 | 昭和電工株式会社 | Etching method |
US11164751B2 (en) | 2017-06-08 | 2021-11-02 | Showa Denko K.K. | Etching method |
Also Published As
Publication number | Publication date |
---|---|
JPS5713137B2 (en) | 1982-03-15 |
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