JPS55113200A - Checking method for ic memory - Google Patents

Checking method for ic memory

Info

Publication number
JPS55113200A
JPS55113200A JP2041879A JP2041879A JPS55113200A JP S55113200 A JPS55113200 A JP S55113200A JP 2041879 A JP2041879 A JP 2041879A JP 2041879 A JP2041879 A JP 2041879A JP S55113200 A JPS55113200 A JP S55113200A
Authority
JP
Japan
Prior art keywords
defective
information
memory
test pattern
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2041879A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6141080B2 (enrdf_load_stackoverflow
Inventor
Atsushi Nigorikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP2041879A priority Critical patent/JPS55113200A/ja
Publication of JPS55113200A publication Critical patent/JPS55113200A/ja
Publication of JPS6141080B2 publication Critical patent/JPS6141080B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP2041879A 1979-02-22 1979-02-22 Checking method for ic memory Granted JPS55113200A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2041879A JPS55113200A (en) 1979-02-22 1979-02-22 Checking method for ic memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2041879A JPS55113200A (en) 1979-02-22 1979-02-22 Checking method for ic memory

Publications (2)

Publication Number Publication Date
JPS55113200A true JPS55113200A (en) 1980-09-01
JPS6141080B2 JPS6141080B2 (enrdf_load_stackoverflow) 1986-09-12

Family

ID=12026478

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2041879A Granted JPS55113200A (en) 1979-02-22 1979-02-22 Checking method for ic memory

Country Status (1)

Country Link
JP (1) JPS55113200A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57164497A (en) * 1981-03-31 1982-10-09 Toshiba Corp Controlling device of address fail memory
JPS6050698A (ja) * 1983-08-26 1985-03-20 Mitsubishi Electric Corp 半導体試験装置
JPS60106100A (ja) * 1983-11-15 1985-06-11 Fujitsu Ltd 半導体メモリの試験方法
US5317573A (en) * 1989-08-30 1994-05-31 International Business Machines Corporation Apparatus and method for real time data error capture and compression redundancy analysis
JP2007172778A (ja) * 2005-12-26 2007-07-05 Nec Electronics Corp メモリテスト回路及びメモリテスト方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57164497A (en) * 1981-03-31 1982-10-09 Toshiba Corp Controlling device of address fail memory
JPS6050698A (ja) * 1983-08-26 1985-03-20 Mitsubishi Electric Corp 半導体試験装置
JPS60106100A (ja) * 1983-11-15 1985-06-11 Fujitsu Ltd 半導体メモリの試験方法
US5317573A (en) * 1989-08-30 1994-05-31 International Business Machines Corporation Apparatus and method for real time data error capture and compression redundancy analysis
JP2007172778A (ja) * 2005-12-26 2007-07-05 Nec Electronics Corp メモリテスト回路及びメモリテスト方法

Also Published As

Publication number Publication date
JPS6141080B2 (enrdf_load_stackoverflow) 1986-09-12

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