JPS5491079A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5491079A
JPS5491079A JP15800677A JP15800677A JPS5491079A JP S5491079 A JPS5491079 A JP S5491079A JP 15800677 A JP15800677 A JP 15800677A JP 15800677 A JP15800677 A JP 15800677A JP S5491079 A JPS5491079 A JP S5491079A
Authority
JP
Japan
Prior art keywords
layer
diffusion
film
layers
openings
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15800677A
Other languages
Japanese (ja)
Other versions
JPS6129537B2 (en
Inventor
Gunji Mihashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP15800677A priority Critical patent/JPS5491079A/en
Publication of JPS5491079A publication Critical patent/JPS5491079A/en
Publication of JPS6129537B2 publication Critical patent/JPS6129537B2/ja
Granted legal-status Critical Current

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  • Element Separation (AREA)

Abstract

PURPOSE: To increase a degree of integration with lateral expansion reduced by making a diffusion coefficient large, by injecting ions partially under adequate conditions.
CONSTITUTION: In oxidized film 4 on P-type Si substrate 1, openings are made and N-type layer 2 and P-type layer 3 are buried. Then, openings is made in film 4 and ions such as Ar are injected to an adequate amount to the film except over layers 3 and 2, thereby partially producing distortional layers 5 and 6 on the surface part. Next, entire film 4 is removed and vapor-phase epitaxial growth of Si is carried out under proper condition of approximate 1200°C, so that layers 9 and 10 of good crystalloid can be obtained. At the same time, layer 7 of a large diffusion coefficient and layer 8 with gettering effect can be formed at once. In this way, diffusion is attained with small lateral expansion and the degree of integration increases. In addition, since the diffusion temperature can be lowered and the diffusion time can also be shortened, the redistribution of impurities can be made small and the yield improves. Further, the gettering layer can be arranged closely and the effect against contamination works.
COPYRIGHT: (C)1979,JPO&Japio
JP15800677A 1977-12-28 1977-12-28 Manufacture of semiconductor device Granted JPS5491079A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15800677A JPS5491079A (en) 1977-12-28 1977-12-28 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15800677A JPS5491079A (en) 1977-12-28 1977-12-28 Manufacture of semiconductor device

Publications (2)

Publication Number Publication Date
JPS5491079A true JPS5491079A (en) 1979-07-19
JPS6129537B2 JPS6129537B2 (en) 1986-07-07

Family

ID=15662186

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15800677A Granted JPS5491079A (en) 1977-12-28 1977-12-28 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5491079A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57180145A (en) * 1981-04-30 1982-11-06 Nippon Telegr & Teleph Corp <Ntt> Manufacture of semiconductor integrated circuit device
JPH09232324A (en) * 1996-02-23 1997-09-05 Nec Corp Semiconductor substrate and its manufacture

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57180145A (en) * 1981-04-30 1982-11-06 Nippon Telegr & Teleph Corp <Ntt> Manufacture of semiconductor integrated circuit device
JPH09232324A (en) * 1996-02-23 1997-09-05 Nec Corp Semiconductor substrate and its manufacture

Also Published As

Publication number Publication date
JPS6129537B2 (en) 1986-07-07

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