JPS5419773A - Interpolation method - Google Patents

Interpolation method

Info

Publication number
JPS5419773A
JPS5419773A JP7812078A JP7812078A JPS5419773A JP S5419773 A JPS5419773 A JP S5419773A JP 7812078 A JP7812078 A JP 7812078A JP 7812078 A JP7812078 A JP 7812078A JP S5419773 A JPS5419773 A JP S5419773A
Authority
JP
Japan
Prior art keywords
interpolation method
interpolation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7812078A
Other languages
English (en)
Inventor
Shiyuueefueru Erunsuto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dr Johannes Heidenhain GmbH
Original Assignee
Dr Johannes Heidenhain GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dr Johannes Heidenhain GmbH filed Critical Dr Johannes Heidenhain GmbH
Publication of JPS5419773A publication Critical patent/JPS5419773A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/17—Function evaluation by approximation methods, e.g. inter- or extrapolation, smoothing, least mean square method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/36—Forming the light into pulses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/36—Forming the light into pulses
    • G01D5/363—Direction discrimination
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/20—Increasing resolution using an n bit system to obtain n + m bits
    • H03M1/202—Increasing resolution using an n bit system to obtain n + m bits by interpolation
    • H03M1/207—Increasing resolution using an n bit system to obtain n + m bits by interpolation using a digital interpolation circuit

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • Data Mining & Analysis (AREA)
  • Algebra (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Optical Transform (AREA)
JP7812078A 1977-07-01 1978-06-29 Interpolation method Pending JPS5419773A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19772729697 DE2729697A1 (de) 1977-07-01 1977-07-01 Verfahren zur interpolation

Publications (1)

Publication Number Publication Date
JPS5419773A true JPS5419773A (en) 1979-02-14

Family

ID=6012869

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7812078A Pending JPS5419773A (en) 1977-07-01 1978-06-29 Interpolation method

Country Status (8)

Country Link
US (1) US4225931A (ja)
JP (1) JPS5419773A (ja)
AT (1) ATA377478A (ja)
CH (1) CH628426A5 (ja)
DE (1) DE2729697A1 (ja)
FR (1) FR2396270A1 (ja)
GB (2) GB2000589B (ja)
IT (1) IT1115408B (ja)

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5696213A (en) * 1979-12-28 1981-08-04 Nippon Kogaku Kk <Nikon> Dividing/reading circuit for sine signal
JPS5696214A (en) * 1979-12-28 1981-08-04 Nippon Kogaku Kk <Nikon> Dividing/reading circuit for high precision signal
JPS5714717A (en) * 1980-06-30 1982-01-26 Heidenhain Gmbh Dr Johannes Interpolation
JPS587518A (ja) * 1981-07-07 1983-01-17 Kawaguchiko Seimitsu Kk デジタルダイヤルゲ−ジの多分割方法
JPS5815115A (ja) * 1981-07-21 1983-01-28 Amada Co Ltd 回転角度の検出方法および装置
JPS5967458A (ja) * 1982-10-12 1984-04-17 Mitsubishi Electric Corp デジタル速度検出方式
JPS59144516U (ja) * 1983-03-18 1984-09-27 横河電機株式会社 光学式スケ−ル読取装置
JPS59146722U (ja) * 1983-03-23 1984-10-01 横河電機株式会社 光学式スケ−ル読取装置
JPS6120939A (ja) * 1984-07-10 1986-01-29 Fuji Photo Film Co Ltd 平版印刷版用感光性組成物
JPS6170428A (ja) * 1984-08-14 1986-04-11 ザ・プラット・アンド・フィットニー・カンパニー・インコーポレーテッド 干渉計の分解能測定装置
JPS61131011A (ja) * 1984-11-29 1986-06-18 Fujitsu Ltd エンコ−ダ出力補間回路
JPS6358211A (ja) * 1986-08-29 1988-03-14 Mitsutoyo Corp 光学式変位検出装置
JPS63246610A (ja) * 1987-04-01 1988-10-13 Iseki Kaihatsu Koki:Kk 管路の検査方法および測定装置
JPH02173523A (ja) * 1988-11-11 1990-07-05 Dr Johannes Heidenhain Gmbh 分割回路を備えた位置測定装置
US5625310A (en) * 1994-02-18 1997-04-29 Canon Kabushiki Kaisha Signal processing apparatus and displacement detecting apparatus using the same
US7116252B2 (en) 2004-06-21 2006-10-03 Mitutoyo Corporation Encoder and signal adjustment method for the same
JP2007114155A (ja) * 2005-10-24 2007-05-10 Yaskawa Electric Corp 磁気式エンコーダ装置
JP2010032486A (ja) * 2008-06-26 2010-02-12 Mitsubishi Electric Corp ２値化回路及び回転検出装置

Families Citing this family (78)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4318617A (en) * 1979-12-14 1982-03-09 Keuffel & Esser Company DC Shift error correction for electro-optical measuring system
GB2076147B (en) * 1980-05-15 1984-07-11 Ferranti Ltd Position encoder
IT1128168B (it) * 1980-07-22 1986-05-28 Micrometro Italia Srl Micrometro a lettura digitale
DE3036830C2 (de) * 1980-09-30 1987-01-08 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Verfahren zur Korrektur von Meßwerten bei einem digitalen elektrischen Längen- oder Winkelmeßsystem
US4468747A (en) * 1980-11-03 1984-08-28 Hewlett-Packard Company Scan converter system
US4471449A (en) * 1980-11-03 1984-09-11 Hewlett-Packard Company Scan converter system
CH649382A5 (de) * 1981-02-03 1985-05-15 Maag Zahnraeder & Maschinen Ag Schaltung zum entnehmen von messwerten aus einem inkrementellen lagemesssystem.
DE3116612A1 (de) * 1981-04-27 1982-11-11 Siemens AG, 1000 Berlin und 8000 München Puls-doppler-radarempfaenger mit einer schaltung zur wiederherstellung des ungestoerten signalverlaufs
DE3122702C2 (de) * 1981-06-06 1983-11-03 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Verfahren zur Ermittlung von Tastverhältnis und/oder Phasenwinkel von periodischen elektrischen Rechtecksignalen und Anordnungen zur Durchführung des Verfahrens sowie Anwendung des Verfahrens
EP0074767B1 (en) * 1981-09-07 1988-01-27 Hugh-Peter Granville Kelly Improvements in or relating to linear motor and control circuitry therefor
DE3201005A1 (de) * 1982-01-15 1983-07-28 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Einrichtung zur fehlerkorrektur bei positionsmesssystemen
DE3202356C1 (de) * 1982-01-26 1983-08-11 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Einrichtung zum Unterteilen von periodischen analogen Signalen
DE3202339C2 (de) * 1982-01-26 1983-12-15 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Digitale elektrische Längen- oder Winkelmeßeinrichtung
US4532602A (en) * 1982-03-08 1985-07-30 The Mead Corporation Device for electrical variable magnification of document image
US4488237A (en) * 1982-04-29 1984-12-11 Dynamics Research Corporation Two dimensional press brake control system and apparatus
DE3218101C2 (de) * 1982-05-13 1986-07-03 Siemens AG, 1000 Berlin und 8000 München Auswerteeinrichtung für einen digitalen Inkrementalgeber
DE3239108A1 (de) * 1982-10-22 1984-04-26 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Positionsmessverfahren und einrichtungen zur durchfuehrung des verfahrens
AT397157B (de) * 1982-12-24 1994-02-25 Heinz Rieder Verfahren zum auswerten von messsignalen, die durch abtastung eines inkrementalmassstabes mit einer abtasteinheit erzeugt werden und messeinrichtung zur durchführung dieses verfahrens
DE3307931C2 (de) * 1983-03-05 1985-02-07 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Digitales elektrisches Längen- oder Winkelmeßsystem
EP0145698B1 (de) * 1983-10-03 1988-09-07 RSF-Elektronik Gesellschaft m.b.H. Verfahren zum Messen von Längen und Winkeln auf optoelektronischem Wege und Messeinrichtung zur Durchführung des Verfahrens
DE3409891C2 (de) * 1984-03-17 1986-04-17 Kuhnke, Falko, Dr., 3300 Braunschweig Verfahren zum Interpolieren von ortsperiodischen elektrischen Signalen
DE3412128C1 (de) * 1984-03-31 1985-05-09 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Positionsmesseinrichtung
DE3412557A1 (de) * 1984-04-04 1985-10-24 Mauser-Werke Oberndorf Gmbh, 7238 Oberndorf Laengenmesseinrichtung
CH666348A5 (de) * 1984-04-12 1988-07-15 Heinz Rieder Verfahren zum auswerten von messsignalen, die durch abtastung eines inkrementalmassstabes mit einer abtasteinheit erhalten werden und messeinrichtung zur durchfuehrung dieses verfahrens.
DE3417015C2 (de) * 1984-05-09 1986-03-13 Preibisch, Herbert, Dr.-Ing., 8000 München Interpolationsverfahren
DE3417016C1 (de) * 1984-05-09 1985-12-05 Preibisch, Herbert, Dr.-Ing., 8000 München Verfahren zur Ermittlung der Lage und Geschwindigkeit von Objekten
AT379893B (de) * 1984-07-03 1986-03-10 R S F Elektronik Ohg Rechtsfor Verfahren zur digitalen elektrischen laengenoder winkelmessung und schaltungsanordnung zur durchfuehrung dieses verfahrens
DE3438550C1 (de) * 1984-10-20 1986-05-07 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Positionsmeßeinrichtung
DE3514155A1 (de) * 1985-04-19 1986-10-23 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Verfahren und einrichtung zur regelung des tastverhaeltnisses wenigstens eines elektrischen signals
DE3515933C1 (de) * 1985-05-03 1986-07-31 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Einrichtung zur fehlergesicherten Erzeugung von periodischen Rechtecksignalen
GB2179515B (en) * 1985-08-22 1989-08-02 Muirhead Vactric Components Interpolation method and application thereof to encoders
JPS62132104A (ja) * 1985-12-04 1987-06-15 Futaba Corp 測長装置
US4811254A (en) * 1985-12-17 1989-03-07 Nippon Gakki Seizo Kabushiki Kaisha Displacement detector for an encoder
JPS62187210A (ja) * 1986-02-14 1987-08-15 Fanuc Ltd パルス分配型位置検出装置
FR2615280B1 (fr) * 1987-05-11 1996-07-19 Canon Kk Dispositif de mesure de la distance en mouvement relatif de deux objets mobiles l'un par rapport a l'autre
JPS63311119A (ja) * 1987-06-15 1988-12-19 Fanuc Ltd 絶対位置エンコ−ダ
GB8724506D0 (en) * 1987-10-20 1987-11-25 Woodward W H Stack counting instrument
DE3816568A1 (de) * 1988-05-14 1989-11-16 Bodenseewerk Geraetetech Verfahren und vorrichtung zur demodulation eines wechselspannungs-signals
DE3929239A1 (de) * 1989-09-02 1991-03-07 Teldix Gmbh Ringlaserkreisel
DE4014479A1 (de) * 1989-05-11 1990-11-15 Volkswagen Ag Einrichtung zur ermittlung der bewegungsstrecke zwischen zwei relativbewegungen ausfuehrenden teilen
AT393030B (de) * 1989-05-23 1991-07-25 Rsf Elektronik Gmbh Inkrementales messsystem
US5260650A (en) * 1989-06-19 1993-11-09 Siemens Aktiengesellschaft Method and apparatus for detecting low rotational speeds using a resolver
DE4125865C2 (de) * 1991-08-03 1994-01-20 Heidenhain Gmbh Dr Johannes Längen- oder Winkelmeßeinrichtung
EP0541827B1 (de) * 1991-11-04 1995-04-12 Dr. Johannes Heidenhain GmbH Vorrichtung zur Erzeugung oberwellenfreier periodischer Signale
EP0541828B1 (de) * 1991-11-04 1995-02-01 Dr. Johannes Heidenhain GmbH Vorrichtung zur Erzeugung oberwellenfreier periodischer Signale
EP0611438B1 (en) * 1991-11-08 1996-07-03 British Technology Group Ltd Optical measuring instruments
DE4201385A1 (de) * 1992-01-21 1993-07-22 Peter Dipl Ing Renner Optisches messsystem
DE4229575C1 (de) * 1992-09-04 1993-11-25 Heidenhain Gmbh Dr Johannes Verfahren bei Längen- oder Winkelmeßeinrichtungen
DE59306689D1 (de) * 1993-08-07 1997-07-10 Heidenhain Gmbh Dr Johannes Vorrichtung zur Erzeugung oberwellenfreier periodischer Signale
JP2756761B2 (ja) * 1994-11-08 1998-05-25 株式会社ミツトヨ 内挿パルス発生装置
DE4443898C2 (de) * 1994-12-09 1996-09-26 Heidenhain Gmbh Dr Johannes Positionsmeßverfahren und Positionsmeßeinrichtung
DE19544948C2 (de) * 1995-12-01 2002-09-26 Gemac Ges Fuer Mikroelektronik Digitale Interpolationseinrichtung mit Amplituden- und Nullageregelung der Eingangssignale
US5920494A (en) * 1997-01-10 1999-07-06 Renco Encoders, Inc. Method and device for varying interpolation factors
IL120054A (en) * 1997-01-22 2004-02-19 Opsigal Control Systems Ltd System and method for counting the number of boards within a stack
DE19712622C5 (de) * 1997-03-26 2010-07-15 Dr. Johannes Heidenhain Gmbh Anordnung und Verfahren zur automatischen Korrektur fehlerbehafteter Abtastsignale inkrementaler Positionsmeßeinrichtungen
DE59813001D1 (de) * 1997-04-16 2005-09-22 Heidenhain Gmbh Dr Johannes Positionsmesseinrichtung und Verfahren zu deren Betrieb
US6173607B1 (en) 1998-01-22 2001-01-16 Opsigal Control Systems Ltd. System and method for counting the number of items within a stack
EP1056989B1 (de) 1998-02-21 2002-12-18 Dr. Johannes Heidenhain GmbH Verfahren zum betrieb eines positionsmesssystems und geeignetes positionsmesssystem hierzu
DE19934478B4 (de) * 1999-07-27 2007-12-27 GEMAC-Gesellschaft für Mikroelektronikanwendung Chemnitz mbH Digitale Interpolationseinrichtung
DE19938802B4 (de) * 1999-08-16 2004-04-08 Dr. Johannes Heidenhain Gmbh Verfahren und Schaltungsanorndung zur Interpolation
DE50112891D1 (de) * 2000-02-17 2007-10-04 Heidenhain Gmbh Dr Johannes Positionsmesseinrichtung und Verfahren zu deren Betrieb
DE10018298B4 (de) * 2000-04-13 2012-04-05 Dr. Johannes Heidenhain Gmbh Verfahren und Vorrichtung zur Schwingungsdetektion bei einer Positionsmeßeinrichtung
DE10054075A1 (de) 2000-10-31 2002-05-08 Heidenhain Gmbh Dr Johannes Verfahren zur Positionsbestimmung und Positionsmesseinrichtung
US6761115B2 (en) 2001-05-07 2004-07-13 Heidelberger Drunkmaschinen Ag Clock generator for an imaging device using printing form angular position
EP1468496B1 (de) * 2002-01-11 2006-03-08 Dr. Johannes Heidenhain GmbH Verfahren zur interpolation mindestens zweier positionsabhängiger, periodischer, zueinander phasenverschobener analogsignale
EP1557646B1 (de) * 2004-01-14 2012-02-08 TRW Automotive Electronics & Components GmbH Drehwinkelgeber sowie Verfahren zum Abtasten der Codescheibe eines Drehwinkelgebers
DE102005036719A1 (de) 2005-07-28 2007-02-01 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zum Korrigieren von Interpolationsfehlern einer Maschine, insbesondere eines Koordinatenmessgerätes
US20070242870A1 (en) * 2006-04-18 2007-10-18 Nucor Corporation System And Method For Automatically Counting Bundled Items
DE102006048628A1 (de) 2006-10-13 2008-04-17 Siemens Ag Messelement mit einer als Maßverkörperung fungierenden Spur und korrespondierendes, mit einem solchen Messelement ausführbares Messverfahren
EP2080989B1 (de) 2008-01-18 2012-06-06 Siemens Aktiengesellschaft Messsystem und Verfahren zur Überwachung eines Messsystems
EP2080988B1 (de) 2008-01-18 2012-01-04 Siemens Aktiengesellschaft Messsystem und Verfahren zur Überwachung des Messsystems
EP2080987B1 (de) 2008-01-18 2012-06-06 Siemens Aktiengesellschaft Messsystem und Verfahren zur Überwachung eines Messsystems
EP2116814B1 (de) 2008-05-09 2014-06-25 Siemens Aktiengesellschaft Messeinrichtung zur Ermittlung einer Lage und/oder einer Geschwindigkeit
EP2128570A1 (de) 2008-05-27 2009-12-02 Siemens Aktiengesellschaft Verwendung einer Messsignalauswertung einer Lagemesseinrichtung zur Ermittlung der zeitlichen Differenz zwischen einem ersten Ereignis und einem zweiten Ereignis
CN101545767B (zh) * 2009-04-30 2010-12-29 上海第二工业大学 位移测量方法
WO2010138155A2 (en) * 2009-05-27 2010-12-02 Active Precision, Inc. Encoder interpolator with enhanced precision
EP2669636B1 (de) 2012-06-01 2015-09-30 Siemens Aktiengesellschaft Messwertgeber zum Erhalt einer Positionsinformation und Verfahren zum Betrieb eines solchen Messwertgebers
EP3289314B1 (en) * 2015-04-29 2019-06-05 Renishaw PLC Method of determining sub-divisional error

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5255550A (en) * 1975-10-25 1977-05-07 Heidenhain Gmbh Dr Johannes Electronic counter

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH407569A (de) * 1963-12-04 1966-02-15 Contraves Ag Digitale Auswerteeinrichtung für stetig veränderliche Messgrössensignale
DE1266001B (de) * 1963-12-04 1968-04-11 Contraves Ag Vorrichtung zur Erhoehung der Messgenauigkeit bei optisch-elektrischen Messeinrichtungen
CH461116A (de) * 1966-04-12 1968-08-15 Olivetti & Co Spa Digital-Positionsmessvorrichtung
US3688303A (en) * 1970-06-10 1972-08-29 Sperry Rand Corp Synchro-to-digital converter
FR2098807A5 (ja) * 1970-07-28 1972-03-10 Sopelem
AT339062B (de) * 1975-11-11 1977-09-26 Rieder Heinz Verfahren zur langenmessung

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5255550A (en) * 1975-10-25 1977-05-07 Heidenhain Gmbh Dr Johannes Electronic counter

Cited By (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6257930B2 (ja) * 1979-12-28 1987-12-03 Nippon Kogaku Kk
JPS5696214A (en) * 1979-12-28 1981-08-04 Nippon Kogaku Kk <Nikon> Dividing/reading circuit for high precision signal
JPS5696213A (en) * 1979-12-28 1981-08-04 Nippon Kogaku Kk <Nikon> Dividing/reading circuit for sine signal
JPS5714717A (en) * 1980-06-30 1982-01-26 Heidenhain Gmbh Dr Johannes Interpolation
JPS587518A (ja) * 1981-07-07 1983-01-17 Kawaguchiko Seimitsu Kk デジタルダイヤルゲ−ジの多分割方法
JPS5815115A (ja) * 1981-07-21 1983-01-28 Amada Co Ltd 回転角度の検出方法および装置
JPS5967458A (ja) * 1982-10-12 1984-04-17 Mitsubishi Electric Corp デジタル速度検出方式
JPH0565827B2 (ja) * 1982-10-12 1993-09-20 Mitsubishi Electric Corp
JPS59144516U (ja) * 1983-03-18 1984-09-27 横河電機株式会社 光学式スケ−ル読取装置
JPS59146722U (ja) * 1983-03-23 1984-10-01 横河電機株式会社 光学式スケ−ル読取装置
JPH0244173Y2 (ja) * 1983-03-23 1990-11-22
JPH0462574B2 (ja) * 1984-07-10 1992-10-06 Fuji Photo Film Co Ltd
JPS6120939A (ja) * 1984-07-10 1986-01-29 Fuji Photo Film Co Ltd 平版印刷版用感光性組成物
JPS6170428A (ja) * 1984-08-14 1986-04-11 ザ・プラット・アンド・フィットニー・カンパニー・インコーポレーテッド 干渉計の分解能測定装置
JPS61131011A (ja) * 1984-11-29 1986-06-18 Fujitsu Ltd エンコ−ダ出力補間回路
JPS6358211A (ja) * 1986-08-29 1988-03-14 Mitsutoyo Corp 光学式変位検出装置
JPH0412816B2 (ja) * 1986-08-29 1992-03-05 Mitutoyo Corp
JPS63246610A (ja) * 1987-04-01 1988-10-13 Iseki Kaihatsu Koki:Kk 管路の検査方法および測定装置
JPH0454164B2 (ja) * 1987-04-01 1992-08-28 Iseki Kaihatsu Koki
JPH02173523A (ja) * 1988-11-11 1990-07-05 Dr Johannes Heidenhain Gmbh 分割回路を備えた位置測定装置
US5625310A (en) * 1994-02-18 1997-04-29 Canon Kabushiki Kaisha Signal processing apparatus and displacement detecting apparatus using the same
US7116252B2 (en) 2004-06-21 2006-10-03 Mitutoyo Corporation Encoder and signal adjustment method for the same
JP2007114155A (ja) * 2005-10-24 2007-05-10 Yaskawa Electric Corp 磁気式エンコーダ装置
JP2010032486A (ja) * 2008-06-26 2010-02-12 Mitsubishi Electric Corp ２値化回路及び回転検出装置

Also Published As

Publication number Publication date
DE2729697A1 (de) 1979-01-04
GB2086039A (en) 1982-05-06
GB2000589A (en) 1979-01-10
FR2396270B1 (ja) 1982-02-05
CH628426A5 (de) 1982-02-26
US4225931A (en) 1980-09-30
IT1115408B (it) 1986-02-03
FR2396270A1 (fr) 1979-01-26
GB2000589B (en) 1982-03-24
IT7812679A0 (it) 1978-06-23
GB2086039B (en) 1982-10-20
ATA377478A (de) 1984-02-15

Similar Documents

Publication Publication Date Title
JPS5419773A (en) Interpolation method
JPS53124585A (en) Method for forming nonnwoven
JPS5419921A (en) Improved isomerization method
GB2010170B (en) Casting method
ZA783241B (en) Method
JPS543867A (en) Sealing method
JPS5492648A (en) Crouton making method
JPS53149477A (en) Simple facing method
JPS5441395A (en) Seasoning making method
JPS5466226A (en) *kaiware* cultivating method
JPS53107460A (en) Seasoning making method
JPS53143772A (en) Flocking method
JPS5471037A (en) Casting method
JPS5391016A (en) Casting method
JPS5471824A (en) Extension method
JPS5435292A (en) Method
JPS53145940A (en) Noddle making method
JPS5414327A (en) Casting method
JPS53122543A (en) Hydroponics method
JPS5437772A (en) Forming method
JPS53135078A (en) Operating method
JPS545820A (en) Casting method
JPS5462123A (en) Casting method
JPS5426224A (en) Dicast casting method
JPS545822A (en) Casting method