JPS51112145A - Program controllable method and device for connecting tester to device to be tested - Google Patents

Program controllable method and device for connecting tester to device to be tested

Info

Publication number
JPS51112145A
JPS51112145A JP51022566A JP2256676A JPS51112145A JP S51112145 A JPS51112145 A JP S51112145A JP 51022566 A JP51022566 A JP 51022566A JP 2256676 A JP2256676 A JP 2256676A JP S51112145 A JPS51112145 A JP S51112145A
Authority
JP
Japan
Prior art keywords
tested
controllable method
program controllable
connecting tester
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP51022566A
Other languages
English (en)
Other versions
JPS5428259B2 (ja
Inventor
Rii Betsuku Robaato
Herumutsuto Jiyooberu Piitaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Publication of JPS51112145A publication Critical patent/JPS51112145A/ja
Publication of JPS5428259B2 publication Critical patent/JPS5428259B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07392—Multiple probes manipulating each probe element or tip individually

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP51022566A 1975-03-03 1976-03-02 Program controllable method and device for connecting tester to device to be tested Granted JPS51112145A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US55485975A 1975-03-03 1975-03-03

Publications (2)

Publication Number Publication Date
JPS51112145A true JPS51112145A (en) 1976-10-04
JPS5428259B2 JPS5428259B2 (ja) 1979-09-14

Family

ID=24214985

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51022566A Granted JPS51112145A (en) 1975-03-03 1976-03-02 Program controllable method and device for connecting tester to device to be tested

Country Status (6)

Country Link
US (1) US4138643A (ja)
JP (1) JPS51112145A (ja)
BR (1) BR7601302A (ja)
CA (1) CA1038042A (ja)
DE (3) DE2659976C2 (ja)
FR (1) FR2303349A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59158400U (ja) * 1983-04-08 1984-10-24 沖電気工業株式会社 プレスバ−

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2816721A1 (de) * 1978-04-18 1979-10-31 Werner Heilmann Vorrichtung zum pruefen einer elektronischen leiterplatte o.dgl.
DE2905175C2 (de) * 1979-02-10 1985-11-21 Telefonbau Und Normalzeit Gmbh, 6000 Frankfurt Adaptiervorrichtung für das Verbinden von zu prüfenden Elektronikbaugruppen mit Prüfgeräten
FR2477324A1 (fr) * 1980-02-28 1981-09-04 Dassault Electronique Dispositif de contact electrique pour appareil de traitement de cartes electroniques
DE3010311A1 (de) * 1980-03-18 1981-09-24 Feinmetall Gmbh, 7033 Herrenberg Kontaktbaustein
DE3016483A1 (de) * 1980-04-29 1981-11-05 Heilmann, Werner, 7750 Konstanz Vorrichtung zum pruefen einer elektronischen leiterplatte o.dgl.
DE3136896A1 (de) * 1981-09-17 1983-04-14 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Vorrichtung zum pruefen einer elektronischen leiterplatte
DE3153596C2 (en) * 1981-09-17 1991-11-14 Ingun Pruefmittelbau Gmbh & Co Kg Elektronik, 7750 Konstanz, De Test head for electronic conductor boards
DE3406796A1 (de) * 1983-02-25 1984-08-30 Feinmetall Gmbh, 7033 Herrenberg Pneumatisches kontaktierglied
DE3318394C2 (de) * 1983-05-20 1985-06-20 Feinmetall Gmbh, 7033 Herrenberg Pneumatisch betätigter Kontaktstift
US4588241A (en) * 1983-09-23 1986-05-13 Probe-Rite, Inc. Surface mating coaxial connector
US4574236A (en) * 1983-10-27 1986-03-04 At&T Technologies, Inc. High frequency test fixture
GB2161033B (en) * 1984-06-21 1988-05-25 Gen Electric Co Plc Programmable bed-of-nails test access jigs with electro-rheological fluid actuation
DE3602696C2 (de) * 1986-01-30 1996-07-11 Festo Kg Prüfeinrichtung für auf Trägern angeordnete elektronische Bauelemente
US4801876A (en) * 1986-04-18 1989-01-31 Sagami Tsushin Kogyo Kabushiki Kaisha Printed wiring board tester
US4739259A (en) * 1986-08-01 1988-04-19 Tektronix, Inc. Telescoping pin probe
JP2609639B2 (ja) * 1987-11-14 1997-05-14 日本ヒューレット・パッカード株式会社 テストヘッド
US5291129A (en) * 1988-10-24 1994-03-01 Nhk Spring Co., Ltd. Contact probe
JPH03185847A (ja) * 1989-12-15 1991-08-13 Toshiba Corp ユニバーサルプローブカード
US5196789A (en) * 1991-01-28 1993-03-23 Golden Joseph R Coaxial spring contact probe
US6034532A (en) * 1993-07-01 2000-03-07 Alphatest Corporation Resilient connector having a tubular spring
US5459396A (en) * 1994-08-12 1995-10-17 At&T Ipm Corp. Test fixture with integrated clamp for and sensor of printed circuit board type
JP3821171B2 (ja) * 1995-11-10 2006-09-13 オー・エイチ・ティー株式会社 検査装置及び検査方法
US5793218A (en) * 1995-12-15 1998-08-11 Lear Astronics Corporation Generic interface test adapter
US5818246A (en) * 1996-05-07 1998-10-06 Zhong; George Guozhen Automatic multi-probe PWB tester
US5945835A (en) * 1997-03-05 1999-08-31 Lucent Technologies Inc. Radio frequency test probe with integral mount for circuit board under test
DE19882938T1 (de) * 1998-01-05 2001-04-26 Rika Electronics Internat Inc Koaxialkontaktanordnungs-Vorrichtung
US6037787A (en) * 1998-03-24 2000-03-14 Teradyne, Inc. High performance probe interface for automatic test equipment
JP2002530841A (ja) 1998-11-25 2002-09-17 リカ エレクトロニクス インターナショナル インコーポレイテッド 電気的接触装置
JP2001166006A (ja) * 1999-12-09 2001-06-22 Nec Corp フィクスチャおよびその実装基板接続方法
US6798229B2 (en) * 2000-05-11 2004-09-28 Brian D. Butler Wide-bandwidth coaxial probe
DE20102558U1 (de) * 2001-02-14 2002-02-28 PTR Meßtechnik GmbH & Co. KG, 59368 Werne Vorrichtung zur Kontaktierung einer Prüfeinrichtung insbesondere mit einer elektrischen Leiterplatte
DE20103967U1 (de) * 2001-03-07 2002-07-11 PTR Meßtechnik GmbH & Co. KG, 59368 Werne Schalt-Federkontaktstift
US6700396B1 (en) * 2001-05-16 2004-03-02 Ltx Corporation Integrated micromachine relay for automated test equipment applications
US6734681B2 (en) 2001-08-10 2004-05-11 James Sabey Apparatus and methods for testing circuit boards
JP2003307552A (ja) * 2002-04-17 2003-10-31 Tokyo Electron Ltd 信号検出用接触体及び信号校正装置
US6683466B2 (en) * 2002-05-17 2004-01-27 International Business Machines Corporation Piston for module test
US7053640B2 (en) * 2002-12-27 2006-05-30 Agilent Technologies, Inc. System and method for providing high RF signal isolation and low common ground inductance in an RF circuit testing environment
US7276921B2 (en) * 2003-06-30 2007-10-02 Intel Corporation Probe of under side of component through opening in a printed circuit board
KR100600482B1 (ko) * 2004-06-22 2006-07-13 삼성전자주식회사 반도체 패키지 측정용 프로브
US7683649B2 (en) * 2006-11-20 2010-03-23 Analog Devices, Inc. Testing system contactor
JP5381609B2 (ja) * 2009-10-20 2014-01-08 日本電産リード株式会社 検査用治具及び接触子
US10006939B2 (en) * 2014-10-30 2018-06-26 Tongfu Microelectronics Co., Ltd. Testing probe and semiconductor testing fixture, and fabrication methods thereof
CN108597698B (zh) * 2018-05-30 2023-10-27 中国电力科学研究院有限公司 一种放电路径可控的均压环
CN112097701B (zh) * 2020-08-05 2022-04-05 海克斯康制造智能技术(青岛)有限公司 一种三坐标测量机安全位信号采集装置及方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US198391A (en) * 1877-12-18 Improvement in lubricating-pistons
US3714572A (en) * 1970-08-21 1973-01-30 Rca Corp Alignment and test fixture apparatus

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
COMPUTER DESIGN=1966 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59158400U (ja) * 1983-04-08 1984-10-24 沖電気工業株式会社 プレスバ−

Also Published As

Publication number Publication date
DE2608430C3 (de) 1979-03-15
DE2659977C2 (de) 1979-11-29
FR2303349B1 (ja) 1980-01-18
US4138643A (en) 1979-02-06
DE2659976C2 (de) 1979-11-29
BR7601302A (pt) 1976-09-14
CA1038042A (en) 1978-09-05
DE2659977B1 (de) 1979-04-12
DE2608430B2 (de) 1978-07-13
DE2608430A1 (de) 1977-01-27
JPS5428259B2 (ja) 1979-09-14
DE2659976B1 (de) 1979-04-12
FR2303349A1 (fr) 1976-10-01

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